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Webinar Power Rail Integrity Measurements Hands on Webinar – Accurate and Efficient PDN Measurements Power Measurements, Power Rail Voltages

Join Teledyne LeCroy for this hands-on webinar to learn how to make accurate, high bandwidth measurements of power rail voltages and avoid introducing probing artifacts or interference into the measurements.

Topics to be covered in this webinar:

  • Best practices for power rail probing
  • Probing tradeoffs: Noise, reflections, offset, bandwidth, loading
  • Power rail static and transient analysis
  • Correlating power rail noise to clock jitter
  • Using spectral analysis to finding root causes of PDN noise

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

MAUI Studio
>> https://teledynelecroy.com/mauistudio/

Zip file with Lab Notebook files
>> Click here to download zip file

These files will allow you to load the various waveform examples shown during the webinar and participate in hands-on instruction on how to make critical power integrity measurements.

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Webinar How to Become an Expert in Automotive Ethernet Testing - Part 3: Mastering Transmitter Droop, Distortion, Jitter and Spectral Density Test Automotive Ethernet, Jitter, Physical Layer Compliance Testing

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Mastering Transmitter Droop, Distortion, Jitter and Spectral Density Test

In this session (Part 3), we will describe the requirements for the Physical Media Attachment (PMA) compliance tests with practical demonstrations using complex signals while indicating the procedures for obtaining the best measurement results and signal integrity.

Topics to be covered in this webinar:

  • Maximum Output Droop
  • Transmitter Distortion
  • Transmitter Timing Jitter, Master and Slave
  • Transmitter Power Spectral Density (PSD)
  • Transmitter Peak Differential Output
  • Transmitter Clock Frequency

Who should attend? Engineers and technicians looking to learn more about the physical layer compliance test process for Automotive Ethernet.

What attendees will learn? What to expect when setting-up and performing Automotive Ethernet physical layer tests. Each of the different tests will be covered in detail with hands-on experience.

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Video Yokogawa Dl850E ScopeCorder Network Drive (FTP client) How to. Data Acquisition
How can I automatically save data to a remote network drive? With the Yokogawa DL850E ScopeCorder, you can save data directly to a network drive using FTP (File Transfer Protocol). This makes it easy to save backup files and transfer data without the need of a USB drive or SD card, or to use the ScopeCorder as a remote data acquisition solution

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Video Interview at Yokogawa T&M stand - electronica 2018 Power Measurements, Mixed Signals, Oscilloscopes

Interview with Wolfgang Gleißner, T&M Marketing & Support Manager of Yokogawa T&M Germany at Electronica 2018. Listen this few minutes video to get to know the highlights of the latest news and developments from Yokogawa T&M.

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Webinar Optimizing Your Vertical Gain Oscilloscope - Coffee Break Webinar Series Oscilloscopes

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

Why do we care about vertical dynamic range? How do we take the most advantage of this to achieve the highest accuracy and precision? In this session we review your oscilloscope’s vertical gain and why we should care about it.

Topics to be included:

  • Vertical dynamic range – why do we care?
  • Effects on measurement accuracy
  • DC versus AC coupling – pros and cons
  • Should we overdrive the scope?
  • Vertical offset versus scope sensitivity

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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White Paper Mode-Multiplexed 620-GBd QPSK Transmission over 1200-km DGD-Compensated Few-Mode Fiber Low differential group delay

Low differential group delay (DGD) between the modes of a graded-index few-mode fiber is obtained by combining segments with DGD of opposite sign. Transmission of mode-multiplexed 620-GBd QPSK over a record distance of 1200 km is demonstrated.

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Video MY600 Digital Insulation Tester Insulation Testing

Improve your inspection and regular maintenance efficiency with MY600. 

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Video How to Capture Runt Pulses with the DLM3000

A runt pulse can occur in digital circuits when a pulse does not reach a valid high or low level. Learn how to capture these runt pulses with Yokogawa’s DLM3000. DLM3000 product page: https://tmi.yokogawa.com/us/solutions...

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Video How to Select the Appropriate Cable Microwave, mmWave, Cables

Selecting the right cable is crucial for both Microwave and mmWave applications. Indeed, measurements are not accurate nor reliable unless appropriate cables are used. This video outlines how to select the most appropriate cable for any given purpose.

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Video LeCroy Mixed Signal Oscilloscope - Measurement Oscilloscopes, Probes, Pulse Measurement

The oscilloscope has been a primary tool for electronic design engineers since the invention of that instrument, many years ago. The first decades of oscilloscopes were “analog” in nature.

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Webinar What Every Oscilloscope User Should Know About Transmission Lines Oscilloscopes, Transmission Lines

Join Eric Bogatin and Teledyne LeCroy as we introduce you to five simple, yet essential, principles of signal integrity which we will apply to understanding how to interpret oscilloscope measurements from DC to 1 GHz bandwidth.

Many questions have obvious answers if we understand just a little bit about transmission lines and what the oscilloscope actually measures:

Topics to be covered in this webinar:

  • Is it really true that the longer the cable, the longer the RC charging and the longer the rise time?
  • Does this mean only short cables can offer high bandwidth?
  • When should you use a 50 Ω input and when a 1 MΩ input to the scope?
  • Why do I measure a rise time of 150 ns for the compensation signal on the front of the scope and others report it as 5 ns rise time?

Who should attend? Any engineer who wants a practical understanding of transmission lines and why this is so important in any oscilloscope measurement.

What attendees will learn? Attendees with never be confused about transmission lines again and will know the right way of using the 50 Ω termination on an oscilloscope.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Webinar Beyond DDR Compliance Testing — Using Advanced Debug Tools - Part Two of Four Debugging, DDR Memory, Jitter Measurements

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Become an Expert in DDR Memory Physical Layer Testing Series

Join Teledyne LeCroy for this 4-part DDR Memory Master Class to learn about the basics of DDR testing with oscilloscopes, including common test preparation and challenges, the difference between compliance and debug test tools, and practical tips and techniques to increase your DDR validation efficiency and apply the correct debug tools.

Beyond DDR Compliance Testing — Using Advanced Debug Tools

In this session (Part 2), we review the latest DDR test requirements and provide practical advice on solving test challenges. We will provide guidance on how to test to the latest JEDEC standards and proper use of debug tools to overcome test and validation challenges.

Topics to be included:

  • DDR/LPDDR4, LPDDR4X, and DDR/LPDDR5 specification review
  • Test system ‘bring-up’ and debug
  • When are you ready to move from ‘debug’ to ‘compliance’?
  • Implications of fully encoded command bus and DFE in LPDDR5 and DDR5
  • How to send the proper test signals
  • Read/Write eye separation
  • Eye and jitter measurements

Who should attend? Design and validation engineers working to validate and debug DDR in embedded systems.

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Webinar Power Integrity of Multi-Rail Embedded Designs Hands on Webinar Power Rails, Power Analysis, Power Management

Join Teledyne LeCroy for this hands-on webinar to learn how to characterize and validate the integrity of multiple power rails in a PDN network. The interactions and control of VRM’s, POL’s, LDO’s by Power Management ICs in embedded designs will be analyzed in this webinar.

Topics to be covered in this webinar:

  • Best practices for power rail probing
  • Multi-rail static and transient power analysis
  • Validation of start-up and shutdown delays and sequences
  • Correlation of embedded serial control signals - I2C, SMBus, PMBus, and SPMI - to power management events

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

MAUI Studio
>> https://teledynelecroy.com/mauistudio/

Zip file with Lab Notebook files
>> Click here to download the zip file

These files will allow you to load the various waveform examples shown during the webinar and participate in hands-on instruction on how to make critical power integrity measurements.

Learn More ❯
Video Testing electric vehicles “Live” at the Automotive Testing Expo Europe!

If you happened to miss Automotive Testing Expo 2019 in mid May in Stuttgart, you can take peak view on what was going on at Yokogawa stand. In case of more inquiries or wanting to see the demo once again live, don't hesitate to get in touch with the precision makers at tmi.yokogawa.com/contact.

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Video Teledyne LeCroy MAUI Studio – Embed Real-time Scripts

In this video, we show how you can use scripts to exchange data in real time between Teledyne LeCroy MAUI Studio oscilloscope software and third-party applications like MATLAB, Excel and LabVIEW. For additional information visit, teledynelecroy.com/mauistudio.

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Video Phase Stability against Bending in Microwave and Millimeter wave Microwave, mmWave, Phase Stability, Cables

During microwave and mmWave measurement processes, a cable's reliability – particularly its phase stability – is critical. Junkosha has developed a cable with minimal phase fluctuation against bending, which has been achieved through innovative materials and processing technology.

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Webinar Tolly Tests Safire Next-Generation Firewalls

Next-Generation Firewalls (NGFWs) are full of advanced security features - but the more you enable, the slower they run. Imagine if the number of airbags in your car determined how fast it could be driven! Safire, a new product from Xena Networks, promises to change that by bringing unprecedented visibility to firewall performance - quickly and cost-effectively.

The Tolly Group recently tested Safire to see if it lived up to its promise. Join us for a webinar where we review the results of Tolly's Safire evaluation tests and then hear how Safire might add value for security consultants (MSSPs & SIs) and internal enterprise IT departments.

Register Now!

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White Paper Space-Division Multiplexed Transmission over 4200-km 3-Core Microstructured Fiber

We experimentally demonstrate multiple-input-multiple-output transmission of a combined 3-space-, and 2-polarization-, and 5-wavelength-division multiplex in a 3-core microstructured fiber over 4200 km. This is the record transmission distance for spatial-division multiplexing in a fiber.

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Webinar Setting up Your Timebase and Using Memory Correctly Oscilloscope - Coffee Break Webinar Series Timebase, Oscilloscopes

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

We are all pretty good at setting a time window for our capture. But, what about the waveform memory that is used for the capture? How does this interact with the sample rate as we vary the time window? Can we segment the timebase to capture only the important circuit behaviors?

