Luna - OVA 5000 - Optical Vector Analyzer - All-Parameter Analysis

Product Overview:

The OVA simultaneously performs these optical component characterizations every 3 seconds:
  • Insertion Loss (IL)
  • Return Loss (RL)
  • Polarization Dependent Loss (PDL)
  • Phase Response
  • Group Delay (GD)
  • Chromatic Dispersion (CD)
  • Polarization Mode Dispersion (PMD) / Second Order PMD
  • Min/Max Loss due to Polarization
  • Impulse Response
  • Jones Matrix Elements
  • Phase Ripple – Linear and Quadratic

More

Luna’s Optical Vector Analyzer™ (OVA) is the only instrument on the market that is capable of full and complete all-parameter linear characterization of single-mode optical components in a single scan. The OVA provides comprehensive component characterization of dispersion compensation modules, AWGs, Fiber Bragg Gratings and many other optical devices. A complete vector measurement of the linear transfer function is used to characterize the device under test.

Software Packages and Options

Desktop Analysis Software

With the OVA desktop analysis software, you have all the advantages of the Luna Optical Vector Analyzer at your desktop. Using saved OVA measurements, you can perform in-depth analysis at your desk, in a conference room, or even on vacation. If your customers have the desktop analysis software, you can send them specific measurement files for their own viewing. Get all the power of the OVA at your desktop!
 

Measurements:

  • Insertion Loss (IL)
  • Return Loss (RL)
  • Polarization Dependent Loss (PDL)
  • Phase response
  • Group Delay (GD)
  • Chromatic Dispersion (CD)
  • Polarization Mode Dispersion (PMD)
  • Impulse Response
  • Jones Matrix Elements

Polarization Analysis Software

Luna’s Polarization Analysis Software can be used to display the response of an optical component to a simulated input polarization state. This software, combined with measurement data from Luna’s Optical Vector Analyzer, eliminates the tedious and difficult task of polarization alignment often required for measurement of today’s advanced optical components.

Highlights:

  • Get a complete picture of your component’s polarization dependence
  • Quickly determine minimum and maximum loss at each wavelength
  • View the response of your component to specific input states
  • Eliminate time-consuming measurements and calculations
  • Plot insertion loss, group delay, and impulse response
  • Easily adjust simulated input polarization
  • Save data to export to other software
  • Easy to add to an existing OVA system
  • Intuitive graphical interface – All key data and graphs in a simple, easy to use interface


Advantages: The Polarization Analysis Software offers significant advantages for optical component testing in the following categories:

  • Productivity
    • The Polarization Analysis Software improves your ability to quickly decipher your component’s polarization dependence using simulated input states, thus eliminating the tedious and difficult task of polarization alignment.
  • Capital investment reduction
    • When combined with the OVA, which provides comprehensive analysis in a single instrument, you eliminate the need for multiple, expensive instruments for complete analysis and verification.
  • Ease of use
    • The Polarization Analysis Software is simple to use, quick to configure, and can be easily integrated into your current OVA system.

To learn more, see the data sheet.

 
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More Product Information

The T-Ray® 5000 product family allows state of the art terahertz research to be performed quickly and easily. The modular construction and patented fiber-coupling of the T-Ray® 5000 allow experiments to be rearranged to perform a large number of experiments.

Industry-leading combination of measurement speed, range, accuracy and resolution
  • 12 Hz acquisition rate
  • 8.5 meter measurement range
  • 0.0034% time-of-flight delay accuracy
  • 20 micron sampling resolution
Streamlined user interface and Software Development Kit (SDK) included
  • Optimize throughput with customized interface
Automatically locates reflective events and yields RL, IL and event location

  • Verify quality of optical fiber cable assemblies, connectors and short-run networks
  • Troubleshoot and distinguish between macro-bends, splices, connectors and breaks
  • Locate insertion loss points – save hours of troubleshooting time
  • Verify return loss of multiple points in a fiber assembly or harness simultaneously
  • Verify and maintain aircraft and shipboard networks
  • Customize GUI for automated pass/fail verification of your fiber assembly using software development kit

