Products

Displaying 25 - 32 of 32
Autonomous Modal Parameter Estimation Procedure Multiple Live Parameter Estimation Windows Task Oriented, Easy-To-Use Interface
Only BSDL files required to get the board up and running  Set up pin states – e.g. low, high, toggling  Trace shorts, opens and other signals  Easy low-level access to device pins/busses  Clear display of the pins/balls with variable zoom levels and split screen  View JTAG chain data as waveforms  Quickly find and monitor changing pins  Program devices with SVF and STAPL files  Real-time interaction  XJIntegration (use XJAnalyser functionality from other software)
Reduce your time spent debugging boards due to high precision fault isolation  Improve your time to market and reduce project risk by early design verification  Reduce your test development time by reusing tests from prototype/design in manufacturing and field support  Ongoing time savings by test reuse across projects
Reduce flash programming times  SPI, QSPI, parallel NOR flash devices supported  Support for NAND flash devices available on request  Shortened development cycles  No need for additional equipment  Can be used for fast firmware upgrade  No FPGA development required
Repair-focused environment for XJDeveloper / XJRunner tests.  Full Connection test.  RAM, Flash and other non-JTAG device tests.  Flash, FPGA, CPLD and EEPROM programming.  Layout Viewer* to show the physical location of faulty nets, pins and components.  Schematic Viewer* to show the circuit design around faults.  Direct control of the pins/balls of JTAG devices.  View pin states graphically in real time or capture them in the Waveform Viewer.  Trace signals to identify shorts, opens and other faults.
Improves your QA through configurable logging  Allows you to retain power of control on how boards are tested by third parties  User-friendly environment reduces your training costs for production operatives  Ability to test multiple boards, simultaneously, by using multiple XJLinks
Solve machine vision applications efficiently by constructing flowcharts instead of writing program code, using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying Use a single program for creating both application logic and operator interface Leverage deep learning for visual inspection through image classification and segmentation tools Rely on a common underlying vision library for the same results with an Iris GTX smart camera, vision systems or third-part computer Work with multiple cameras all within the same project or per project running concurrently and independently from one another, platform permitting
Solve applications rather than develop underlying tools by leveraging a toolkit with a more than 25-year history of reliable performance Tackle applications with utmost confidence using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying Base analysis on monochrome and color 2D images as well as 3D profiles, depth maps and point clouds Harness the full power of today's hardware through optimizations exploiting SIMD, multi-core CPU and multi-CPU technologies Support platforms ranging from smart cameras to HPCs via a single consistent and intuitive API