Topics to be included:

  • Timebase, memory length and sampling rate – how do these impact our results?
  • Timebase delay – pre- and post-trigger location
  • Sequential timebase – capturing “just the facts”
  • Scope preferences we forget are available

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Webinar Fundamentals of Advanced Measurements and Math Oscilloscopes, Waveform Math Tools, Serial Data Triggering

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Advanced Measurements and Math

In this session (Part 2), we will develop skills for acquiring and performing measurements, waveform math, and analysis that isolate and help us locate amplitude and timing errors within an embedded design.

Topics to be included:

  • Plotting measurement values over time
  • Waveform math tools
  • Measurement parameter Tracks and Trends
  • Serial data triggering and decode
  • Mixed signal digital capture and integration

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

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Video Teledyne LeCroy MAUI Studio – Serial Data

In this video we show you how to decode and analyze serial data signals by importing them into the Teledyne LeCroy MAUI Studio oscilloscope software. For additional information visit, teledynelecroy.com/mauistudio.

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White Paper Plotting the performance landscape for SD-WAN Ethernet, SD-WAN

SD-WAN was first introduced to provide a reliable and cost-effective backup to MPLS-based enterprise WAN connectivity. As IP and Internet networks have become more reliable, along with the growth in adoption of cloud services, SD-WAN has evolved and is replacing branch office routers as the preferred WAN connectivity solution.

According to Gartner, 60% of enterprises will have implemented SD-WAN by 2024 compared to just 30% today. At least 30% of enterprise locations will only have Internet WAN connectivity, which is twice the current number. The impact of SD-WAN on the WAN infrastructure market is also clear with Gartner expecting a Compound Annual Growth Rate (CAGR) of -3.1% from 2017 to 2024 as cheaper SD-WAN solutions replace more expensive branch office routers

Nevertheless, one should not make the mistake of thinking that SD-WAN is less complex or intelligent. Quite the contrary in fact. The latest generation of SD-WAN solutions are expected to be application-aware and capable of determining the optimal path through the WAN in real-time on a per application basis. This includes cloud services with direct offload from the branch to co-located cloud edge services. In addition, sophisticated security capabilities are provided to support Zero Trust Network (ZTNA) and/or Secure Access Service Edge (SASE) concepts.

The sophistication of modern SD-WAN solutions allows a true de-coupling of WAN connectivity from the underlying transport mechanism, which is predominantly Ethernet based. It also means that there is little insight into the data transport layer, only to the tunneled SD-WAN connections that are supported. As data consumption continues to grow and more sophisticated and demanding Internet-based services contend for public Internet resources, the underlying data transport layer networks supporting SD-WAN are becoming more dynamic and unpredictable. Multiple choices can be available, such as fixed broadband access over copper or fiber, Fixed Wireless Access (FWA) or 5G mobile broadband, but when should one choose these options, and can one be sure that the current measured performance will be maintained?

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Webinar Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links Serial Data Links

Join Teledyne LeCroy for our new three-part webinar series to learn more about how to accelerate and improve testing of PCIe® v. 4.0 and 5.0, USB4™, Thunderbolt™ 4, and DisplayPort™ 2.0 serial data links.

Nov. 19 - Part One: Identifying and Debugging PCIe Link Equalization Problems
Dec. 3 - Part Two: Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links
Dec. 16 - Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

Join us for Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

High-speed serial link transmitter testing can be optimized with the right tools, and valuable circuit design operating margin information can be extracted.

This webinar will provide an overview of a typical high-speed serial data transmitter test using USB4 as an example. We will synthesize a high-speed serial data signal, use a real-time oscilloscope to analyze the signal at a virtual receiver, and compare the virtually-received signal to a live signal. We will review signal integrity margin analysis and jitter, eye diagram, IsoBER contour and crosstalk eye measurements.

Who should attend?

  • Signal Integrity Engineers
  • Design and Validation Test Engineers

Presenters:
Mike Engbretson, Product Marketing Manager and John Smith, HSS Business Development Manager

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White Paper Photometric Stereo Technique for Machine Vision Machine vision, Photometric stereo

Objects with unique 3D aspects can make identifying surface defects with standard machine vision configurations more difficult. One solution to achieve feature-appropriate surface contrast is Photometric Stereo.

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Application Note CSI, Inc. Cement Board Inspection Application

Machine Vision Challenge: Cement Board Inspection

A customer inspecting 4 ft. by 10 ft. white fiber-cement boards required a lighting solution to highlight small 5cm long and 1mm thick surface scratches and defects. They also identified significant surface concavity created during the manufacturing process on some of the 2cm thick boards. As a result, they required the flexible lighting solution to also assist their efforts to develop an identification and grading system to pass/fail board concavity.

The cement boards were inspected in motion, running 1 foot/second through an enclosed tunnel. The inspection setup required a low-angle, narrow beam throw for uniform illumination across the full surface of the board to identify the scratches. The tunnel setup also required the use of longer lights for full board coverage and to facilitate installation.

An additional inspection using the same area-scan camera, but with bright field oriented lighting, necessitated the two lighting orientations be independently controlled with an on/off trigger. The customer contacted Control System Integrators (CSI), Inc. to configure a lighting solution for this inspection challenge.

Ai Solution: High Intensity Bar Lights

Via Ai’s Distribution Partner, Kendall Electric, CSI, Inc. reached out to Advanced illumination to provide a dark field lighting solution for their customer. To match the size and uniformity needs, Ai suggested the LL174 High Intensity Bar Lights with a diffuse light conditioning.

These lights are highly customizable, each available in the 24” length demanded of the application. The configurable control options also allowed for the use of the iCS 3 Inline Cable Controller to enable constant or strobed power to the light. The longer length and controller options met the customer’s initial requirements to fit within the existing machine vision setup constraints.

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Application Note Thermal Solutions for Power Electronics Thermal Solutions, Power Electronics, Power Generation, Operational Equipment

Power Electronics are the most critical components in a large number of applications; including power generation and operational equipment. Power Electronics module manufacturers invest millions of dollars to make these devices as effcient as possible, aiming primarily to reduce waste heat. However, even with effciency gains at the module level, overall waste heat is rising across the industry due to more system and user driven functional requirements. Increased system capability leads to higher power densities and more waste heat! Selecting off the shelf thermal solutions is no longer a viable option for applications that are pushing the envelope on power and operating effciency.

Investing in an optimal thermal solution can be the design change with the largest payback potential in a high power system. If properly designed, the thermal management system should not only meet performance requirements, but do so while minimizing energy usage. This eBook provides a guide for designers looking to expand the operating limits of traditional air and liquid cooled thermal solutions.

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Article Probe Safety Demystified: Dynamic Range and Voltage Swing Dynamic Range, Probe Safety, Voltage Swing

One of the most basic things to know when using any probe is “what is the maximum voltage the device can safely measure?” The answer isn’t as straightforward as you might imagine, it requires understanding several key probe specifications as well as the nature of your signal.

Single-ended Range

Everyone is pretty familiar with single-ended range: that's the maximum safe voltage input to ground, shown in Figure 1. Ground is directly tied to oscilloscope ground, which is tied to building ground. Therefore, when measuring voltage within this range using a single-ended probe, the ground connection cannot be a floating voltage, or you could damage the probe, the DUT, the oscilloscope...maybe yourself, as well. Single-ended voltage must be a grounded voltage on your board or something that could be tied to ground.

Dynamic Range and Maximum Non-destruct Input Voltage

Differential mode range is measured between inputs.

Figure 2. Differential mode range is measured between inputs.

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Video DLM3000 Mixed Signal Oscilloscopes - an introduction Oscilloscopes, Mixed Signals

This video will introduce the key features, benefits and values of Yokogawa DLM3000 Mixed Signal Oscilloscope. Yokogawa DLM3000 is widely used by the customers in transportation, energy, home appliance, etc., areas.

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Video Introduction of DL350 ScopeCorder - More than a test tool Data Acquisition

Capture, display, record and analyze the widest variety of electrical and physical parameters in automotive, transportation, electronics, energy and mechatronics.

In this video Lee Thomas, Yokogawa T&M Sales Manager in the UK showcases the Yokogawa DL350 ScopeCorder.

Complete measurement, complete portability.

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Video Next Generation in Power Measurements Power Measurements

Engineers in transportation, power generation, consumer electronics and industrial equipment are facing complex measurement challenges as they adopt faster development cycles to meet changing market requirements while complying with stringent quality standards. In this 45 minute webinar you will learn about how next generation power analyzers, such as the new Yokogawa WT5000, can help engineers get reliable and actionable insights from their test bench or measurement setup.

This includes : Multi-channel measurements, Mechatronic analysis and motor evaluation, Advanced filtering, harmonics and noise, Modular architecture and platform extensibility and Guaranteed accuracy and accredited calibration.

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Video Yokogawa’s 8-ch Oscilloscope, DLM5000 – Simple, Adaptable, and Dependable Oscilloscopes, Semiconductors, Power Measurements

Description: As the creator of the world’s first 8 channel oscilloscope, the DLM5000 is Yokogawa’s latest addition to our line-up and takes you beyond 8 channels. The adaptability of the DLM5000 is a key requirement during the development of high-performance and intelligent power-semiconductor technologies and mechatronics applied in a modern electric vehicles, motor controls and energy efficient electronic designs.

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Video Yokogawa DLM3000 Automotive Serial Bus Analysis Automotive Serial Bus Analysis
The Yokogawa DLM3000 is your partner in automotive serial bus development. Supporting CAN, CAN FD, CXPI, LIN, SENT, and FlexRay, the DLM3000 offers long memory to capture "before" and "after", a fast Auto Setup function to discover applicable settings, and search and trigger functions to help find important frames. Additional general purpose serial buses UART, SPI, an I2C are also available.

