FormFactor - Cascade WinCal - Comprehensive and intuitive on-wafer RF measurement calibration software
More than a calibration tool
- Calibration
- Validation
- Measurement
- Analysis
No one supports more VNA’s
- Support of more than 24 of the most common VNA’s
Tool for the novice
- Guided wizards and multimedia tutorials integrated
- Intelligence in setups
See "Specifications & Details" tab for more key features
WinCal, FormFactor’s RF calibration software, has been the market leader for over 30 years. The latest version, WinCal 5, brings a fresh skin and icon concept, offering a modernized user interface. The new UI and improved workflows enhance the usability of WinCal 5. Users are supported by integrated multimedia tutorials and guided wizards that seamlessly navigate them through the calibration process.
However, WinCal offers more than just RF calibration capabilities. It enables users to measure, validate, and analyze data directly within the software. This versatility sets WinCal apart as the best RF calibration tool in the market.
Regular software updates continually enhance WinCal’s performance with each release, and our FormFactor long-term support promise ensures that users can plan for the future with confidence.
WinCal 5 boasts unique features, including exclusive 1-, 2-, 3-, and 4-port calibration algorithms, instant and live data measurement and display, LRRM, LRM+, SOLT-LRRM hybrid, and NIST multi-line TRL calibrations. Error set management enables efficient data comparison and supplementation. Additionally, WinCal 5 offers support for a wide range of VNA’s, surpassing any other RF calibration software on the market.
Only with WinCal 5 is autonomous RF probing possible. As a part of FormFactor’s software solutions, WinCal 5 enables seamless unattended deployment by offering precise automatic probe-to-pad alignment across a wide temperature range. It also provides continuous calibration monitoring and recalibration, along with automatic probe cleaning. These advanced features ensure optimal performance and efficiency in RF probing.
Why should you choose WinCal?
- More than 30 years of experience
- Continuous development with our partners from the industry
- Regular software updates
- Worldwide application support
- Reliable future planning with our long-term service support
Advanced tools
- Multi-Port Hybrid Cals
- Enhanced Verification and Reports Post
- Processing and Sequencing
Full family of calibration methods
- Includes more exotic methods like 16 term SVD which incorporates cross talk
- 4 Port Hybrid cals now support more flexible approaches for using GSG iss for cross calibration
Flexible
- Standalone for manual probe stations
- Fully integrated in Velox Probe station control software
- Workspaces to build custom configurations that include selected combinations of system setup files, calibration setup files, and reports
Efficient
- Automatic download of the ISS trim map from the FormFactor website
Document
WinCalXE 4.7 and later downloads are available via our licensing portal
For WinCalXE 4.6 and older:
If your WinCal installation is working fine, and WinCal recognizes the key, there is no need to upgrade, if you have changed to a new computer and have problems please download the latest Sentinel System Driver Installer.
More Product Information
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Combination of DC and RF in a single probe module: One dual probe or a maximum of three RF; a maximum of 9 DC standard (other quantities upon request).
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Utilizes ACP tip design, GSG, GS or SG
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RF tips available from DC to 110 GHz
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Choice of BeCu or tungsten tips
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DC power needles come standard with 100 pF microwave capacitor
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Power bypass inductance: 8 nH
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Maximum DC voltage: 50 V without power bypassing (25 V with standard power bypassing, and component dependent with custom power bypassing)
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Ideal for probing the entire circuit for functional test
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Dual ACP configuration supports differential signaling applications
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DC probes can provide power or slow logic to circuit under test
- Substrate material: High-resistivity silicon
- Substrate thickness: 275 µm
- Dielectric constant: 11.8
- Nominal Z0: 50 Ω
- High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
- RF bandwidth to 500 MHz
- Long probe life: > 250,000 contacts
- Beryllium-copper tips for gold pads or tungsten for aluminum pads
- Oscillation-free testing of wide-bandwidth analog circuits
- Use with ACP series probes to provide functional at-speed testing for known-good-die
- Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
- Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
- Designed for use with specific Probe Systems
- Tables to suit all facility requirements and applications
- Stable probing, even in submicron range
- Granite platen ensures rigidity and temperature stability
- Can be combined with the Shield Enclosures
Flexibility
- DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
- Full thermal range of -60°C to +300°C
- Compatible with TopHat or IceShield
- Usage of manual and motorized positioners, probe cards within EMI-shielded environment
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
High accuracy and repeatability
- Reliable and repeatable contact
- Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
- Advanced EMI-shielding with PureLine and AttoGuard technologies available
- Superior low-leakage and low-noise measurements
- Safe and accurate hands-off testing
- Minimizes settling times for efficient measurements over full thermal range
See "Specifications & Details" tab for more key features
Three Probe Technologies
- Infinity Probe: best for Al (Si)
- ACP Probe: best for AU (III-Vs)
- |Z| Probe: robust solution (long lifetime)
- Precision contact on a wide variety of materials from 26 GHz to 67 GHz
- Accurate results with excellent crosstalk
- Matching cables and substrates included
Precise Contact Solution
- RF chuck ±3 μm surface planarity
- Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
- Precision probe alignment
- Consistent contact force and overtravel
- Stable contact performance
WinCal Calibration Software
- Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
- Automated calibration monitoring
- Unique measurement & analysis methods
- Accurate S-parameter measurements
- Automatic calibration setup for higher efficiency
- Fast and easy data interpretation and reporting
Floating Action Buttons
- Easy and fast setup of camera views
- Go to Light and Image Settings of the selected camera view with only one mouse click
Workflow Wizard
- Guided workflows for wafer setups, alignment tools and Autonomous Assistants
- Workflow wizard shows task-relevant settings and options only
- Wizard settings can be corrected anytime – no need to restart the wizard
- Wizard helps with intelligent solutions in case of error
See "Specifications & Details" tab for more key features
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Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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