FormFactor - Cascade WinCal - Comprehensive and intuitive on-wafer RF measurement calibration software
More than a calibration tool
- Calibration
- Validation
- Measurement
- Analysis
No one supports more VNA’s
- Support of more than 24 of the most common VNA’s
Tool for the novice
- Guided wizards and multimedia tutorials integrated
- Intelligence in setups
See "Specifications & Details" tab for more key features
WinCal, FormFactor’s RF calibration software, has been the market leader for over 30 years. The latest version, WinCal 5, brings a fresh skin and icon concept, offering a modernized user interface. The new UI and improved workflows enhance the usability of WinCal 5. Users are supported by integrated multimedia tutorials and guided wizards that seamlessly navigate them through the calibration process.
However, WinCal offers more than just RF calibration capabilities. It enables users to measure, validate, and analyze data directly within the software. This versatility sets WinCal apart as the best RF calibration tool in the market.
Regular software updates continually enhance WinCal’s performance with each release, and our FormFactor long-term support promise ensures that users can plan for the future with confidence.
WinCal 5 boasts unique features, including exclusive 1-, 2-, 3-, and 4-port calibration algorithms, instant and live data measurement and display, LRRM, LRM+, SOLT-LRRM hybrid, and NIST multi-line TRL calibrations. Error set management enables efficient data comparison and supplementation. Additionally, WinCal 5 offers support for a wide range of VNA’s, surpassing any other RF calibration software on the market.
Only with WinCal 5 is autonomous RF probing possible. As a part of FormFactor’s software solutions, WinCal 5 enables seamless unattended deployment by offering precise automatic probe-to-pad alignment across a wide temperature range. It also provides continuous calibration monitoring and recalibration, along with automatic probe cleaning. These advanced features ensure optimal performance and efficiency in RF probing.
Why should you choose WinCal?
- More than 30 years of experience
- Continuous development with our partners from the industry
- Regular software updates
- Worldwide application support
- Reliable future planning with our long-term service support
Advanced tools
- Multi-Port Hybrid Cals
- Enhanced Verification and Reports Post
- Processing and Sequencing
Full family of calibration methods
- Includes more exotic methods like 16 term SVD which incorporates cross talk
- 4 Port Hybrid cals now support more flexible approaches for using GSG iss for cross calibration
Flexible
- Standalone for manual probe stations
- Fully integrated in Velox Probe station control software
- Workspaces to build custom configurations that include selected combinations of system setup files, calibration setup files, and reports
Efficient
- Automatic download of the ISS trim map from the FormFactor website
Document
WinCalXE 4.7 and later downloads are available via our licensing portal
For WinCalXE 4.6 and older:
If your WinCal installation is working fine, and WinCal recognizes the key, there is no need to upgrade, if you have changed to a new computer and have problems please download the latest Sentinel System Driver Installer.
More Product Information
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements
Cryogenic Temperatures
- Fully isolated experiment space for true 4K temperatures during probing
- Cryogenic positioners to provide large travel ranges without warming up the device
- Integrated helium pot for high temperature stability of the device under test
- Fully dry cryogen-free cooler eliminates the need for expensive helium circulation systems
- Rapid cool liquid nitrogen option for faster cool down times
See "Specifications & Details" tab for more key features
Superior Mechanics
- Highly stable granite base
- Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
- 1 µm repeatable separation stroke
- Excellent measurement accuracy and repeatability
- Fast navigation and high-precision probe positioning
See "Specifications & Details" tab for more key features
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Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
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DC to 110 GHz models available in single and dual line versions
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Low insertion and return loss with ultra-low-loss ( -L ) versions
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Excellent crosstalk characteristics
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Wide operating temperature -65 ° C to + 200 ° C
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Wide range of pitches available, from 50 to 1250 µm
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Individually supported contacts
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Reduced contact (RC) probe tips for small pads
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BeCu tip provides rugged, repeatable contact on gold pads
- Substrate material: High-resistivity silicon
- Substrate thickness: 275 µm
- Dielectric constant: 11.8
- Nominal Z0: 50 Ω
- Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
- Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
- Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
- Durable probe structure ensures more than 250,000 contacts
- Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.
- Power bypass inductance: 8 nH
- Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
- Supports collinear and non-standard needle configurations
- Up to 16 DC for standard; maximum of 24 DC for custom
- Ideal for probing the entire circuit for functional test
- DC probes can provide power or slow logic to circuit under test
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Use with liquid nitrogen or helium, depending on the target temperature. Or use of cryo-cooler for dry-cooling option.
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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