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Webinar Pre-Compliance EMC Testing with a Real Time Scope EMC Testing, Oscilloscopes

Before an EMC compliance test, there are a few simple measurements that can be performed on the lab bench to indicate potential test failures. While only near-field emissions can be measured, they can sometimes indicate potential far-field problems that might cause an EMC test failure.

Join us for our new two-part webinar series for measurement tips to overcome these challenges.

In this webinar, we demonstrate how the combination of a real time oscilloscope and near field probes can give us insight into how physical interconnect structures cause pathological EMC problems.

Register now

In Part 2 we will explore detecting potential EMC failures measured with real time spectral analysis. Click here to register.

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelist, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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Webinar Technical Webinar: The Importance of Using Programmable Resistors for Sensor Simulation in Test Programmable Resistors, Sensor Simulation

In this webinar, we will help you to understand programmable resistors, their construction, why they are needed, resistor selection and look at some applications where sensor simulation is an integral part of the adopted test strategies to improve repeatability, reduce test times, and ultimately lower the cost of test. View the webinar here

A few of the takeaways are:

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Webinar How to Characterize Lossy Interconnects in High-speed Designs Insertion Loss, Loss Interconnects

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Characterize Lossy Interconnects in High-speed Designs

Join Eric Bogatin and Teledyne LeCroy for this webinar exploring the properties of lossy transmission lines and how to extract their important figures of merit. All losses are frequency dependent. We introduce a simple way of estimating the losses expected based on the interconnect design and how to measure the losses using S-parameters.

Topics to be included:

  • The root cause of losses
  • Estimating the conductor and dielectric losses
  • Extracting an important figure of merit from insertion loss
  • How much insertion loss is too much?
  • Estimating the maximum data rate of a channel from the insertion loss

Who should attend? Any Engineer designing, validating or using high-speed serial data links.

What attendees will learn? How to analyze insertion loss and interpret measurements in terms of highest acceptable data rate.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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White Paper Low-Loss Mode Coupler for Mode-Multiplexed transmission in Few-Mode Fiber

We present a novel low-loss 3-spot mode coupler to selectively address 6 spatial and polarization modes of a few-mode fiber. The coupler is used in a 66 MIMO-transmission experiment over a 154-km hybrid span consisting of 129-km depressed-cladding and 25-km graded-index few-mode fiber.

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Webinar Automotive Ethernet Physical Layer Compliance Testing Hands-On Webinar Physical Layer Compliance Testing

Join Teledyne LeCroy for this hands-on webinar where we will examine and analyze Physical Layer compliance testing of BroadR-Reach, 100Base-T1, and 1000Base-T1 Automotive Ethernet designs. Starting with Automotive Ethernet background, we then focus on the individual Physical Media Attachment (PMA) electrical tests as defined by the OPEN Alliance and IEEE standards.

Topics to be covered in this webinar:

  • Defining Automotive Ethernet PHY layer
  • Intro to Physical Media Attachment (PMA) compliance tests
  • Device Test Mode generation, test setup and fixturing
  • Details of each compliance test with live, hands-on analysis
    • Maximum Output Droop
    • Transmitter Distortion
    • Transmitter Timing Jitter, Master and Slave
    • Transmitter Power Spectral Density (PSD)
    • Transmitter Peak Differential Output
    • Transmitter Clock Frequency

Pre-work Recommended Before Hands-on Webinar

It is recommended that prior to the start of the webinar you should download and register (at no cost) MAUI Studio and download LabNotebook (waveform plus setup files) .lnb files (they will be combined into one .zip file that will need extracting).

Learn More ❯
Video The Importance of Microwave Switching When Architecting an Automated Test System Automated Test Systems, ATE, Microwave, Signal Switching

When architecting an automated test system that includes Microwave instrumentation, whether for military, aerospace, automotive or semiconductor applications, it is often advantageous to design in a signal routing or switching system. This video will explain how switching subsystems can bring great benefit to an automated test strategy, reducing overall cost and increasing the throughput of test. Switching signals at microwave frequencies offers some unique challenges that must considered to ensure reliable and repeatable test results.

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Webinar Technical Webinar: The Importance of Signal Routing to Maximize ATE Performance & Reliability ATE, Cables

This Webinar presents the various challenges that ATE system engineers face when architecting a cabling and interface system. It also discusses the impact that design decisions have on the overall performance of the test system.

Making the Connection in an ATE System

A few of the takeaways are:

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Application Note Sealed Enclosure Coolers: Effective Thermal Solutions for Harsh Environments Sealed Enclosures, Thermal Solutions, Harsh Environments

All electronics dissipate waste heat. In typical high-power electronics cabinets this waste heat can become significant, in the range of 100’s to 1,000’s of Watts. At these levels dissipating the waste heat becomes a critical design issue. Most cabinets that operate in controlled indoor environments use fan filter systems, which duct ambient air through the cabinet, because they are the most eective and ecient way of dissipating the waste heat load. This is also feasible for some outdoor applications assuming rain guards and filters are used.

However, in many applications such as dirty / dusty environments, hose down / wash down facilities in the food industry, harsh outdoor applications, and many others it is not possible or advisable to allow ambient air to flow through and cool the sensitive and expensive components inside your enclosure. The best way to protect electronics is to use a sealed cabinet that does not allow any contaminated ambient air, even filtered air, from entering the cabinet. This is where sealed air-to-air heat exchangers, or sealed enclosure coolers, become an invaluable part of the overall system.

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Webinar Debug Embedded Systems with Your Oscilloscope - Part One: Signal Display and Measurement Fundamentals Analytical waveform views, Measurement Parameters, Parameter Testing

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Signal Display and Measurements

In this session (Part 1), we will discuss the various signal display and measurement tools available in oscilloscopes and how to avoid the traps and pitfalls that lead to inaccurate or inefficient measurements. We will also review how to extract circuit details from both short and long record acquisitions to aid in debugging of embedded designs.

Topics to be included:

  • Improving measurements with multi-grids
  • Analytical waveform views
  • Using measurement parameters effectively
  • Best uses of statistical data and views
  • Pass/Fail parameter testing

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

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Webinar Debug Embedded Systems with Your Oscilloscope - Part Two: Advanced Measurements and Math Fundamentals Measurement Values, Waveform Math Tools, Measurement Parameters, Serial Data Triggering

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

Fundamentals of Advanced Measurements and Math

In this session (Part 2), we will develop skills for acquiring and performing measurements, waveform math, and analysis that isolate and help us locate amplitude and timing errors within an embedded design.

Topics to be included:

  • Plotting measurement values over time
  • Waveform math tools
  • Measurement parameter Tracks and Trends
  • Serial data triggering and decode
  • Mixed signal digital capture and integration

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

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Video Operating Pickering Switching & Simulation Modules using LabVIEW™ Switching, Simulation, Software

This video demonstrates how to operate Pickering Switch & Simulation modules in National Instruments' LabVIEW™ System Design Software. 

Our software drivers are capable of supporting all of our 1,000+ switching and simulation products in PXI, LXI and PCI formats and include a LabVIEW wrapper to permit full operation of the Pickering products from the LabVIEW environment. These wrappers are normally installed to the current LabVIEW folder system during installation of the Pickering driver.

Our software drivers are supported under all major Windows platforms in both 32 and 64 bit, and we also provide support for major Linux and MAC distributions. Our Universal Linux driver is a kernel-less interface that enables you to operate our products with all current mainstream Linux releases. All of our switching and simulation products are provided with an IVI Class compliant specific driver. This driver provides complete hardware interchangeability and supports the full functionality of our products. 

We provide open software development interfaces allowing the freedom to create different test scenarios using a wide range of development environments such as C, C++, VB, LabVIEW, LabWindows/CVI, .NET, MATLAB, Python, TestStand™, Veristand™ and Switch Executive™. Most other environments can be supported on request. LabVIEW-RT and Veristand drivers are available for Real-Time applications. We also provide comprehensive documentation with our drivers and a number of example programs to help you develop test routines with ease. 

Take a look at all of our software capabilities here >>

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Webinar How to Become an Expert in Automotive Ethernet Testing - Part 2: Mastering MDI Return Loss and Mode Conversion Loss Test Automotive Ethernet

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Mastering MDI Return Loss and Mode Conversion Loss Test

In this session (Part 2), we will focus on the reflection measurements MDI return loss and MDI mode conversion loss. We will review the basic concepts of the S-parameters and their meaning in single ended and mixed-mode form with particular reference to the single balanced twisted pair. We’ll follow with a measurement demonstration.

Topics to be covered in this webinar:

  • Automotive Ethernet and single-balanced unshielded twisted pair
  • Mixed-mode S-parameter overview
  • Why to measure common-to-differential mode conversion?
  • Testing the fixture for mode conversion loss margin compared to the MDI requirement
  • Introduction to MDI S-parameter testing

Who should attend? All HW engineers developing and testing Automotive Ethernet accordingly to the 100Base-T1 and 1000Base-T1 standards with particular reference to MDI S-parameters.

What attendees will learn? Background knowledge for MDI S-parameter Automotive Ethernet measurement and what to expect when testing it.

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White Paper Teledyne LeCroy Using a Digital Oscilloscope for Signal Analysis Including A Practical Example of PLL Characterization Oscilloscopes, Signal Analysis

The oscilloscope has been a primary tool for electronic design engineers since the invention of that instrument, many years ago. The first decades of oscilloscopes were “analog” in nature.

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Webinar EMC / ESD Pulse Measurements Using Oscilloscopes Webinar Oscilloscopes, EMC Testing

The digital oscilloscope has become the most commonly used test tool on the EMC engineer’s bench, but most engineers use only a fraction of the power available in these instruments. In addition, there are several overlooked aspect s which can significantly impact signal integrity and EMC measurement results.

Join us for this webinar as we uncover oscilloscope tools that can assist with advanced and more accurate methods for performing EMC testing.

