Products

Displaying 1 - 3 of 3

Aeroflex 5100 T/R Module Test Environment

  • Complete Synthetic Test Environment 
    Hardware, software, processes, support
  • Optimized for T/R Module 
    Test Test Module Subassemblies, Modules & Multi-module Assemblies on One System
  • Highest Test Throughput Available
  • Proven Systems Deployment 
    5th Generation Solution – Major Customers Worldwide
  • Full Range of Required Mixed Signal Capabilities 
    DC, Digital, Analog, RF/Microwave
  • System Level Architecture 
    Calibration, Verification, Alignment
  • Open System Architecture 
    System Hardware & Software, TPSs

Aeroflex 5200 Satellite Payload Test Environment

  • Complete Synthetic Test Environment
    Hardware, software, processes, support
  • Optimized for T/R Module Test
  • Highest Test Throughput Available
  • Proven Systems Deployment
    5th Generation Solution – Major Customers Worldwide
  • Full Range of Required Mixed Signal Capabilities
    DC, Digital, Analog, RF/Microwave
  • System Level Architecture
    Calibration, Verification, Alignment
  • Open System Architecture
    System Hardware & Software, TPSs

Aeroflex 7700 Integrated Microwave Test Solution

A Complete RF Test Environment
  • Delivered ready to test with a full-featured execution and development environment
  • Full set of common RF measurements
  • Fully integrated Device Under Test (DUT) control and power
  • Fully integrated control of peripherals such as temperature chambers
  • Architected to support ATE
Complex Device Testing Capable
  • Frequency range 1 MHz to 6 GHz (expandable to 26.5 GHz)
  • Complete measurement suite including S-parameters for full characterization of devices such as LNAs, VCOs, and transceiver modules
  • Control of device states built into measurements
A True Synthetic Architecture
  • Utilizes a common set of hardware for all stimulus and response functions
  • Smaller footprint than traditional “rack and stack” instruments
  • Mature system level calibration scheme
  • Reduced hardware cost compared to full instrument-based test system
  • New capability can be incrementally added at low cost with little impact to existing measurement sequences