FormFactor - Cascade QuadCard™ - Cost-effective, versatile probe card solution
-
Accommodates a combination of up to four Cascade Microtech probes
-
Configurable for mixed-signal RF/mmW testing
-
Quick and easy repairs to be performed in the field, by simply replacing individual probes
-
Adaptable to new device layouts by exchanging individual probes
The QuadCard probe card is the industry’s first configurable, multi-quadrant probe adapter that employs innovative fine probe aligners to mount up to four FormFactor probes on a single probe card. It is designed to accommodate a combination of our probes such as Infinity Probes®, ACP probes, |Z| Probes® and Multi-|Z| Probes, which are aligned individually by the fine probe aligners.
More Product Information
-
Pulse tube cryocooler for cryogen free 4K temperatures
-
He-3 sorption cooler for high power intercept and launch stage for ADR
-
Single stage ADR provides solid state cooling down to 25mK
-
Sample stage mounting at both 300mK and 30mK
-
Multiple stage feedthroughs for thermally intercepting the signals
-
Two large electrical bread boards for more configurable space
-
Rapid cool options for faster cooldowns
-
Superior field confinement reduces unwanted couplings to nearby devices and transmission modes
-
Superior measurement accuracy and repeatability
-
Small scrub minimizes damage to aluminum pad
-
Typical contact resistance < 0. 05 Ω on Al, <0.02Ω on Au
-
Save valuable wafer space and reduce pad parasitics by being able to shrink pad geometries to 25 x 35 µ m (best case)
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
-
32GTps, PCIe 5.0 data rate operation. Fully compatible with other PCIe data rates of 2.5, 5.0, 8.0 and 16 GTps
-
Link widths to 16-lanes, including 1-, 2-, 4-, 8-lanes
-
256GB memory (128GB upstream and 128GB downstream)
-
Memory segmentation for capture of multiple traces
-
Host-Client connection for remote debugging using Ethernet or local debugging using USB
-
SMB capture and trigger for NVMe Management Interface (NVMe-MI) observability
-
Simultaneous capture of multiple links is allowed with multiple simultaneous users
-
Decodes all PCIe, NVMe and CXL traffic at all layers of the stack including the TLP, DLLP, and PHY layer packets
-
Flexible trigger events include training sequences, ordered sets, queue pairs, PRPs, SGL, SMB, etc.
-
Cascade captures from up to four Xgig chassis into a single trace view
-
Full support of PCI Express LTSSM analysis
-
Field replaceable power supply
-
LEDs give quick indicators of power and link status
-
Includes one-year hardware and three-year software warranties
-
Works with the VIAVI Xgig software tool suite: Trace Control, Trace View, Expert™, Serialytics™
-
Supported by a wide variety of Interposers (CEM, U.3, etc.)
-
Different substrate carriers for wafers up to 100 mm or single dies
-
Up to six positioners
-
Independently cooled cold shield
-
Probe positioners placed inside vacuum chamber
-
Ergonomic and straightforward design
-
Simple microscope operation
-
Independent control of linear chuck stage and positioners
-
Contact/separation stroke for probe platen
-
Quick and easy probe tip navigation
-
Z drive can work in the same range as the chuck
-
Enables higher separation gap while the DUT stays in focus
-
Automatically configure and optimize performance
-
24/7 operating
-
Increased MTBF
-
Protects the measurement setup
-
Prevents involuntary mechanical contact between lens and probes
-
Easy and fast setup of camera views
-
Go to Light and Image Settings of the selected camera view with only one mouse click
-
Guided workflows for wafer setups, alignment tools and Autonomous Assistants
-
Workflow wizard shows task-relevant settings and options only
-
Visualizes the progress of setup, alignment and measurement tasks
-
Status information always at hand
-
Informs the user about events, for example “Successful Alignment”
-
Interacts with the user and helps with intelligent solutions
-
For very complex wafer structures
-
Enables automatic test of multiple devices in each die location before stepping to the next die
-
Comprehensive I/O connections: Standard setup of up to 24 RF lines (up to 20 GHz) and 48 DC lines, with extensions to higher I/O connections possible.
-
Non-magnetic construction: Capable of characterizing qubits below 50 mK without magnetic interference when required.
-
Sample size: Proven with chips up to 10×10 mm in size.
-
Pressure-based contact: Connect test and measurement I/O to DUT pads using pressure only. No permanent connection required.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000