Focus Microwaves - Manual Tuners
Model |
Min Frequency |
Max Frequency |
Type |
Datasheets |
MMT304 | 0.4 GHz | 3.0 GHz | Manual | |
MMT306 | 0.6 GHz | 3.0 GHz | Manual | |
MMT308 | 0.8 GHz | 3.0 GHz | Manual | |
MMT316 | 1.6 Ghz | 3.0 GHz | Manual | |
MMT606 | 0.6 GHz | 6.0 GHz | Manual | |
MMT704 | 0.4 GHz | 7.0 GHz | Manual | |
MMT708 | 0.8 GHz | 7.0 GHz | Manual | |
MMT716 | 1.6 GHz | 7.0 GHz | Manual | |
MMT808 | 0.8 GHz | 8.0 GHz | Manual | |
MMT1804 | 0.4 GHz | 18.0 GHz | Manual | |
MMT1808 | 0.8 GHz | 18.0 GHz | Manual |
More Product Information
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (manual exposure control: 10 µs to 26.8 s)
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Auto white balance (GT2300C only)
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Binning (horizontal and vertical)
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Color correction, hue, saturation (GT2300C only)
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Column defect masking
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Decimation X/Y
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Gamma correction
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Three look-up tables (LUTs)
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Region of interest (ROI), separate ROI for auto features
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Reverse X/Y
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P-Iris and DC-Iris lens control
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Event channel
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Image chunk data
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IEEE 1588 Precision Time Protocol (PTP)
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RS232
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Storable user sets
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StreamBytesPerSecond (bandwidth control)
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Stream hold
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Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
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Tap mode switchable in Vimba Viewer 2.0 or later (four-tap, one-tap)
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Temperature monitoring (main board and sensor board)
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Trigger over Ethernet (ToE) Action Commands
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Different substrate carriers for wafers up to 100 mm or single dies
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Up to six positioners
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Independently cooled cold shield
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Probe positioners placed inside vacuum chamber
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Ergonomic and straightforward design
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Simple microscope operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
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Quick and easy probe tip navigation
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Z drive can work in the same range as the chuck
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Enables higher separation gap while the DUT stays in focus
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Automatically configure and optimize performance
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24/7 operating
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Increased MTBF
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Protects the measurement setup
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Prevents involuntary mechanical contact between lens and probes
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (manual exposure control: 10 µs to 26.8 s)
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Auto white balance (GT1660C only)
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Binning (horizontal and vertical)
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Color correction, hue, saturation (GT1660C only)
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Column defect masking
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Decimation X/Y
-
Gamma correction
-
Three look-up tables (LUTs)
-
Region of interest (ROI), separate ROI for auto features
-
Reverse X/Y
-
P-Iris and DC-Iris lens control
-
Event channel
-
Image chunk data
-
IEEE 1588 Precision Time Protocol (PTP)
-
RS232
-
Storable user sets
-
StreamBytesPerSecond (bandwidth control)
-
Stream hold
-
Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
-
Tap mode switchable in Vimba Viewer 2.0 or later (four-tap, one-tap)
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Temperature monitoring (main board and sensor board)
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Trigger over Ethernet (ToE) Action Commands
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (74 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
- Camera and IEEE 1394b cable (other configurations on request)
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Joystick controller
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Manual probe positioners with rotary feed-throughs
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
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User-centered design minimizes training costs and enhances efficiency
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Fiber coupled to allow movement
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Ultra-broadband measurement
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Transmitted or reflected data collection
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Mates with collinear adaptor (AXA4001)
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High signal to noise ratio
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Hot swappable
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Low noise to enable rapid data collection
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Adjustable lens tube for focusing
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Multiple lens configurations available
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Revolutionary technology advancement for wafer and die-level photonics probing
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Highest accuracy in test results
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
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Dark, shielded and frost-free
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-40°C to +125°C
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Leveraging considerable expertise through an innovative engineering team
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554