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The RL4260 is characterized as a Medium Aimed Bright Field ring light.
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Precisely aimed LEDs provide a level of lighting control not found in traditional illuminators.
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A range of standoffs and fields of view may be specified at the time of order.
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The ring light is available in a wide range of wavelengths from UV to IR, including a 3 channel RGB version.
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Diffuser and polarizer options are also available.
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The large inner diameter of the ring light can accommodate lenses up to 55mm in diameter.
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The light can also be ordered with an optional mounting ring.
FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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More Product Information
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32 GT/s, PCIe 5.0 data rate operation. Fully compatible with other PCIe data rates of 2.5, 5.0, 8.0 and 16.0GTps
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Link widths up to 8-lanes
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Memory segmentation for capture of multiple traces
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Simultaneous two-link, dual port capture is allowed by multiple users
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Host-Client connection for remote debugging using Ethernet, or local debugging using USB
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Decodes all PCIe and NVMe traffic at all layers of the stack including the TLP, DLLP, and PHY layer logic sub-blocks
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Trigger and Search events include training sequences, ordered sets, queue pairs, PRPs, Scatter/ Gather Lists (SGL) etc.
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Cascade up to four Xgig captures into a single trace view
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Full support of LTSSM for analysis
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Field replaceable modular fan and power supply assemblies
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LED’s give quick indicators of power and status
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Works with the VIAVI Xgig software tool suite: Trace Control, Trace View, Expert™, Serialytics™
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
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Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
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Even distribution of high current with innovative multi-fingertip design
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Compatible with TESLA 200/300 mm power device characterization system
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Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
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Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
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Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
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Substrate material: High-resistivity silicon
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Substrate thickness: 275 µm
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Dielectric constant: 11.8
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Nominal Z0: 50 Ω
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The LL158 Series produces an oblique (30°) line of illumination for line scan applications in a passively cooled design.
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When oriented across a moving web or conveyor line, unlike standard line lights, this linear light’s unique geometry highlights engraved or raised lines that run parallel to the material travel.
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Provides an intensity level of 53kLux (working distance of 75mm).
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Pre-engineered for expandability in 6” (152mm) increments up to 90” (2.28m).
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Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input.
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DoD AIMS 03-1000A (Change Notes 1,2,3) Mark XIIA certified
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Supports DoD AIMS 04-900A Option A - KIV-78 and Option B - KIV-77, & SIT-2010 crypto appliqués.
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Transponder Test Modes 1,2,3/A, C, S (EHS/ELS), 4, Mode 5 (Level 1 and 2)
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Interrogator Test Modes 1, 2, 3/A, C, S, 4, Mode 5, TCAS, ETCAS (Level 1 and 2)
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DO-260B compliant; ADS-B Out test capability
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The BL2 Series provides a highly uniform and high intensity, diffuse backlight source, primarily used for creating object silhouettes of high contrast or imaging through semi-translucent materials.
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BL2 Backlights are pre-engineered for scalability, allowing for size configurations in 1″ increments up to 46″ in length and width.
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This Backlight series is offered in 5 wavelength options and can be configured with either a polarization or collimation film.
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As with all Advanced illumination products, this series is built for tailorability while still maintaining a standard lead time of one to three weeks.
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Each side of a BL2 is equiped with M6 nut channels, allowing for quick and easy mounting. This series comes with our LB111 Mounting Brackets.
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32GTps, PCIe 5.0 data rate operation. Fully compatible with other PCIe data rates of 2.5, 5.0, 8.0 and 16 GTps
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Link widths to 16-lanes, including 1-, 2-, 4-, 8-lanes
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256GB memory (128GB upstream and 128GB downstream)
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Memory segmentation for capture of multiple traces
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Host-Client connection for remote debugging using Ethernet or local debugging using USB
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SMB capture and trigger for NVMe Management Interface (NVMe-MI) observability
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Simultaneous capture of multiple links is allowed with multiple simultaneous users
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Decodes all PCIe, NVMe and CXL traffic at all layers of the stack including the TLP, DLLP, and PHY layer packets
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Flexible trigger events include training sequences, ordered sets, queue pairs, PRPs, SGL, SMB, etc.
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Cascade captures from up to four Xgig chassis into a single trace view
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Full support of PCI Express LTSSM analysis
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Field replaceable power supply
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LEDs give quick indicators of power and link status
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Includes one-year hardware and three-year software warranties
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Works with the VIAVI Xgig software tool suite: Trace Control, Trace View, Expert™, Serialytics™
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Supported by a wide variety of Interposers (CEM, U.3, etc.)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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