• Reduce service stoppages with a fanless design
• Inspect multiple sites through the support for four GigE Vision and four USB3 Vision cameras
• Simplify cabling for GigE Vision installations using Powerover-Ethernet (PoE)-enabled ports
• Tackle deep learning and traditional machine vision applications with a mobile-class embedded twelfth-generation Intel Core processor
• Connect separately to the factory floor and enterprise networks via two more Gigabit Ethernet ports
• Synchronize with other equipment using the integrated real-time digital I/Os with rotary encoder support and RS-232/RS-485 ports
• Streamline application development using the Aurora Design Assistant flowchart-based IDE or the Aurora Imaging Library SDK
• Tackle machine vision applications with utmost confidence using field-proven tools for analyzing, locating, classifying, measuring, reading, and verifying

• A real-time diagnostic tool supports EMC/EMI debugging. 
• Fast visualize EMC/EMI problems. 
• Enables easy comparison of countermeasures before and after. 
• Capable of measurement from entire products to single components. 
• Factor-editor function provides correction of antenna characteristics, cable loss and preamplifier. 
• User friendly compact design. 
• Customer supplied spectrum and probes acceptable (Please consult)

With the complexity of modern aerospace systems and components, stringent safety standards, and rapidly emerging trends and technologies, the aerospace and defense industry is facing a time of expeditious change. These industry trends shape aerospace manufacturers’ testing needs, growth objectives, and overall business goals. The reality is that aging aerospace facilities aren’t prepared to keep up with these rapid trends. Organizations seeking a competitive edge in the industry aim to achieve sustainable practices and regulatory compliance or explore new avenues in electric Vertical Take-Off and Landing (eVTOL) aircraft and space exploration. This demands testing facilities that are future-proofed for innovative solutions.

OptoVue

• Revolutionary technology advancement for wafer and die-level photonics probing
• Real-time in-situ calibrations
• Singulated die testing
• True die-level edge coupling
• In-situ power measurements
• Advanced calibration technologies
• Enables autonomous measurements

Horizontal Die-Level Edge Coupling

• Highest accuracy in test results
• Lowest coupling loss
• Repeatable measurement results due to exclusive automated fiber-to-facet alignment technology
• Reduced risk of damaging fibers with collision avoidance technology
• Ease of use for less experienced users
• Enables close simulation of real-world conditions with device performance closest to the final application

See "Specifications & Details" tab for more key features

eZ Processing is the solution for telemetry data processing, analysis and display (real time or playback). It allows the capture of the data either from a PCM signal or directly through data sent on Ethernet (IRIG 106 Chapter 10) by the receiver.

It performs the frame synchronization, Engineering Unit conversion, data display and storage, as well as data subset dissemination to dedicated analysis tools. It can accommodate multiple display stations, each having selectable parameters and displays. When used in a system with Safran Defense & Space, Inc. (formerly Safran Data Systems, Inc.) data acquisition units like the XMA or MDR, the software parameter database is automatically updated by eZ configuration software, reducing the set-up time and preventing all errors.