Anritsu

Since its founding in 1895, Anritsu has been a pioneer in the telecommunications field, marking its 120 years of growth with achievements that include creating the world’ s first practical wireless telephone, which paved the way for today’s smartphones. We would like to express our sincere gratitude to our customers and everyone else who has made this possible.

With its measurement business as the pillar supporting the further advancement of its mobile broadband services, Anritsu offers solutions that are indispensable for building a safer and more secure society in a broad range of fields including quality assurance inspection equipment for foods and pharmaceutical products, remote monitoring and control systems, traffic shapers, and high-speed electronic devices.

Contact Anritsu

Phone: 1-800-ANRITSU (267-4878)

Products

Anritsu EMF - Electromagnetic Field Measurement System

  • Integrated solution for Electromagnetic Field Strength measurements for health and safety
  • Wide dynamic range
  • Fast switching time
  • Automatic download of antenna factors
  • Various demodulation options available

Anritsu MA8100A - TRX NEON® Signal Mapper

Integrating NEON’s capability to automatically collect geo-referenced test data with Anritsu handheld spectrum analyzer products saves valuable time and money by
  • Eliminating the need to manually perform "check-ins" at each test point by automatically calculating indoor location
  • Providing vastly more data than is possible with manual processes by recording data with every step
  • Removing typical data recording errors caused by "guesstimating" locations in large buildings through automatic indoor location and path estimation
  • Delivering actionable data in areas not easily analyzed such as stairways and elevators by recording and referencing measurements in 3D
  • Enabling quick analysis of signal coverage and faster problem resolution by delivering the industry’s only geo-referenced 3D visualization
  • Providing color-graded measurement results in 2D and 3D views. Measurement values can be seen by clicking on each point. A .csv file of all measurements is also provided

Anritsu ME7838A/E/D - VectorStar Broadband VNA

The VectorStar ME7838 Series broadband VNA offers the widest available single frequency sweep from 70 kHz to 110, 125, and 145 GHz with mmWave bands to 1.1 THz.
  • The ME7838A or E version can easily be upgraded to 145 GHz
  • All versions may be configured to include banded millimeter-wave modules up to 1.1 THz
  • Industry-best calibration and measurement stability: 0.1 dB vs 0.6 dB over 24 hrs.
  • All versions support the 3744x-Rx receiver for noise figure measurements to 125 GHz
  • Compact, lightweight mmWave modules (0.6 lb vs 7+ lbs and 1/50 the volume) offer low cost installation on smaller probe stations. 

Anritsu ME7838A4 - VectorStar 4 Port Broadband VNA

The VectorStar ME7838 Series broadband VNA offers the widest available single frequency sweep from 70 kHz to 110, 125, and 145 GHz with mmWave bands to 1.1 THz.
  • The ME7838A4 system is a 4 port 70 kHz — 110/125 GHz broadband system.
  • The system may be configured to include banded millimeter-wave modules up to 1.1 THz
  • Industry-best calibration and measurement stability: 0.1 dB vs 0.6 dB over 24 hrs.
  • The system also supports the 3744x-Rx receiver for noise figure measurements to 125 GHz
  • Compact, lightweight mmWave modules (0.6 lb vs 7+ lbs and 1/50 the volume) offer low cost installation on smaller probe stations. 

Anritsu MP1800A - Signal Quality Analyzers

  • Highly expandable, plug-in, modular design bit error rate tester (BERT)
  • Bit Error Rate test from 0.1 Gbit/s to 32.1 Gbit/s; 64.2 Gbit/s with external MUX/DeMUX
  • Supports signal integrity analysis for a variety of 100G+ applications
    • High speed backplane and interconnect
    • High speed chip/device
    • Active optical cable
    • Optical transceiver modules
  • High-quality (12 ps rise/fall time) and low-jitter (8 ps p-p) PPG waveform, up to 3.5 Vp-p
  • Jitter tolerance test up to 32.1 Gbit/s
    • SJ up to 2000 UI. High modulation frequency SJ up to 1 UI at 250 MHz
    • Support generation of dual tone SJ, RJ, BUJ, and SSC
    • Half Period Jitter (Even/Odd Jitter)
  • Ultra high sensitivity Error Detector (10 mV typical) with embedded clock recovery
  • 32.1 Gbit/s 4Tap Emphasis with external MP1825B
  • Crosstalk test and skew tolerance test using synchronized multi-channel PPG
  • Passive Linear Equalizers for improved EYE opening
  • Comprehensive signal analysis including Burst measurement for PON and EDFA loop circuit testing, Bathtub Measurement (TJ, DJ, RJ), Eye Diagram and Eye Margin Measurement
  • 32.1 Gbaud 4PAM/8PAM generators and accurate 4PAM BER measurement
  • 1 Tbit/s Next Gen. High-Speed Transmission Testing (32G x 32ch) 

