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Anritsu MP1800A - Signal Quality Analyzers

  • Highly expandable, plug-in, modular design bit error rate tester (BERT)
  • Bit Error Rate test from 0.1 Gbit/s to 32.1 Gbit/s; 64.2 Gbit/s with external MUX/DeMUX
  • Supports signal integrity analysis for a variety of 100G+ applications
    • High speed backplane and interconnect
    • High speed chip/device
    • Active optical cable
    • Optical transceiver modules
  • High-quality (12 ps rise/fall time) and low-jitter (8 ps p-p) PPG waveform, up to 3.5 Vp-p
  • Jitter tolerance test up to 32.1 Gbit/s
    • SJ up to 2000 UI. High modulation frequency SJ up to 1 UI at 250 MHz
    • Support generation of dual tone SJ, RJ, BUJ, and SSC
    • Half Period Jitter (Even/Odd Jitter)
  • Ultra high sensitivity Error Detector (10 mV typical) with embedded clock recovery
  • 32.1 Gbit/s 4Tap Emphasis with external MP1825B
  • Crosstalk test and skew tolerance test using synchronized multi-channel PPG
  • Passive Linear Equalizers for improved EYE opening
  • Comprehensive signal analysis including Burst measurement for PON and EDFA loop circuit testing, Bathtub Measurement (TJ, DJ, RJ), Eye Diagram and Eye Margin Measurement
  • 32.1 Gbaud 4PAM/8PAM generators and accurate 4PAM BER measurement
  • 1 Tbit/s Next Gen. High-Speed Transmission Testing (32G x 32ch) 

Anritsu MP1825B - 4 Tap Emphasis

  • 32.1Gbps 4-tap emphasis
  • Jitter transparent for the jitter tolerance test
  • Compact remote head to minimize cable loss and ISI
  • Can be used as a front head with any Pulse Pattern Generator
  • Compensate or inject ISI and DDPWS
Must-read documents:

Anritsu MP1861A - 56G/64G bit/s MUX

  • 56G/64G bit/s Wide Bandwidth: CEI-56G, 400 GbE, FEC Bit Rate
  • 2:1 MUX, 1:2 DEMUX: Expand 28G/32G 2ch BERT to 56G/64G
  • Compact Remote Head: Reduces DUT connection cable losses
  • Excellent Signal Quality and Rx Sensitivity: High-accuracy measurements of semiconductor chip
    • Intrinsic random jitter 200 fs rms (typ.)
    • Max. variable amplitude output: 3.5 Vp-p
    • Input sensitivity: 25 mV (typ.), single-end, eye height
  • Versatile Signal Integrity Measurement Functions: Supports CEI-56G, 400 GbE tests
    • TJ/DJ/RJ/Bathtub Jitter, Eye Diagram, Eye Margin Auto-measurements
    • Jitter tolerance tests (using MU181500B)
      • Supports generation of SJ, RJ, BUJ, SSC, Dual Tone SJ, Half Period Jitter (Even/Odd Jitter)
      • SJ generation with large amount: 0.55 UI @ fm 250 MHz
    • Crosstalk tests and Skew tolerance using variable data skew by using multi-channel
  • High Expandability
    • Sync pattern generation and BER measurements for up to four channels simultaneously
    • Emphasis signal generation (using MZ1854A, MP1861A 2ch sync, 57.8 Gbit/s)
    • PAM4 signal generation (using MZ1854A, MP1861A 2ch sync, 56.2 Gbit/s)
  • Supports burst signal test
  • Max. 512 Mbit/ch programmable data pattern
  • Auto PPG-to-MUX phase adjustment at bit rate change using auto-alignment function

Anritsu MP1862A - 56G/64G bit/s DEMUX

  • 56G/64G bit/s Wide Bandwidth: CEI-56G, 400 GbE, FEC bit rate
  • 2:1 MUX, 1:2 DEMUX: Expand 28G/32G 2ch BERT to 56G/64G
  • Compact Remote Head: Reduces DUT connection cable losses
  • Excellent Signal Quality and Rx Sensitivity: High-accuracy measurements ofsemiconductor chip
    • Intrinsic Random Jitter 200 fs rms (typ.)
    • Max. variable amplitude output: 3.5 Vp-p
    • Input sensitivity: 25 mV (typ.), single-end, eye height
  • Versatile Signal Integrity Measurement Functions: Supports CEI-56G, 400 GbE tests
    • TJ/DJ/RJ/Bathtub Jitter, Eye Diagram, Eye Margin Auto-measurements
    • Jitter tolerance tests (using MU181500B)
      • Supports SJ, RJ, BUJ, SSC, Dual Tone SJ, Half Period Jitter (Even/Odd Jitter)
      • SJ generation with large amount: 0.55 UI @ fm 250 MHz
    • Crosstalk tests using variable data skew by using multi-channel
  • High Expandability
    • Sync pattern generation and BER measurements for up to four channels simultaneously
    • Emphasis signal generation (using MZ1854A, MP1861A 2ch sync, 57.8 Gbit/s)
    • PAM4 signal generation (using MZ1854A, MP1861A 2ch sync, 56.2 Gbit/s)
    • Supports burst signal test
    • Max. 512 Mbit/ch programmable data pattern
    • Auto PPG-to-MUX phase adjustment at bit rate change using auto-alignment function