  • “Zero Dead Zone” reflectometer
  • Measure 30 m with 10 μm sampling resolution
  • 80 dB dynamic range
  • Backscatter-level sensitivity (-130 dB)
  • High-speed scanning (1 m segments at up to 3 Hz)
  • Extended range provides 2 km range with no dead zone
  • Measure IL, RL, distributed loss, distance, polarization states, phase derivative and group delay
  • High resolution C and L band (OBR 4600) or O band (OBR 4613) capability

  • Multi-channel (or single-channel) measurements of strain-multiplex: Over 300,000 measurement locations
  • Flexible, lightweight and easy to install sensors reduce time to first measurement
  • Passive, corrosion resistant, dielectric, flexible sensors go where other sensors can’t – in bends, around corners, embedded inside materials
  • Long sensor life – no drift or recalibration required, cycle counts >107
  • Large strain range and high resolution allow for mapping of complex strain fields and large strain gradients

  • Ideal for testing RF and microwave devices
  • Fast sweep speed and wide dynamic range minimize test times and maximize throughput
  • Excellent corrected directivity allows for less measurement uncertainty
  • Time domain with time gating option grants easier and faster fault identification
  • The LAN interface for remote control is more robust than USB and faster than GPIB
  • Standard removable hard drive provides additional security for military and government research users
  • A common GUI and SCPI interface within the ShockLine™ family
  • USB ports allow for easy connection to user-provided monitor, keyboard, and mouse
  • The small 2U packages allows for the efficient use of rack space

  • World's first series of compact VNAs to 43.5 GHz for cost-effective measurements.
  • PC control takes advantage of external computer processing power and functionality.
  • Compact 1U high package for efficient use of bench and rack space.
  • No onboard data storage eliminates the need for data purging in secure applications.
  • Time domain with time gating option grants easier and faster fault identification.
  • A common GUI interface within the ShockLine family reduces switching costs between models

  • 1-Port VNA with frequency options from 150 kHz – 6 GHz
  • External PC control enables control of multiple MS46121B in parallel for excellent multisite throughput.
  • Very compact package allows for direct connection to the DUT.
  • Scalar Transmission measurements in a (1 to 1) or (1 to n) configuration.
  • No onboard data storage eliminates the need for data purging in secure applications.
  • Standard bandpass time domain with time gating grants easier and faster fault identification.
  • A common GUI interface within the ShockLine family reduces switching costs between models

  • Up to 65 GHz system bandwidth
  • Up to 130 GBaud detectable baud rate
  • Up to 160 GS/s sample rate
  • Real-time acquisition for testing of coherent modulated optical communications links
  • Built-in dispersion compensation, polarization de-multiplexing, and carrier recovery algorithms
  • Supports DP-QPSK, DP-16QAM, and a wide variety of other PSK and QAM formats
  • Support for custom modulation formats
  • Built-in local oscillator
  • Adaptive calibration – Receiver can be disconnected and reconnected without factory calibration

Luna Innovations

Luna Innovations mission is to help advance the continuing increase in data transmission rates for the public & private communications network with high speed optical receivers and test products, while also leveraging our unique fiber optic sensing technology to improve the structural testing of new composite elements and components in new aircraft and automobiles.

Luna Innovations Incorporated (NASDAQ: LUNA) was founded in 1990 and has been successful in taking innovative technologies from the applied research stage to product development and ultimately to the commercial market. In some cases, the successes led to the creation of independent businesses. We have created companies in our area of focus, sold some of them to industry leaders in their fields, raised private capital, formed joint ventures and entered into a number of licensing agreements.

Contact Details

Luna

301 1st Street, SW

Suite 200

Roanoke, VA 24011

Phone: 540-769-8400

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