Maury MW - Power Meters - 4240 Series
- Single or dual-channel display
- Agilent HP 437 & Agilent HP 438, and Boonton 4220A & 4230A emulation
- Automatically loads sensor data
- Simple software control via SCPI language
- IEEE-488 and RS-232 interfaces standard
The 4240 series of CW RF power meters provides the high speed measurement capability needed in a production environment, as well as the simplicity of operation required for bench top use. It provides very accurate measurements from -70 dBm to +44 dBm (sensor dependent) and has a rapid display update rate for tuning applications. The easy to read LCD displays both channels simultaneously with numeric and bar graph information.
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Frequency Range |
Power Range |
Dynamic Range |
Measurement Speed |
Step Calibrator |
|
10 kHz to 40 GHz (sensor dependent) |
-70 dBm to +44 dBm (sensor dependent) |
90 dB (sensor dependent) |
>200 measurements per second |
50 MHz |
More Product Information
Series of single resistance, capacitance and inductance decadic standards for calibration of ohm meters, LCR meters and multimeters.
- Traceable, accurate and stable
- Low time constant
- Low temperature coefficient
The VULP 9118 E is a polarized log-periodic antenna
- (50) 75 - 1500 MHz
- 1 kW (w/ 7-16 High power 5.4 kW)
- Type N (female) or 7-16 DIN (f)
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
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Monochrome (G-503B) and color (G-503C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
OptoVue
- Revolutionary technology advancement for wafer and die-level photonics probing
- Real-time in-situ calibrations
- Singulated die testing
- True die-level edge coupling
- In-situ power measurements
- Advanced calibration technologies
- Enables autonomous measurements
Horizontal Die-Level Edge Coupling
- Highest accuracy in test results
- Lowest coupling loss
- Repeatable measurement results due to exclusive automated fiber-to-facet alignment technology
- Reduced risk of damaging fibers with collision avoidance technology
- Ease of use for less experienced users
- Enables close simulation of real-world conditions with device performance closest to the final application
See "Specifications & Details" tab for more key features
- Directly compatible with most commercial VNA’s
- Available as polynomial and characterized device kits
- Measure S-Parameters with uncertainty when used in conjunction with Maury’s Insight software platform
Maury offers coaxial and waveguide VNA calibration kits.
Coaxial calibration kits are offered in Polynomial SOLT, Characterized Device (CD) SOLT, and TRL, depending on the connector series. Where available, CD kits improve calibration accuracy when compared to SOLT kits based on polynomial definitions as each calibration kit is provided with individually characterized short, open and fixed load standards, whose S-parameters can be loaded into commercial VNAs directly or when used with Maury’s Insight™ software platform. When combined with Insight™, users will be able to quantify the uncertainty contribution of their calibration kit to their overall measurements. CD cal kits result in TRL-like accuracy with fixed-load SOLT ease-of-use.
- Modular
- Control up to 95 assets
- Control multiple AC and DC power supplies and loads in one mainframe
- Create “virtual assets”
- Web browser control
- User configurable
- Highest Power Density
- Simple integration
- PFC
- Universal AC/DC input
- Up to 6kW in one mainframe
- 1kW DC modules
- PFC ≥0.95
- Reduced space and logistics hassles
- High power density
- Handles DC and AC power and load modules
- User configurable
- Universal AC/DC input
- Ease of integration
- Web browser control
- Trigger bus
- Configure modules to parallel or series operation “on the fly”
- SPA available from 70KHz to 20/40/70/110/125/145 and 220GHz. Also available for banded configuration to 1.1THz.
- Dual SPA mode available: suitable for Mixers/Amplifier/ Harmonics /Spurious testing.
- SPA available on all ports. User can define which port to use as SPA port.
- Several detection types available in classical mode: Peak, minimum, RMS, Mean.
- Various math functions can be applied on SPA mode like Min hold/max hold/ user defined equations.
- Sources and receivers can be independently configured. Can be used as Tracking Generator.
- For units that have a dual source, a dual drive option is available. Support for external source control also possible.
- Phase synchronization for units with Dual source available. This feature allows users to control and configure the phase between the two sources.
- Source and receiver attenuator available with VNA can be activated in SPA mode. Recommendation to use option 62 (with attenuator on receiver side) for measuring the spectrum content of high-power devices.
- Software option: easy to install and upgrade existing user equipment.
- Compliant with IEC 61000-4-5 Ed.3 standard:ECE R10 is regulated at Ed.2, possible to switch to Ed.2
- AC500V/200A DC600V/200A built-in coupling decoupling network.
- Built-in EV relay welding protection diode in DC line. You can evaluate the lightning surge resistance when charging EV / PHV vehicles, which is required by ECE R10-04 / 05. (EV Fast Charging applicable)
- Maximum output voltage 15kV: In the reliability evaluation test of the lightning surge test, the evaluation including the destructive test can be performed.
- Adopt a large LCD screen operation panel: A large LCD panel screen has been adopted for the operation unit to improve visibility and operability.
- Employs MPU control that simplifies continuous testing: Surge output / waveform switching / polarity switching / sequence operation can be performed automatically.
- Equipped with manual and program modes. Manual mode for standard tests and single condition tests, and Program mode for continuous tests under different conditions. You can easily set test conditions according to your application.
- Excellent safety functions including interlock
- Equipped with waveform check terminal as standard
- You can check the output waveform with your oscilloscope and BNC cable.
- Isolation transformer required to protect the power supply for EUT is available. (option)
- Possible to switch the constant of the decoupling circuit in order to prevent resonance with the power supply.
- Possible to switch to a circuit not including 18uF in the surge output of IEC61000-4-5 Edition 2.0 2005 version).
* This product is a custom product. Please contact us for details.
Customization up to DC1000V is available.
Maury Microwave
Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.