Anritsu MP1900A - Signal Quality Analyzer-R

  • 512 Gbit/s max. transmission capacity, one main frame expandable to 16ch (filling 8 slots with 32 Gbit/s 2 ch PPG)
  • All-in-one support for both high-speed Ethernet and PCI Express interface tests
  • New wideband 32 Gbit/s SI PPG/ED (MU195020A/MU195040A)
    • Bit rate of 2.4 Gbit/s to 32.1 Gbit/s
    • NRZ/PAM4 Support
    • 10Tap Emphasis
    • Variable ISI function
    • Multi-band CTLE (8 Gbit/s, 16 Gbit/s, 28 Gbit/s bandwidths)
    • Low Intrinsic Jitter output of random Jitter 115 fs rms (typ.)
    • High-sensitivity Data input of 15 mV typ. (EYE Height)
    • 1ch/2ch Selection
  • PCI Express Link Training, LTSSM analysis (using MU195020A/MU195040A/MX183000A-PL021)
  • USB Express Link Training, LTSSM analysis (using MU195020A/MU195040A/MX183000A-PL022)
  • Jitter Addition, Jitter Tolerance measurement functions (SJ/RJ/BUJ/SSC, using MU181500B/MX183000A-PL001)
  • Voltage Noise Addition function (Common/Differential/White Noise, using MU195020A/MU195050A)

Anritsu MP2100B - BERTWave™ (10G BERT,Sampling Oscilloscope)

  • Built-in 4ch BERT and sampling oscilloscope
  • Simultaneous 4ch Bit Error Rate (BER) measurements
  • High-quality waveform PPG (1 ps rms Jitter)
  • High-input sensitivity (10 mVp-p minimum input sensitivity)
  • High-speed Eye Mask test and Eye pattern analysis at 150 ksample/s max.
  • Supports differential signal BER measurement, Eye Mask test and Eye pattern analysis
  • Up to six built-in Bessel filters for full-featured application support
  • Compact (18 cm deep) test set for optical module evaluation
  • Simultaneous measurement of BER, Jitter, Eye pattern and Eye Mask
  • Supports WDP measurements
  • Calculates optimum values for sampling simultaneously with equalizer and emphasis values to display Eye Pattern
  • Simultaneous Eye Pattern, Eye Mask and Jitter measurements of simulated waveform

Anritsu MP2110A - BERTWave™ (100G BERT,Sampling Oscilloscope)

For 100/200/400G Multichannel Optical Module/Device R&D and Manufacturing
All-in-One BERT and Sampling Oscilloscope
  • Customized built-in 2ch sampling oscilloscope and 4ch BERT
  • Fast measurement and high performance shorten test times, improve yields, and cut capital infrastructure costs
    • Sampling Oscilloscope
      • Fast: 250 ksamples/s to measure 1 Msamples in about 5 s
      • High Sensitivity: –15 dBm (typ., SMF)
      • Wide bandwidth: 35 GHz (optical, SMF), 25 GHz (optical, MMF), 40 GHz (electrical)
      • Low Jitter: 200 fs rms (typ.)
      • Both NRZ and PAM4 signal analysis  NEW
      • Built-in Clock Recovery Unit (CRU) for both NRZ and PAM4  NEW
      • NRZ Jitter component analysis  NEW
    • BERT
      • Low-Jitter PPG: 600 fs rms (typ.)
      • High-sensitivity ED: 25 mV (typ.)
  • Built-in PC for stable fast performance
  • Sample programs for easy measurement system configuration

Teledyne Lecroy PeRT3 Phoenix System

  • Bit Error Rate tester with protocol aware capabilities
  • Comprehensive  jitter generation capapbility for receiver jitter and noise tolerance testing
  • Built in 3 tap de-emphasis generator
  • Protocol aware generator and receiver with 1 Gbyte space for custom patterns and protocol state machines
  • 10G option to enable full BER capabilities at 10 Gbps
  • Supports 128B/132B pattern generation and error detection
  • Supports USB3.1 loopback initialization
  • Complete jitter profile to support USB3.1jitter tolerance testing at 10Gbps
  • Built in De-emphasis generator
  • SKP filtering and injections at 10 Gbps
  • User defined test scripting functions for jitter tolerance equalization optimization search,l and multi-parameter sweep testing
  • User Customizable State Machines for protocol handshake and link training