Anritsu MP1825B - 4 Tap Emphasis

  • 32.1Gbps 4-tap emphasis
  • Jitter transparent for the jitter tolerance test
  • Compact remote head to minimize cable loss and ISI
  • Can be used as a front head with any Pulse Pattern Generator
  • Compensate or inject ISI and DDPWS
Must-read documents:

Anritsu MP1861A - 56G/64G bit/s MUX

  • 56G/64G bit/s Wide Bandwidth: CEI-56G, 400 GbE, FEC Bit Rate
  • 2:1 MUX, 1:2 DEMUX: Expand 28G/32G 2ch BERT to 56G/64G
  • Compact Remote Head: Reduces DUT connection cable losses
  • Excellent Signal Quality and Rx Sensitivity: High-accuracy measurements of semiconductor chip
    • Intrinsic random jitter 200 fs rms (typ.)
    • Max. variable amplitude output: 3.5 Vp-p
    • Input sensitivity: 25 mV (typ.), single-end, eye height
  • Versatile Signal Integrity Measurement Functions: Supports CEI-56G, 400 GbE tests
    • TJ/DJ/RJ/Bathtub Jitter, Eye Diagram, Eye Margin Auto-measurements
    • Jitter tolerance tests (using MU181500B)
      • Supports generation of SJ, RJ, BUJ, SSC, Dual Tone SJ, Half Period Jitter (Even/Odd Jitter)
      • SJ generation with large amount: 0.55 UI @ fm 250 MHz
    • Crosstalk tests and Skew tolerance using variable data skew by using multi-channel
  • High Expandability
    • Sync pattern generation and BER measurements for up to four channels simultaneously
    • Emphasis signal generation (using MZ1854A, MP1861A 2ch sync, 57.8 Gbit/s)
    • PAM4 signal generation (using MZ1854A, MP1861A 2ch sync, 56.2 Gbit/s)
  • Supports burst signal test
  • Max. 512 Mbit/ch programmable data pattern
  • Auto PPG-to-MUX phase adjustment at bit rate change using auto-alignment function

Anritsu MP1862A - 56G/64G bit/s DEMUX

  • 56G/64G bit/s Wide Bandwidth: CEI-56G, 400 GbE, FEC bit rate
  • 2:1 MUX, 1:2 DEMUX: Expand 28G/32G 2ch BERT to 56G/64G
  • Compact Remote Head: Reduces DUT connection cable losses
  • Excellent Signal Quality and Rx Sensitivity: High-accuracy measurements ofsemiconductor chip
    • Intrinsic Random Jitter 200 fs rms (typ.)
    • Max. variable amplitude output: 3.5 Vp-p
    • Input sensitivity: 25 mV (typ.), single-end, eye height
  • Versatile Signal Integrity Measurement Functions: Supports CEI-56G, 400 GbE tests
    • TJ/DJ/RJ/Bathtub Jitter, Eye Diagram, Eye Margin Auto-measurements
    • Jitter tolerance tests (using MU181500B)
      • Supports SJ, RJ, BUJ, SSC, Dual Tone SJ, Half Period Jitter (Even/Odd Jitter)
      • SJ generation with large amount: 0.55 UI @ fm 250 MHz
    • Crosstalk tests using variable data skew by using multi-channel
  • High Expandability
    • Sync pattern generation and BER measurements for up to four channels simultaneously
    • Emphasis signal generation (using MZ1854A, MP1861A 2ch sync, 57.8 Gbit/s)
    • PAM4 signal generation (using MZ1854A, MP1861A 2ch sync, 56.2 Gbit/s)
    • Supports burst signal test
    • Max. 512 Mbit/ch programmable data pattern
    • Auto PPG-to-MUX phase adjustment at bit rate change using auto-alignment function

