FormFactor - Cascade Eye-Pass Probe - Durable multi-contact wafer probe with controlled impedance power bypass technology
-
High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
-
RF bandwidth to 500 MHz
-
Long probe life: > 250,000 contacts
-
Beryllium-copper tips for gold pads or tungsten for aluminum pads
-
Oscillation-free testing of wide-bandwidth analog circuits
-
Use with ACP series probes to provide functional at-speed testing for known-good-die
-
Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
-
Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
The multi-contact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head. Available contact types are ground, logic, standard and Eye-Pass power supply, power supply sense, and ac signal.
Use our online tool to capture your design requirements and receive a quote.
Use our online tool to capture your design requirements and receive a quote.
More Product Information
-
Fully isolated experiment space for true 4K temperatures during probing
-
Cryogenic positioners to provide large travel ranges without warming up the device
-
Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
-
A soft vacuum bellows provides a compliant mounting interface for the cryocooler
-
Quick release vacuum feedthroughs for easy configurability
-
A large rectangular port for high signal capacity
-
Multi-purpose SIGMA instrument integration kit
-
Shorter cabling and universal chuck connection
-
Triax probe with protected guard
-
Triax design for low-leakage measurements up to 3 kV
-
Special chuck surface coating
-
High-isolation ready
-
Arcing protection
-
Shield Enclosure with interlock
-
Advanced grounding concept
-
Coaxial and triaxial measurements up to 10,000 V
-
High-quality construction with low-noise electrical performance
-
Replaceable probe tips in a variety of tip sizes
-
Temperature range of -60°C to 300°C
-
Triaxial measurement ensures a much better understanding of device leakage in the off state
-
Highly reliable, stable and repeatable measurements
-
Integrally designed as part of a complete measurement solution
-
Combined eye-pieces and CCD camera mount
-
3x zoom and quick lens exchange
-
Engraved guides on mmW platen
-
Supports broadband, load pull, coax RF and banded waveguide configuration
-
Rock-solid mechanical design
-
Submicron stage accuracy
-
Fully isolated experiment space for true 4K temperatures during probing
-
Cryogenic positioners to provide large travel ranges without warming up the device
-
Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
-
A soft vacuum bellows provides a compliant mounting interface for the cryocooler
-
Quick release vacuum feedthroughs for easy configurability
-
A large rectangular port for high signal capacity
-
Long holding time: 80 hours with 10 STP liter He-3 gas
-
Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
-
Sample can be loaded or removed when the cryostat is cold
-
Low noise, low vibration
-
Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
-
Customizable sample space to fit the user’s application
-
Long holding time: 100 hours for six (6) STP liter He-3 gas
-
Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line; +/- 0.5 mK at base temperature
-
Low noise
-
Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
-
GigE Vision InGaAs SWIR camera
-
VGA resolution
-
Power over Ethernet
-
large pixel with high dynamic
-
Compact industrial design, no fan
-
GigE Vision interface with Power over Ethernet
-
Very high intra-scene dynamic range of 73 dB
-
Comprehensive I/O control options
-
Automated on-board image correction
-
Stabilized sensor cooling, no fan
-
Extended operating temperature range
-
Easy and fast setup of camera views
-
Go to Light and Image Settings of the selected camera view with only one mouse click
-
Guided workflows for wafer setups, alignment tools and Autonomous Assistants
-
Workflow wizard shows task-relevant settings and options only
-
Visualizes the progress of setup, alignment and measurement tasks
-
Status information always at hand
-
Informs the user about events, for example “Successful Alignment”
-
Interacts with the user and helps with intelligent solutions
-
For very complex wafer structures
-
Enables automatic test of multiple devices in each die location before stepping to the next die
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000