Measurements included in our discussion will be:

  • EMC Measurement Categories and Requirements
  • Conducted Immunity Testing Requirements and Pulse Measurement Definitions
  • ESD Threshold Selection
  • Level-After-Pulse, Time-To-Value, and Parameter Limiters
  • ESD Verification and Test Setup
  • ISO10605:2008 Consecutive Parameter Trending
  • Sample Rate and Dynamic Range Impact on ESD Pulse Measurements
  • Much more!

Presenter: Mike Hertz, Teledyne LeCroy Sr. Field Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Video How to Sustain your Automated Test System Automated Test Systems, ATE, Signal Switching

When a relay fails, the test system becomes unreliable leading to a suspension of production. Getting it back up and running becomes the main priority. The first step is to accurately diagnose the fault.

Signal switching is mechanical in most test systems, and as such, is the most likely component of a test system to fail due to normal wear and tear or damage due to the switch specs being exceeded, either accidentally during debug or while testing a faulty DUT.

When a failure occurs, production output can be adversely impacted, and getting a test system quickly back up and running becomes the main priority of the operations team. Costly and time-consuming diagnosis and repair cycles cannot be tolerated.

Fortunately, some methods can be implemented that can shave weeks off typical turn-around times, and even predict failures in advance to allow for better maintenance planning. This video will teach you how to optimize your test system's productivity while minimizing costly downtime.

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Webinar Mastering the TDR in 45 Minutes TDR (Time Domain Reflectometry)

The workhorse instrument used to characterize all PCB traces is the Time Domain Reflectometer (TDR). But its measurements are often mis-interpreted because the impedance properties of transmission lines are confusing.

Join Eric Bogatin and Teledyne LeCroy for this webinar that will show you the right way to think about signals on transmission lines and how to interpret TDR results. Using live measurements, we’ll look at some cool examples of the properties of real circuit board traces.

Topics to be covered in this webinar:

  • What is characteristic and instantaneous impedance?
  • How a TDR measures instantaneous impedance
  • How to read the characteristic impedance off the front screen of a TDR
  • How to interpret discontinuities
  • The limitations to a single channel TDR

Who should attend? Any engineer who uses a TDR or uses TDR measurements.

What attendees will learn? How to get the most value from TDR measurements to analyze your interconnects.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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White Paper Technologies for Very High Bandwidth Real-time Oscilloscopes Oscilloscopes

Technologies and design considerations are presented for the design of very high bandwidth oscilloscopes. These include chip, DSP and microwave technologies employed in some of the fastest waveform digitizers in the world.

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Video WTViewerE: Making Power Measurements Easier Power Measurements

Do you need to log your power measurement directly to a PC? WTViewerE can connect to a variety of Yokogawa power analyzers to configure the settings, take and view measurements, and log data to a CSV file with ease. In this video, application engineer Kourtney Morrison goes through six easy steps to get you started using WTViewerE.

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Video Introduction to Programmable Resistors for Sensor Simulation in Automated Test Systems Programmable Resistors, Sensors, Sensor Simulation, Automated Test Systems, PCI, PXI

Learn about our PXI & PCI Programmable Resistor modules for Sensor Simulation. These modules can be used in many applications to simulate, for instance, resistive sensors such as those used for temperature, strain, light, force and level measurement. The resistors enable you to build cost reductions into your test system design without having to physically simulate the environment of the sensor. 

Advantages of these Programmable Resistors include:

  • They replace the need for real sensors
  • No need to physically simulate sensors environment
  • Allow you to reuse between test applications and give you accuracy, speed, and repeatability. 

An additional advantage - the physical complexity of the test set-up can be simplified because you are potentially reducing the amount of cabling and discrete components required and the simulation is confined to test rack space.

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White Paper Enhanced Sample Rate Mode Measurement Precision Sampe Rates, Oscilloscopes

Enhanced Sample Rate, combined with the low-noise system architecture and the tailored brick-wall frequency response in the HDO4000A, HDO6000A, HDO8000A and MDA800A series oscilloscopes dramatically improves the measurement precision when the input frequency signals are very high frequency, such as a high-frequency sine wave or fast edge.

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Video Plotting SENT data with the DL850EV ScopeCorder Data Acquisition

How can you compare SENT data to analog data? The Yokogawa DL850EV ScopeCorder data acquisition system makes it easy by plotting decoded SENT data channels simultaneously with the corresponding analog sensors and signals, creating a one-box solution to this essential design validation and debugging task. In this video Application Engineer Coty Harrison demonstrates these unique capabilities step-by-step.

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White Paper How to test BroadR-Reach? Automotive Ethernet Solutions Quality Assurance Testing

Companies manufacturing all sorts of products use Quality assurance (QA) to prevent errors and mistakes in their products and ensure flawless product deliveries to their customers. This willimprovecustomer satisfaction and reducethe need for after-salestroubleshooting and support.

QA give companies get a systematic process to find outif their products meet what is required. QA defines requirements for developing and manufacturing reliable products.A driving force behind QA is the ISO(International Organization for Standardization). ISOhas developed the ISO 9000international standard, on which many companies base their QA system.

QA testing is done during and after development andprovidesinformationtodevelopers if changes or improvements are required.During product development the development team will do thorough testing of the product, covering e.g. functional and stress testing of the basic functionality of the product. QA testing of physical products normally includes stress testing of a number of environmental conditions.QA tests that may be conducted include:

  • EMC Tests •Mechanical Tests
  • Thermal/Humidity Tests
  • Hi-Pot Tests
  • Sand and Dust Tests
  • Salt Spray Tests

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Video DL850EV ScopeCorder-an introduction Oscilloscopes, Mixed Signals, Data Acquisition

This video will introduce the values and key features of Yokogawa’s DL850EV ScopeCorder. DL850EV combines a mixed-signal oscilloscope and portable data acquisition recorder into a single platform which can capture both high-speed transient events, and long-run trends.

DL850EV is widely used in the industries of automotive, power electric and mechatronics, etc.

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Webinar 4 Practical Real-world Examples of Embedded System Validation and Debug Power Rails, Oscilloscopes

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

4 Practical Real-world Examples of Embedded System Validation and Debug

In this session (Part 3), we apply the display, measurement and waveform math tools covered in Part 1 and 2 to specific embedded design application examples.

Topics to be included:

  • Power rail integrity measurements and probing power rails
  • Power rail sequence measurements
  • Low-speed event correlation to high-speed event
  • Correlating sensor signals with embedded serial data

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

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Video Phase Stability against Temperature Changes Cables, Phase Stability, Temperature Changes, Microwave, mmWave

Cable reliability, especially phase stability against Temperature change, is of critical importance in microwave and mmWave measuring. Junkosha has developed cables with excellent phase stability against temperature change through innovative materials and processing technology.

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Video Teledyne LeCroy MAUI Studio – Installation

In this video, we walk you through the installation process of the Teledyne LeCroy MAUI Studio oscilloscope software. For additional information visit, teledynelecroy.com/mauistudio.

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Video ICE-Lok™ : Thermally Enhanced Wedgelocks for Embedded Computing Embedded Computing, Thermal Solutions

Embedded computing systems are rapidly increasing in power densities, making thermal solutions a major design concern. In most cases, designers prefer a predominantly conduction cooled approach, which provides the highest reliability.

ACT’s Isothermal Card Edge, or ICE-Lok™ wedgelocks, are designed to enhance card-to-chassis conduction by enhancing the heat flow through the wedgelocks by making additional contact between the card and the chassis. Learn more about ICE-Lok™ and see how it is utilized to improve thermal efficiency in embedded computing systems. ICE-Lok™ is a patented product. Copyright ACT 2018. All rights reserved.

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Video Teledyne LeCroy MAUI Studio – LabNotebook

In this video, we show how to use LabNotebook with the Teledyne LeCroy MAUI Studio oscilloscope software. With LabNotebook, you can save your signals, setups and screenshots to share with a colleague or add to a report. For additional information visit, teledynelecroy.com/mauistudio.

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Video Most efficient validation of power sequences Power Rails, Oscilloscopes

For the most efficient validation, get the most analog channels and longest memory to capture your entire power sequence.

  1. Start with WaveRunner 8000HD’s 8 analog channels, 16 with our OscilloSYNC™ option.
  2. Add MSO capability for 16 digital lines, no sacrifice of analog channels.
  3. Use 5 Gpts memory to capture the entire power on/off sequence.
  4. Use automated measurements with Pass/Fail testing to validate timing over multiple acquisitions.

Watch the video to see how.

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White Paper Plotting the performance landscape for 5G RAN Packet Networks 5G RANs, Performance testing

5G deployments are now underway across the globe but are merely the first steps in a multi-year journey for the mobile industry. Many practical challenges still remain, not least of which is the challenge of cost-effectively deploying 5G Radio Access Networks (RANs) at scale and assuring the performance of supported 5G services.

The 5G RAN architecture provides an open, virtual, packet-based network that extendsfrom the core to the radio antenna. The virtual architecture of 5G RAN with network slicing and new functional elements, such as the Central Unit (CU) and Distributed Unit (DU), enables multiple demanding services to share the same infrastructure without compromising on their specific performance requirements. Virtual, packet-based RANs also enable network sharing over open interfaces as well as multi-vendor implementations, both of which are important to the 5G business case.

Hardware appliances, such as the Remote Radio Head and Baseband Unit of 4G LTE are now replaced with virtual software running on whitebox or Commercial Off-The-Shelf (COTS) hardware. In 5G, the Baseband Unit is split into two new functions, namely the CU and DU. Both these functions can be located either close to the 5G core or close to the Radio Unit (RU) to meet latency and backhaul requirements. This leads to a much more dynamic fronthaul, midhaul and backhaul network, which is now collectively referred to as the 5G cross-haul or “X-haul” network.

It also means that the traditional aggregation architecture where higher capacity is required closer to the core is no longer the norm. As cloud computing and other real-time services move closer to the edge of the network, more traffic is likely to remain close to the subscriber requiring higher capacity X-haul networks with 10G, 25G and even 100G Ethernet connectivity.