Anritsu MP1900A - Signal Quality Analyzer-R

  • 512 Gbit/s max. transmission capacity, one main frame expandable to 16ch (filling 8 slots with 32 Gbit/s 2 ch PPG)
  • All-in-one support for both high-speed Ethernet and PCI Express interface tests
  • New wideband 32 Gbit/s SI PPG/ED (MU195020A/MU195040A)
    • Bit rate of 2.4 Gbit/s to 32.1 Gbit/s
    • NRZ/PAM4 Support
    • 10Tap Emphasis
    • Variable ISI function
    • Multi-band CTLE (8 Gbit/s, 16 Gbit/s, 28 Gbit/s bandwidths)
    • Low Intrinsic Jitter output of random Jitter 115 fs rms (typ.)
    • High-sensitivity Data input of 15 mV typ. (EYE Height)
    • 1ch/2ch Selection
  • PCI Express Link Training, LTSSM analysis (using MU195020A/MU195040A/MX183000A-PL021)
  • USB Express Link Training, LTSSM analysis (using MU195020A/MU195040A/MX183000A-PL022)
  • Jitter Addition, Jitter Tolerance measurement functions (SJ/RJ/BUJ/SSC, using MU181500B/MX183000A-PL001)
  • Voltage Noise Addition function (Common/Differential/White Noise, using MU195020A/MU195050A)

Anritsu MP2100B - BERTWave™ (10G BERT,Sampling Oscilloscope)

  • Built-in 4ch BERT and sampling oscilloscope
  • Simultaneous 4ch Bit Error Rate (BER) measurements
  • High-quality waveform PPG (1 ps rms Jitter)
  • High-input sensitivity (10 mVp-p minimum input sensitivity)
  • High-speed Eye Mask test and Eye pattern analysis at 150 ksample/s max.
  • Supports differential signal BER measurement, Eye Mask test and Eye pattern analysis
  • Up to six built-in Bessel filters for full-featured application support
  • Compact (18 cm deep) test set for optical module evaluation
  • Simultaneous measurement of BER, Jitter, Eye pattern and Eye Mask
  • Supports WDP measurements
  • Calculates optimum values for sampling simultaneously with equalizer and emphasis values to display Eye Pattern
  • Simultaneous Eye Pattern, Eye Mask and Jitter measurements of simulated waveform

Anritsu MP2110A - BERTWave™ (100G BERT,Sampling Oscilloscope)

For 100/200/400G Multichannel Optical Module/Device R&D and Manufacturing
All-in-One BERT and Sampling Oscilloscope
  • Customized built-in 2ch sampling oscilloscope and 4ch BERT
  • Fast measurement and high performance shorten test times, improve yields, and cut capital infrastructure costs
    • Sampling Oscilloscope
      • Fast: 250 ksamples/s to measure 1 Msamples in about 5 s
      • High Sensitivity: –15 dBm (typ., SMF)
      • Wide bandwidth: 35 GHz (optical, SMF), 25 GHz (optical, MMF), 40 GHz (electrical)
      • Low Jitter: 200 fs rms (typ.)
      • Both NRZ and PAM4 signal analysis  NEW
      • Built-in Clock Recovery Unit (CRU) for both NRZ and PAM4  NEW
      • NRZ Jitter component analysis  NEW
    • BERT
      • Low-Jitter PPG: 600 fs rms (typ.)
      • High-sensitivity ED: 25 mV (typ.)
  • Built-in PC for stable fast performance
  • Sample programs for easy measurement system configuration

Anritsu MS2024B - VNA Master

VNA Master (500 kHz to 4 GHz)
  • 2-port, 1-path Vector Network Analyzer (VNA)
  • Intuitive Graphical User Interface (GUI) with convenient Touch Screen
  • Outstanding calibration stability
  • User-defined overlays for viewing multiple S-Parameters
  • Exceptional RF immunity
  • IF Bandwidth selections of 10 Hz to 100 kHz
  • 100 dB Transmission Dynamic Range
  • 850 µs/data point sweep speed
  • Internal Bias Tee option
  • Vector Voltmeter option, ideal for cable phase matching
  • Standard three-year warranty (battery one-year warranty)

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