Webinar: Using S-parameters as a behavioral model in System Simulation

Date: Wed, May 6, 2020

Time: 11:00am Pacific | 2:00pm Eastern

Using just the S-parameter measurements of a channel, we can simulate how a high-speed serial link signal will look transmitting through the interconnect. In this webinar we will look at how the interconnect features affect the S-parameters and how the S-parameters of a channel affect the eye diagram at different data rates.

Particularly we will explore the impact from losses, discontinuities and mode conversion. Using the best measurement practices, we will go from S-parameter measurements, de-embedding, exporting simulation ready S-parameters and channel simulation to analyze the eye diagrams and data dependent jitter for a variety of interconnect structures.

To view previous webinars in the series please click below:

• Part 1: Beyond the TDR
• Part 2: Reading S-Parameters Like a Book
• Part 3: Lossy Interconnects and Insertion Loss
• Part 4: Mixed mode S-parameters and TDR responses
• Part 5: Principles of De-embedding 

Presenter: Eric Bogatin, Dean of the Signal Integrity Academy

Can't attend live? Register anyway and we will send you the recording and slides afterward.