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Webinar Probing in Power Electronics Webinar What to Use and Why: Part Two Oscilloscope probes

Power electronics designs have inherent measurement challenges. This has led to development of many specialized high and low voltage single-ended and differential probes to meet the specific needs of this market. However, proper probe selection and use is critical for operator, equipment and DUT safety and also has a large influence on the accuracy of the measurement.

Join Teledyne LeCroy for this two-part webinar series as we provide tips to overcome these questions.

In Part 1 we review the different HV rated probe specifications and topologies and explain what measurement each probe topology is ideally suited for. Register here

In Part 2 we provide real-word examples and comparisons between a variety of different probes and amplifiers.

Presenter: Ken Johnson, Director of Marketing, Product Architect Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Video LS3300 AC Power Calibrator Accuracy Verification Test of WT310(E) Calibrations

Nathan Bryngelson will be demonstrating how to perform a calibration test on the Yokogawa WT300 and 300 E series using the Yokogawa LS3300 AC Power Calibrator.

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Webinar Don’t Let Ground Bounce Ruin your Day Webinar Ground bounce

Ground bounce is a common problem in packages, connectors and circuit boards. And it gets worse with shorter rise times. This insidious problem can cause enough cross talk to break almost any product.

In this webinar, we will look at the principles behind the root cause of ground bounce, how we can measure the ground bounce in your system, and based on the root cause, how we can design ground bounce out of your next product.

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelis, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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White Paper Medical Device Cooling Considerations for Your Next Design Project Medical Devices, Cooling Solutions

The term “Medical Device” covers an expansive range of applications ranging from large MRI machines to hand-held surgical devices and diagnostic tools. These pieces of hardware can be orders of magnitude different in size and power output, so it stands to reason that there is no ‘one size fits all’ cooling solution that is suitable for all medical devices. Learn more about thermal considerations for your next design build or your design iteration of an existing program.

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White Paper Configurable Protocol Decoding of Manchester And NRZ-Encoded Signals NRZ-encoded Signals, Manchester-encoded Signals

The industry's first NRZ and Manchester configurable protocol decoders accept a broad range of physical characteristics for NRZ- or Manchester-encoded signals.

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Webinar Overview of DisplayPort 2.0 Physical Layer and Link Layer Protocols Webinar Link Layer Protocols, DisplayPort 2.0 Physical Layers

Join Teledyne LeCroy for this free webinar for an overview of the DisplayPort 2.0 Physical Layer and Link Layer protocols

The physical layer (PHY) segment of this webinar will cover best known methods for early DP 2.0 PHY Source and Sink testing. While the PHY Compliance Test Specification (CTS) is still under development, PHY testing is largely based on the USB4 and Thunderbolt test methodologies. The PHY segment will ‘connect the dots’ between these test specifications and give guidance on early DisplayPort 2.0 PHY testing.

The Link Layer protocol segment will cover the new protocol elements introduced in the DisplayPort 2.0 specification and how they are structured and represented in a protocol analyzer test instrument.

Presenters:
Mike Engbretson, Teledyne LeCroy Product Manager High Speed Oscilloscopes
Neal Kendall, Teledyne LeCroy QuantumData Video Analyzer Marketing Manager

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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Video Automated Fault Insertion (also known as Fault Injection) and its Role in Hardware-in-the-Loop (HIL) Simulation

Electronic control units (ECUs) are used in a wide range of electronic products. During their development, they are typically exercised by a test system which simulates the real-world environment in which the ECU will operate – this is known as Hardware-in-the-Loop HIL simulation. An ECU usually relies on information from many connected sensors to determine how it should function. These sensors are often working in hostile environments, such as a car engine bay, and failures often occur due to corrosion, aging, damage or even faulty installation. Safety-critical controllers usually go through a certification process where a series of common real-life faults, such as short and open circuits, are introduced by the HIL simulation system and the ECU response is checked to see that it operates in a safe and predictable manner. Automated Fault Insertion solutions allow these verification tests to be run in a controlled and repeatable way. In this video, we will highlight the types of faults that can be injected and look at some of the COTS hardware available.

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Video Cable Flexibility Cables

Cable flexibility is important for stable measurement and wiring efficiency between the measuring equipment and device under test. Junkosha provides flexible and low resilience coaxial cables which improve workability with complex wiring and reduces the risk of damage to the instruments and DUT.

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White Paper Teledyne LeCroy Mode-Equalized Raman Gain Experiment using LabMaster Oscilloscopes

We experimentally demonstrate 8 dB of mode-equalized distributed Raman gain using a backward pumping scheme. The equivalent noise figure of the amplifier is -1.5 dB, and the amplifier was successfully employed to demonstrate 6-channel mode-multiplexed MIMO transmission over 137-km few-mode fiber.

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Video Yokogawa DLM3000 with built-in Analysis

The Yokogawa DLM3000 oscilloscope features a brand-new computing platform designed to provide more than raw data. Built-in measurements and an optional Power Supply Analysis package combine with the deep memory and innovative history features to provide engineering insights.

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Webinar Beyond the TDR - Differential and Common Impedance, Crosstalk and Mode Conversion TDR (Time Domain Reflectometry), Impedance

A Time Domain Reflectometer (TDR) displays the instantaneous single-ended or differential impedance profiles of an interconnect and the location of discontinuities. While this is valuable information, there is additional information we can extract by expanding to multiple ports and looking at not just the differential impedance, but also the common impedance and even the location of crosstalk and mode conversion.

Join Eric Bogatin and Teledyne LeCroy as we introduce the value of looking at multi-port and mixed-mode TDR and impedance measurements, the best measurement practices and how to analyze the results.

Topics to be covered in this webinar:

  • Converting frequency domain into the time domain
  • Impedance profiles and interconnect structures
  • Measuring near- and far-end crosstalk
  • Identifying the location of crosstalk
  • Features that can cause mode conversion
  • Three important consistency tests to always consider

Who should attend? Engineers who need to characterize the electrical properties of interconnects, or currently use TDR measurements.

What attendees will learn? How to use TDR measurements to interpret interconnect electrical features.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

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Webinar Using TDR Technology to Debug and Solve Signal Integrity Impairments TDR (Time Domain Reflectometry)

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

Using TDR Technology to Debug and Solve Signal Integrity Impairments Join Teledyne LeCroy to learn how to measure and analyze impedance on cables, connectors and PCBs using TDR (Time Domain Reflectometry) instruments.

Topics to be included:

  • TDR Basics
  • Rise Time of the TDR-Pulse vs Resolution
  • Why we use filtered impedance curves
  • How to convert the impedance plot into distance
  • What additional information provides the frequency range?
  • How to probe PCBs using TDR probes

Who should attend? Engineers dealing with high-speed data signals who want to identify and evaluate the effect of impedance changes in cables, connectors and printed circuit boards.

What attendees will learn? To learn how to measure and analyze impedance on cables, connectors and PCBs using TDR.

Presenter: Thomas Stueber, Group Leader Applications, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Video Phase Stability for Digital Transmission Phase Stability, Digital Transmission, Cables

When measuring the performance of the DUT, if the shift of the data transmission timing – also known as skew – occurs between multiple cable connections, the performance of the DUT cannot be accurately determined. Junkosha has developed a stable transmission rate cable against bending.

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Webinar Technical Webinar: Maximizing Reliability in Signal Switching Signal Switching

Gain insights into the importance of switching in test systems and what items need careful consideration. These include which type of relay is most suitable, how to choose the right relay, avoiding relay failures and design issues.

Join Pickering's technical experts for this live webinar as we discuss key trends, challenges and considerations for your test system switching.

Why you should join us:

  • Learn important guidelines that will make your switching more reliable
  • Understand the difference between Electro-Mechanical Relays (EMRs), Solid-State Relays and Reed Relays
  • How to choose the right relay based on your application and specifications
  • How to avoid common relay failures and issues

Date: August 26, 2020

Time:

  • 8:00 AM PDT
  • 11:00 AM EDT
  • 4:00 PM BST
  • 5:00 PM CEST

If you can't make the live event, please register and we will send you the recording. For additional information, please feel free to contact us.

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Article A Simple Demonstration of Where Return Current Flows Current Flows, Current probes, 3D Field Solver, Impedance, Return path

For ten years, I’ve had the honor of presenting a tutorial session at the IEEE EMC Symposium. I’m usually positioned right after Bruce Archambeault. This means I get to listen to Bruce talk about inductance. While I think of myself as a bit of an expert on inductance, I always learn something new when I listen to Bruce.

One example he shows, using a simulation of where current flows, will completely recalibrate your intuition if you have never thought about this question. This example stuck with me for more than a dozen years since I originally saw it. Recently, I had a chance to play with the Teledyne LeCroy CP031A current probe used with our scopes and I realized this classic simulation example could be demonstrated with a simple measurement.

Simulating Where Return Current Flows

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Webinar Secrets to Efficiently Sustaining Your Automated Test System Automated Test Systems, ATE

When designing a test system, it is important to plan for problems. The reason is simple, if a test system goes down, your product line loses revenue. This webinar discusses how a well-designed test system – and strategy – can get a system up and running quickly when a problem occurs and reviews tactics to consider for minimal downtime and a sustainable, expandable test system.

In this webinar, we reveal the secrets to efficiently sustaining your automated test systems. 

A few of the takeaways are:

  • Selecting vendors that pledge to minimize obsolescence worries
  • Implementing accurate diagnostics to find test system faults quickly
  • Developing a plan to minimize long repair cycles when something goes wrong
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Video Put a Current Probe on Every Channel Current probes

Teledyne LeCroy current probes are supported on every channel of every oscilloscope we make for the widest view of all your signals.

