Navitar - Optical Wizard
More Product Information
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Designed specifically for temperature compensation of os3100 strain gages relief.
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Ruggedized, weldable sensor package
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Qualified to same rigorous standards applied to electronic gages
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Spot-weld, epoxy, or screw mounted.
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Double-ended design supports multiplexing of many sensors on one fiber
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Included in ENLIGHT’s sensor templates – allows for quick and easy optical to mechanical conversions
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High sensitivity
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Rugged sensor package
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Multipoint up to 128 sensors on a single HYPERION instrument
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Various physical parameters measurements coupled onto the same fiber optic cable
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Long distance, with 10’s of kilometers of coverage
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Available mounting block for two and three axes
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Compatible with Luna’s ENLIGHT software
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Multi-channel (or single-channel) measurements of strain-multiplex: Over 300,000 measurement locations
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Flexible, lightweight and easy to install sensors reduce time to first measurement
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Passive, corrosion resistant, dielectric, flexible sensors go where other sensors can’t – in bends, around corners, embedded inside materials
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Long sensor life – no drift or recalibration required, cycle counts >107
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Large strain range and high resolution allow for mapping of complex strain fields and large strain gradients
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Fast, simple, repeatable installation with either weldable or epoxy mounted design
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Cable integrated with sensor package for fiber protection and strain relief
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Double-ended design supports multiplexing of many sensors on one fiber
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Included in ENLIGHT’s sensor templates – allows for quick and easy optical to mechanical conversions
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Modular design with multiple reference paths built in for high-availability.
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6 expansion slots for customization and expansion.
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Industry-first GPS integrity checking with Timewall™
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Unique optical crosslink architecture for either Master-Slave hierarchical setups or Master-Master crosschecking and failover
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LCD display and keypad for basic status and configuration – secure web browser for detailed setup.
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Fully portable and rugged OBR
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Track and analyze return loss (RL) and insertion loss (IL) versus length
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Measure length and latency with high precision
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Spatial sampling resolution down to 80 μm
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Available with IP65 and MIL-STD certifications
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Easy and fast setup of camera views
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Go to Light and Image Settings of the selected camera view with only one mouse click
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Guided workflows for wafer setups, alignment tools and Autonomous Assistants
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Workflow wizard shows task-relevant settings and options only
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Visualizes the progress of setup, alignment and measurement tasks
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Status information always at hand
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Informs the user about events, for example “Successful Alignment”
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Interacts with the user and helps with intelligent solutions
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For very complex wafer structures
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Enables automatic test of multiple devices in each die location before stepping to the next die
See more Key Features on Specifications & Details tab
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Up to 100 GHz Industry leading analog bandwidth
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Acquisition module configurations with up to:
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4 channels at 36 GHz
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2 channels at 65 GHz
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1 channel at 100 GHz
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Up to 240 GS/s sample rate
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Long Memory - Up to 1.5 Gpt/ch
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Modular Design - build a system with up to 20 acquisition modules, for:
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80 channels at 36 GHz
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40 channels at 65 GHz
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20 channels at 100 GHz
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ChannelSync™ Architecture for 130 fs matching between channels
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Multi-Lane eye, Jitter and Noise Analysis with SDAIII-CompleteLinQ
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Optical Modulation Analysis with Optical-LinQ
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PAM4 Eye, Jitter and Noise Measurements with PAM4 Signal Analysis
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Industry’s only true hardware 14.1 Gb/s serial trigger
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Add 12.5 GS/s mixed-signal capability at any time with the HDA125 high-speed digital analyzer
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Easy alignment without an optical table
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Sample mounting fixture with integrated iris
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No tool required to change lenses
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Accommodate various focal length lenses
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Use to measure transmission spectroscopy
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Compatible with HTS40nm and HSR40n1