Teledyne LeCroy - High Voltage Passive Probes
More Product Information
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Operates up to 16GTps, PCIe 4.0 data rates
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Downward compatible with PCIe data rates of 2.5, 5.0 and 8.0GTps
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Supports 1 link of 4 or 8 lanes
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EDSFF E1.L or E1.S NVMe SSD DUT (not supplied) plugs directly into the Interposer
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Includes 4 high-quality, mini-SAS HD 4X cables for Analyzer connection
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Data path uses high-speed linear redrivers to insure good signal capture with little or no tuning
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Supports Analyzer side-band signal capture and triggering with display in multiple formats
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The supplied power brick makes interposer power is independent of host system
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Works together with the VIAVI Xgig 4K4 and 4K16 PCIe 4.0 Analyzer/Jammer chassis
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Supported by VIAVI Xgig Analyzer tools for trace capture with filter, trigger and more
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Provides consistent, repeatable capture of link training, equalization negotiation and other data
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (42 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
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Camera and IEEE 1394b cable (other configurations on request)
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350 Watts CW
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0.7–6.0GHz
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Class A
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CE & RoHS Com-pliant
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High Efficiency
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Provides an effectively noise free environment around the device under test (DUT)
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World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
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Up to 4x faster flicker noise thermal testing on 30 μm pads
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Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
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Provides fully managed and filtered AC power to the entire system – prober and instruments
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Filters harmful noise generated by external thermal control systems
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Reduced “antenna effect” injection of unwanted RF noise into the measurement path
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Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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User-centered design minimizes training costs and enhances efficiency
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
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3000 VA, 2700 W, 110/220 VAC at 60 Hz input and 220 VAC at 60 Hz output, double conversion, rugged, high temperature, isolated, on-line UPS with hot swap battery drawer and optional EBP, with power factor correction for Navy shipboard applications
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Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
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Re-configurable and upgradable as requirements grow
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Minimizes setup times with no loss in performance or accuracy
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Seamless integration of various measurement instruments
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Solid station frame
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Built-in vibration-isolation solution for superior vibration attenuation
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Rigid microscope bridge
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Compact and rigid mechanical design
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Highly accurate measurement results
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Incorporates best-known methods
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Ergonomic and straightforward design for comfortable and easy operation
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Low-profile design
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Simple microscope operation
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Quick and ergonomic change of DUT through pull-out stage
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Minimize training efforts
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Fast time to data
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Convenient operation
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The T‑Gauge® Control Unit (TCU) is the central component of the T‑Gauge® family of products and serves as the source of the optical and electrical signals necessary to generate and detect terahertz. The TCU also transforms analog data into a digital signal that can be analyzed using the onboard processor and interacts with the wide variety of THz accessories.
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The TCU is a 19 inch (483 mm) rack, wall, or table mountable instrument, consisting of an ultrafast laser, high-speed optical delay, ranging optical delay, power supplies, and signal conditioning electronics, with connectors for convenient interfacing to various optical and electronic components. The high-speed delay included in the TCU can be chosen from a number of delay length and speed options. When utilized in conjunction with T-Gauge® accessories, the TCU enables the user to generate and detect pulsed terahertz energy for a wide variety of measurements.
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Broadest Model Selection: 800W to 7.5kW (higher power available up to 250kW Contact Factory)
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Exclusive Voltage Models: 60V to 1000V
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Multiple loads in one: Multiple ranges for voltage, current resistance and power
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Intuitive Front Panel Control: Run sequences, triggers, constant current to constant power cross over
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RoHS Compliant
Teledyne LeCroy
Teledyne LeCroy is a leading provider of oscilloscopes, protocol analyzers and related test and measurement solutions that enable companies across a wide range of industries to design and test electronic devices of all types. Since our founding in 1964, we have focused on creating products that improve productivity by helping engineers resolve design issues faster and more effectively.
Oscilloscopes are tools used by designers and engineers to measure and analyze complex electronic signals in order to develop high-performance systems and to validate electronic designs in order to improve time to market. Protocol analyzers are tools used by designers and engineers to generate and monitor traffic over high speed serial data interfaces, including DDR, PCI Express, Fibre Channel, Serial ATA, SAS, USB and others. Both products are critical in the development of a wide variety of demanding design applications.
We utilize both of these important product areas in combination to tackle the most demanding serial data test applications, offering tailored solutions to help our customers perfect their chips, interfaces, subsystems and products which utilize these important communications standards. With the explosion in the use of serial data communications technologies in semiconductors, between devices on circuit boards and between computers and peripherals, we are aimed at a growing and important market.
Our oscilloscopes offer a powerful combination of large and informative displays combined with advanced waveshape analysis capabilities typically tailored to enhance the productivity of engineers in specific applications areas such as serial data test, disk drive test and automotive bus analysis.
Headquartered in Chestnut Ridge, New York, LeCroy has sales, service and development subsidiaries in the US and throughout Europe and Asia. LeCroy products are employed across a wide variety of industries, including semiconductor, computer, consumer electronics, military/aerospace, automotive/industrial, and telecommunications.
Contact Details
Headquarters Teledyne LeCroy
700 Chestnut Ridge Road, Chestnut Ridge, NY 10977-6499, USA
Phone: 800-553-2769 or 845-425-2000
Phone Support: 1-800-553-2769
Fax Sales: 845-578-5985
Email Sales: contact.corp@teledynelecroy.com
Email Support: support@teledynelecroy.com (Oscilloscopes, Waveform Generators, Signal Integrity)