  • 30 - 500 A input with high sensitivity for precise low-current measurements
  • Powered from the oscilloscope, no external power supply required
  • Like using your 3rd-party probe/sensor? Use the CA10 to adapt it to Teledyne LeCroy oscilloscopes

Teledyne LeCroy - Video Library

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Webinar Oscilloscope Coffee Break Series - Part 3: Getting Your Trigger to Do What You Want Oscilloscopes, Oscilloscope Triggers

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

It’s circuit debug time! Let’s use the oscilloscope’s triggering features to define where we start our investigation to find the troublesome circuit issue.

Topics to be included:

  • Trigger Modes – why is my scope display blank?
  • Trigger selections – lots of choices to define when we capture data
  • Trigger coupling, filters and pre-triggering
  • Update rates – maximizing the amount of data captured

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Webinar How to De-embed Interconnect Elements in Both Frequency and Time Domains Vector Network Analyzers (VNA), S-Parameters, Time Domains

Join Teledyne LeCroy as we describe and demonstrate best practices for de-embedding test fixtures, cables, and probes from serial data link and other signal integrity measurements. This is a critically important process to ensure that the signal integrity measurements for the DUT are not contaminated by the interconnection elements.

Topics to be covered in this webinar:

  • Why de-embedding is almost always necessary
  • Best practices for reference-plane calibration
  • Traditional Frequency-domain de-embedding
  • Time-domain gating and peeling (i.e. fixture removal, in-situ de-embedding (ISD))
  • Causality conditions

Who should attend? Hardware engineers who use a Vector Network Analyzer (VNA) to obtain S-parameters for use in emulation software.

What attendees will learn? How to accurately measure S-parameters of high-speed interconnects.

Presenter: Giuseppe Leccia, Business Development Manager

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Webinar Probing in Power Electronics Webinar What to Use and Why: Part One Oscilloscope probes

Power electronics designs have inherent measurement challenges. This has led to development of many specialized high and low voltage single-ended and differential probes to meet the specific needs of this market. However, proper probe selection and use is critical for operator, equipment and DUT safety and also has a large influence on the accuracy of the measurement.

Join Teledyne LeCroy for this two-part webinar series as we provide tips to overcome these questions.

In Part 1 we will review the different HV rated probe specifications and topologies and explain what measurement each probe topology is ideally suited for.

In Part 2 we provide real-word examples and comparisons between a variety of different probes and amplifiers. Register here

Presenter: Ken Johnson, Director of Marketing, Product Architect Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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Video Case Study Spotlight: Flexible Vision System a Perfect Fit for Machines in Flexographic Industry Vision Solutions

Delivering consistently accurate results is integral for the flexographic industry. When a customer in this industry sought to update their analog inspection system, they sought the expertise of ClearView Imaging and Matrox® Imaging to provide an automated vision-system-driven mounting machine. Comprising a Matrox Imaging vision controller and software, this customized system is able to locate precise targets on flexographic plates, using advanced illumination techniques and software tools to address noise, locate shapes, and matching patterns.

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White Paper Teledyne LeCroy DesignCon 2012 - The Relationship Between Discrete-Frequency S-parameters and Continuous-Frequency Responses S-Parameters, Continuous Frequency Responses

We explore in detail the relationship between discrete-frequency responses connected with sparameters and the implied continuous time response. This is done in both the frequency- and time-domain to develop the proper insight and explore issues with real time-domain responses, time-aliasing, causality, interpolation and re-sampling of discrete-frequency data. Using the insight gained, we identify the conditions for sufficiency of sampling and the side-effects of the invariable practical conditions when these side-effects cannot be completely dispelled. This paper is especially useful for understanding issues involved in direct application of sparameters in linear simulations, like those used in virtual probing applications in scopes.

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Video WT5000 Precision Power Analyzer- An Introduction Power analyzers, Power Measurements

The WT5000 is a versatile platform that delivers extraordinary precision and exceptional performance for the most demanding applications.

Find out the key features and benefits of the WT5000 Precision Power Analyzer in this video.

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White Paper Teledyne LeCroy All-ETDM 80-Gbaud (160-Gb/s) QPSK Generation and Coherent Detection Oscilloscopes

A single-polarization 160-Gb/s (80-Gbaud) electronically time-division-multiplexed (ETDM) quadrature phase-shift-keyed (QPSK) signal is generated and coherently detected using two 45-GHz-bandwidth oscilloscope prototypes and offline processing.

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Webinar Technical Webinar: Choosing the Right Platform for Switching: PXI, USB or LXI PXI, USB, LXI, Signal Switching

When designing a functional electronic test system, how signal switching is implemented in your test strategy can affect accuracy and repeatability. In this webinar we give an overview of the three most popular platforms used for switching today, explain the advantages of each of the various switching applications, and provide some basic questions to ask as you integrate any electronic test system.

Deciding on Platform Architecture

A few of the takeaways are:

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Webinar The Impact of Power Rail Noise on Clock Jitter Power Rails, Clock Jitter

Noise on the power rail may not only create bit errors due to voltage spikes, but it may also increase clock jitter. Clock jitter is an insidious source of noise difficult to debug.

In this webinar, we demonstrate how to measure the jitter in both clocks and data and identify the contribution from noise on the power rail. These techniques can be applied to any system in which minimizing clock and data jitter is important.

Topics to be covered in this webinar:

  • Using time interval error (TIE) to measure jitter
  • The statistics and spectrum of TIE as a way of characterizing jitter
  • Typical jitter in various types of oscillator circuits
  • Best practices to measure power rail noise
  • The impact power noise can have on clock jitter
  • Examples of clocked systems with high and low jitter sensitivity to power rail noise

Who should attend? Hardware and circuit engineers who design interconnects and clocked circuits.

What attendees will learn? This webinar will introduce you to how to measure jitter and power rail noise, and how to reduce the sensitivity of your clocks to power rail noise.

Presenter: Dr. Eric Bogatin, Teledyne LeCroy Fellow

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Video WT5000 Precision Power Analyzer - Reliable, Versatile and Simple Power analyzers

The WT5000, the Next Generation in Precision of Yokogawa’s Power Analyzers product line. A versatile platform that delivers extraordinary precision and exceptional performance for the most demanding applications.

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Webinar Pre-Compliance EMC Testing with Real-time Spectral Analysis EMC Testing, Spectral Analysis

Even though the real world is the time domain, we can sometime get to an answer faster by going through the frequency domain. The signature of a noise source often reveals itself more clearly in the frequency domain as the spectrum of the signal than in the time domain.

In Part 2 of our two-part webinar series, we introduce how to transform a signal in the time domain to the real time spectrum in the frequency domain. Then we will demonstrate how to use spectral signatures to sniff out near field sources which can contribute to potential EMI failures.

Missed Part 1 on Time Domain Analysis? Click here to register

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelist, Teledyne LeCroy

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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Video How to Log 16 Channels of Temperature Data with DL350 Data Acquisition
Want an easy way to record multiple channels for seconds, hours, or weeks? The Yokogawa DL350 offers the easiest user experience for long term data logging. In this video see a demonstration logging 16 channels of thermocouple data directly to the installed SD card on the portable DL350 ScopeCorder.
 
Featured Hardware Links:
 
 
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Webinar Technical Webinar: Simplifying Test Interconnect with Pickering's Cable Design Tool Cables, Automated Test Systems, Insertion Loss

The cable design for a automated test system is critical for repeatability and accuracy, it needs care and expertise. Depending on the application, a test engineer needs to consider test specifications, including voltage, current, temperature, insertion losses, and more. Unless the test engineer is an expert on cabling, researching wires and connectors can be a daunting task.

There are times when a standard cable assembly is not suitable, and there is a need for custom connectors and wire types or specific harness wiring. Our free online Cable Design Tool (CDT) is a simple and efficient way of creating these custom cabling solutions.

Simplifying Test Interconnect with Pickering's Cable Design Tool

In this training, we demonstrate the tools abilities and features which include:

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Webinar Free Webinar: AC Load Testing Fundamentals AC Loads

This webinar will review the fundamentals of ac loading for testing applications across residential, commercial, electric vehicles, aerospace, and military markets. We’ll dive into key features and functions of both traditional and modern ac loading conditions and their many applications across these industries. The ability for ac loads to emulate complex load profiles to include harmonics and sub-cycle transients is important for testing the device and/or the grid to meet modern day requirements.

Learn about the most effective test approaches and test solutions to ensure accuracy, product performance, safety, and reduced time to market. Example applications include testing the grid, inverters, lock rotor current, EVSE, avionics, UPS, switch and fuses, and more.

Key Technical Concepts:

  • Regenerative power
  • AC load 4 quadrant operation
  • True power factor shift
  • Linear, non-linear, inductive and capacitive loading
  • Testing in various emulation modes: CC, CR, CP, SC
  • How to create complex load profiles
  • Harmonics and sub-cycle transients

Click here to register!

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Video Chamber Solutions from AR Test Chambers

Test chambers that never compromise on performance, safety, or environmental responsibility

Not all chambers offer the same performance or quality. All reverberation, fully and semi-anechoic chambers provided by AR RF/Microwave Instrumentation, offer customers the highest level of performance, quality, and support. One unique advantage is the pan shield design, which allows for premium performance and seamless construction over older designs techniques, such as wood core shielded chambers. The pan-type shield's baseline performance is far more reliable and exceeds 100 dBA level of attenuation up to 40 GHz without any modifications or add-ons. This performance provides an excellent testing environment for your testing needs.

Click here to view video.

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Video Migrating Your Automatic Test Equipment from VXI to PXI Automated Test Systems, ATE, VXI, PXI

This video discusses upgrading an automatic electronic functional test process from legacy Automatic Test Equipment (ATE) to the latest industry-standard platform. VXI was one of the first successes in modular test platforms and has served industries such as Aerospace and Defense for over 30 years. However, many test and measurement companies are now no longer supporting the standard. While the wide availability of PXI switching modules makes the choice of migrating VXI switching hardware relatively easy, there are also potential issues to consider which we discuss in the video along with the advantages of making a move from VXI to PXI.

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Webinar Technical Webinar: Accelerate Software Development of Your Automated Test System Automated Test Systems, ATE

Much like driving from one point to another in a big city, routing an electrical signal between a test instrument and a device under test can require navigating a complex network of interconnected relays, wiring and interfaces. Instead of right and left turns, the ATE software engineer must determine the correct position setting of multiple relays to establish the desired route. 

In this training, you'll learn how Switch Path Manager (SPM) signal routing software accelerates the software development effort of Automated Test Systems, considerably reducing the number of lines of code required to route test instrumentation to the device to be tested.

Accelerate Software Development of Your Automated Test Systems

SPM signal routing software is an interactive utility that essentially maps a wiring and interconnect schematic into a configuration file that can be used to simplify code development. Features include:

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Webinar How to Measure Power During Volt-second and Other Short Power Periods Oscilloscopes, Short power periods

3-Phase Power and Motors Masters Webinar Series

Join Teledyne LeCroy for this Learning Lab series on measuring high-power, three-phase and motor inverter and drive systems with an 8-channel high-resolution oscilloscope or motor drive analyzer. Learn about static and dynamic measurements, from AC line to inverter switching, and line outputs to motor mechanical performance.

How to Measure Power During Volt-second and Other Short Power Periods

In this session (Part Four), we will review examples of power calculated during power periods equivalent to a device switching time. This is especially helpful for understanding instantaneous control response time, as required for deadbeat-direct torque and flux control (DB-DTFC) and other rapid response control systems.

Topics to be included:

  • Principles of defining the short power period Variable-flux electric machine analysis example DB-DTFC machine analysis example
  • Dynamic loss calculation during rapid acceleration of servo motor

Who should attend? Inverter subsection engineers, motor/drive control system engineers, and inverter/drive systems engineers who design dynamic control and power systems that operate under highly controlled conditions.

What attendees will learn? Best in class techniques for measuring and understanding performance of and interrelationships between control and power sections.

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

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Video WTViewerE: How To Analyze Your Collected Power Data Data Acquisition
WTViewerE’s analysis feature allows you to easily look back at saved data and view numeric, harmonic, trend, waveform, bar graph, and vector data at the exact time you want to see it. To learn more about WTViewerE, please refer to this video: https://www.youtube.com/watch?v=9pTN1...

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Webinar Solve your Tough Thermal Problems; Next Generation Solutions for Power Electronics Engineers Cooling Trends, Power Electronics, Thermal Management

Advanced Cooling Technologies, Inc.

Register Today!

Join our subject matter experts for a roundtable discussion on cooling trends for power electronics!

Thermal Management is a critical design point for many companies looking to push the limits of Power Electronics’ performance. In this webinar our panel will explore a roadmap of thermal solutions from low to high power applications. We will take a deep dive into several technologies that are beginning to be adopted in many applications because of their ability to push the limits of performance vs traditional air or liquid cooled systems. Whether your objective is to maintain long term, reliable operation or keep adding power to your system, join us and learn about a solution that is right for you.

Key Takeaways:

  • An understanding of thermal considerations in power electronics designs
  • An understanding of two-phase heat transfer principles
  • Practical options for thermal management including:
    • Enclosure Coolers
    • Heat pipes & HiK™ Plates
    • Loop Thermosyphons
    • Pumped Two-Phase Loops

Speakers

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Webinar Selecting a Battery Cycler or Building Your Own: Top 10 Considerations Battery Test Equipment, Battery Cyclers

Selecting battery test equipment is not as obvious as it might seem. The wrong choice will lead to major integration challenges as well as setbacks including hidden development costs, delayed test start dates, increased complexity, project risks and reduced safety.

This presentation will cover the top 10 factors to consider when deciding to buy a battery cycler, or building your own battery test system with sources and loads, or bidirectional power supplies. In this webinar, we’ll explain key considerations for testing batteries to ensure safety, product performance, flexibility, and time to market. Key topics include:

  • Fundamental differences between battery cyclers and build your own approaches
  • The hidden technical challenges in building your own test system
  • Future-proofing your test solutions
  • How to reduce time to market and improve engineering productivity 

Register Now!

If you cannot attend the live event, please register and we will send you the recording.

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Webinar How to Become an Expert in Automotive Ethernet Testing - Part 1: Fundamentals of Compliance Test, Validation and Debug Automotive Ethernet

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Fundamentals of Compliance Test, Validation and Debug

In this session (Part 1), we will focus on the fundamentals of the Automotive Ethernet ecosystem, including a brief history and evolution of the standard, an overview of benefits of the new technology and the associated design challenges. We will conclude with an introduction into the test requirements and the analysis tools available to help troubleshoot and qualify designs.

Topics to be covered in this webinar:

  • What is Automotive Ethernet
  • Different variants of Automotive Ethernet
  • Overview of OPEN Alliance
  • Introduction to testing requirements

Who should attend? Engineers and Technicians who have just begun or will be working on Automotive Ethernet. This session is an introductory course.

What attendees will learn? Background knowledge for Automotive Ethernet, who uses it, why they are using it, and what to expect when testing it.

Presenter: Robert Mart, Director of Marketing

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Video Teledyne LeCroy MAUI Studio – User Interface

In this video, we walk you through how to navigate the Teledyne LeCroy MAUI Studio oscilloscope software User Interface. For additional information visit, teledynelecroy.com/mauistudio.

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Webinar Environmental Test Chambers - Options - Why they are used Environmental Test Chambers

Weiss Technik

Weiss Technik will educate the audience on Options & Accessories within environmental test chambers. The webinar will explore and discuss what to look for and best practices for options and why they are used.

This FREE Webinar will help you learn more about:

  • Overview
  • Chamber Cabinet Options
  • Humidity Options
  • Refrigeration Options
  • Safety Options
  • Specialty Options
  • and MORE!

Click here to Register!

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Webinar PCI Express® 5.0 Compliance Test Overview Part 2: Physical Layer Testing Fixture characterization, Transmitter electrical testing, PLL bandwidth, PCIe

PCI Express® 5.0 Compliance Test Overview

Join Teledyne LeCroy for this two-part master class in PCI Express 5.0 – from electrical through Link layer and Transaction layer. PCIe 5.0 is approaching the time when initial compliance and interoperability testing can commence. Teledyne LeCroy PCIe Gen5 physical-layer and protocol test experts will focus on each test, explain the background theory, how the test procedure works, how passes and failures are determined, and how to track down and debug problems.

PCI Express 5.0 Electrical Compliance Test Overview

In this session (Part 2), we describe the new PCIe 5.0 electrical compliance test procedures – what’s new, what’s the same as past generations, and how to avoid the most common test pitfalls.

Topics to be covered in this webinar:

  • Fixture characterization
  • Transmitter electrical testing
  • Transmitter Link Equalization testing
  • Receiver Link Equalization testing
  • PLL bandwidth testing
  • What’s new in PCIe 5.0 compared to PCIe 4.0.

Who should attend? Design, validation and test engineers working on PCIe 5.0 devices.

What attendees will learn? How to be prepared for upcoming PCIe 5.0 electrical compliance test events.

Presenter: Dr. Patrick Connally, Product Marketing Manager

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White Paper 12 x 12 MIMO Transmission over 130-km Few-Mode Fiber Multiplexed Transmissions

We demonstrate 12 x 12 multiple-input multiple-output mode multiplexed transmission over 130-km of few-mode fiber of a combined 6-space-, 2-polarization-, and 8-wavelength-division multiplex, using low-loss photonic lantern and 3D-waveguide mode multiplexers.

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Webinar Debugging Automotive Ethernet Links Automotive Ethernet, Debugging

Have you ever had a device which passed compliance but did not establish a communication link between Master and Slave? Join Teledyne LeCroy for this webinar as we explore some of the different approaches for debugging Automotive Ethernet links by looking at both the physical and protocol layers.

Who should attend: Engineers and technicians who have worked on or will work on Automotive Ethernet. This session will start with the basics and build on them to cover debugging techniques.

What attendees learn: A working knowledge of how Automotive Ethernet frames compare to standard Ethernet frames, how the link startup sequence works, and how to debug Automotive Ethernet links.

Presenter: Bob Mart, Director of Product Management, Teledyne LeCroy

Register now

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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White Paper 32-bit/s/Hz Spectral Efficiency WDM Transmission over 177-km Few-Mode Fiber Digital Signal Processing

We transmit 32 WDM channels over 12 spatial and polarization modes of 177 km few-mode fiber at a record spectral efficiency of 32 bit/s/Hz. The transmitted signals are strongly coupled and recovered using 12 x 12 multiple-input multiple-output digital signal processing.

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White Paper DesignCon 2012 - Robust Method for Addressing 12 Gbps Interoperability for High-Loss and Crosstalk-Aggressed Channels Crosstalk Noise, Jitter, Channel Loss

This paper addresses a new methodology for 12 Gbps interoperability that combines a concerted family of pathological channels, internal eye monitoring, and external EQ simulation tools, providing insight into an EQ optimization strategy that addresses the specific channel’s mix of crosstalk noise, jitter, and channel loss. This also provides a backplane designer the ability to configure a high-loss, crosstalk aggressed system.

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Webinar Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals Serial Data Links

Join Teledyne LeCroy for our new three-part webinar series to learn more about how to accelerate and improve testing of PCIe® v. 4.0 and 5.0, USB4™, Thunderbolt™ 4, and DisplayPort™ 2.0 serial data links.

Nov. 19 - Part One: Identifying and Debugging PCIe Link Equalization Problems
Dec. 3 - Part Two: Simplifying Receiver Calibration and Test of 16+ Gb/s Serial Data Links
Dec. 16 - Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

Join us for Part Three: Optimizing Transmitter Test and Margin Analysis of 16+ Gb/s Signals

High-speed serial link transmitter testing can be optimized with the right tools, and valuable circuit design operating margin information can be extracted.

This webinar will provide an overview of a typical high-speed serial data transmitter test using USB4 as an example. We will synthesize a high-speed serial data signal, use a real-time oscilloscope to analyze the signal at a virtual receiver, and compare the virtually-received signal to a live signal. We will review signal integrity margin analysis and jitter, eye diagram, IsoBER contour and crosstalk eye measurements.

Who should attend?

  • Signal Integrity Engineers
  • Design and Validation Test Engineers

Presenters:
Mike Engbretson, Product Marketing Manager and John Smith, HSS Business Development Manager

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Webinar Debug Embedded Systems with Your Oscilloscope - Part Three: Real-world Examples Power Rails

Time: 11AM Pacific | 2PM Eastern

Duration: 1 hour

How to Efficiently Debug Embedded Systems with Your Oscilloscope

Join Teledyne LeCroy for this 3-part webinar series on how to efficiently and accurately debug embedded systems with your oscilloscope. The goal of this series is to improve your knowledge and efficiency in validating and troubleshooting the interactions of analog, digital, serial data, and sensor signals in embedded designs.

4 Practical Real-world Examples of Embedded System Validation and Debug

In this session (Part 3), we apply the display, measurement and waveform math tools covered in Part 1 and 2 to specific embedded design application examples.

Topics to be included:

  • Power rail integrity measurements and probing power rails
  • Power rail sequence measurements
  • Low-speed event correlation to high-speed event
  • Correlating sensor signals with embedded serial data

Who should attend? Design Engineers and Technicians looking to improve skills and efficiency in using an oscilloscope to both validate and troubleshoot the circuit performance of embedded designs.

What attendees will learn? How to use underutilized oscilloscope math and measurement tools that have broad utility in embedded system validation and debug.

Presenter: Stephen Murphy, Marketing Product Specialist / Applications Engineer

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Application Note Heat Pipe Reliability Guide Heat pipes

ADVANCED COOLING TECHNOLOGIES, INC. (ACT) HAS WORKED EXTENSIVELY ON HEAT PIPE PRODUCT RELIABILITY. This guide provides information for designing, modeling, and practical reliability surrounding copper/water heat pipes.

A heat pipe is a two phase heat transfer device with very high “effective” thermal conductivity. It is a vacuum tight device consisting of an envelope, a working fluid, and a wick structure. As shown below, the heat input vaporizes the liquid working fluid inside the wick in the evaporator section. The saturated vapor, carrying the latent heat of vaporization, flows towards the colder condenser section. In the condenser, the vapor condenses and gives up its latent heat. The condensed liquid returns to the evaporator through the wick structure by capillary action. The phase change processes and two phase flow circulation continue as long as the temperature gradient between the evaporator and condenser are maintained.

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Video Measuring Individual Phase Power on Three Phase Systems Power Measurements

How can you measure individual phase power in WYE or Delta connected three phase systems?

Using the standard Delta computation function, available on the Yokogawa WT5000 Precision Power Analyzer, you can now measure and compute individual phase powers for your three phase systems connected in either WYE or Delta configurations.

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Video How To: Yokogawa WT5000 Power Analyzer Current Connectors Power Measurements
Introducing the WT5000 Precision Power Analyzer’s new 6mm safety terminal connections. These new current connections are designed with safety and ease-of-use in mind, all while ensuring a properly sized conductor can be used for high current measurements.

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Video How to Collect Raw Waveform Data with the WT5000 Data Acquisition
The data streaming feature on the WT5000 allows you to capture raw waveform data from the WT5000, save it in a binary format, and output it to a CSV file, enhancing the efficiency of analyzing your data.
 
 
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Webinar Testing Noisy Power Supply Outputs - Oscilloscope Coffee Break Webinar Series Oscilloscopes, Oscilloscope probes

Join Teledyne LeCroy for this 30-minute Oscilloscope Coffee Break Series to remind us how to get the most test and debug capability from our oscilloscopes. Grab your refreshment and spend a few minutes with us as we focus on a specific topic each month.

We didn’t expect to have DC outputs be so noisy! Is it really the circuit that is a problem or is our scope and/or probe causing signal integrity issues? We even tried changing output capacitors to improve the performance, but why are we seeing 2X greater output noise than we expected?

In this session we review which probes are best for your application and how best to connect to your oscilloscope to minimize RF pick up.

Topics to be included:

  • Scope setups, which is best?
    • 1 MΩ or 50Ω?
    • AC or DC Coupling?
    • Bandwidth limits?
  • Probing output power
    • What is the appropriate probe to use?
    • Challenges with DC-DC low impedance sources
    • Accessories – how do we reduce probe effects on our measurements?

Presenter: Stephen Murphy, Teledyne LeCroy Applications Engineer

Can't attend live? Register anyway, and we will send you the recording and slides afterward.

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Video Crosspoint Matrix Switching for Functional Test Matrix, DUT, Signal Switching

Crosspoint matrix switches are one of the most flexible switching choices you can select for your next functional test system—essentially, a crosspoint matrix switch can connect virtually any test resource to virtually any test point on the DUT (Device Under Test). But like any selection you can make, there can be pros and cons in utilizing a crosspoint matrix: a test engineer needs to carefully weigh the specifications of the DUT to be tested in order to make the right switching choice for the test application being considered. 

In this short video, we will explain how a matrix works, different ways to configure them, what questions to ask concerning the application and more. We will also compare building a large matrix with multiple switch matrices versus selecting a totally integrated switch matrix.

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Webinar How to Become an Expert in Automotive Ethernet Testing - Part 4: Debugging PHY Layer Link Communication Learning Lab Automotive Ethernet, Oscilloscopes, PHY Layer

How to Become an Expert in Automotive Ethernet Testing

Automotive Ethernet is the becoming the serial data backbone of choice for faster data communication to enable advanced ADAS, infotainment, connected car, and autonomous vehicle technologies. Join Teledyne LeCroy for this 4-part webinar series covering automotive ethernet (BroadR-Reach, 100Base-T1, and 1000Base-T1) fundamentals through advanced testing for electrical link and PHY compliance test to advanced PHY debug.

Debugging PHY Layer Link Communication Learning Lab

In this session (Part 4), we review Automotive Ethernet link communication and explore how to debug and troubleshoot these links using an oscilloscope during an interactive session with live signals. We will look at both the physical and protocol layers during this Learning Lab webinar.

Topics to be covered in this webinar:

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White Paper Teledyne LeCroy Coherent 1200km 6x6 MIMO Experiment using LabMaster Oscilloscopes

We experimentally demonstrate transmission of 6 mode-multiplexed 20-Gbd-QPSK signals over 1200 km of three-core microstructured fiber (3C-MSF). An aggregate single-wavelength capacity of 240 Gbit/s is recovered by off-line 66 coherent multiple-input multiple-output (MIMO) digital signal processing.

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Webinar SI/PI on a Budget Webinar: Five Tricks to Get More out of your Oscilloscope Oscilloscopes

You’ve got a scope, now how do you get the most out of it without spending a lot of money?

In this free webinar from Teledyne LeCroy, Eric Bogatin will show you the right way you can do five common SI and PI measurements with a budget scope and some simple probes you probably already have around. We’ll look at some of the common artifacts to avoid so you can get meaningful measurements.

Topics covered include:

  • Probing a fast rise time signal to get its rise time
  • Measuring a power rail with a 10x probe
  • Measuring a low impedance power rail with a build it yourself power rail probe
  • Measuring the source of near field pick up
  • Using the FFT function to analyze the root cause of noise pick up

Presenter: Dr. Eric Bogatin, Signal Integrity Evangelis, Teledyne LeCroy

 

Can't attend live? Register anyway, and we will send you the recording and slides afterward. 

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Webinar thermalLIVE 2020 Thermal Engineering, Thermal Management

Advanced Cooling Technologies, Inc.

In this webinar, we will share real-world examples where creative approaches in thermal engineering have allowed design engineers to push their design concepts forward. Join us as we explore some advanced thermal management technologies, including Heat Pipes and Phase Change Material heat sinks. We will provide practical applications for each that apply to a range of markets from Spacecraft thermal control to defense and industrial applications.

Speakers

Kimberly Fikse

Kimberly Fikse, Lead Sales Engineer at Advanced Cooling Technologies, Inc.

Kimberly Fikse is the Lead Sales Engineer at ACT for over 5 years. Ms. Fikse graduated from Penn State University with a BS in Energy Engineering. After graduation she worked for BMT Syntek Technologies as an engineering consultant for NAVSEA and NRL working on power electronic and energy conversion projects. Anyone who talks to Kim knows she has a passion for thermal engineering! Her diverse background allows her to understand the challenges the customer is facing when they come face to face with a unique thermal challenge.

Click here to register!

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White Paper Accelerating Integration in Automated Test Systems Automated Test Systems, ATE

Defining an automated test system can be challenging: the goal of a test system architect is to accelerate the test system design process, ensure that the system can be easily deployed and sustained throughout the product life cycle and, of course, all while maintaining test quality.

Pickering’s unique approach to solving challenges associated with signal switching and routing implementations will be presented in this white paper. Still, many of the thought processes and guidelines can be applied to other aspects of your test system, regardless of supplier. 

In this white paper, you will also learn about the benefits of a well-defined test development process and strategies to accelerate and achieve an optimized, automated test methodology. Details include:

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Video CA700 - The New Standard in Field Calibration Calibrations, Pressure

The Yokogawa CA700 Portable Pressure Calibrator is equipped with a silicon resonant sensor that uses Yokogawa proprietary DPHARP technology. The CA700 can measure pressures with an accuracy that is within ±0.01% of rdg*, making it one of the most accurate portable pressure calibrators on the market. This highly accurate portable pressure calibrator features a variety of functions that includes a wide selection of measuring ranges, as found/as left data storage, and memory capacity to store calibration procedures. The Yokogawa CA700 provides an accurate and efficient calibration and verification tool for pressure/differential pressure transmitters and other types of field devices for commissioning or regular inspection.

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