FormFactor - HPD Model HE-3-TLSUHV-STM - Wet Helium-3 Cryostat
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Long holding time: 80 hours with 10 STP liter He-3 gas
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Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
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Sample can be loaded or removed when the cryostat is cold
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Low noise, low vibration
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Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
The Model HE-3-TLSLUHV-STM is a top-loading Helium-3 cryostat with sample in ultra-high vacuum (UHV) space for scanning tunneling microscopy (STM) with atomic resolutions. The sample can be loaded through the 1.0” diameter central access when the cryostat is cold. With its standardized unique design, this He-3 cryostat generates next to zero acoustic noise and mechanical vibration. The Model HE-3-TLSUHV-STM He-3 insert is designed to be compatible with all kinds of superconducting magnets, such as solenoid, vector magnets, and more.
This He-3 insert includes the following components:
- Central access with gate valve on top
- Charcoal sorption pump with heater and thermometer
- 1 K pot with heater and thermometer
- He-3 pot with heater and thermometer
- Permanently stored He-3 gas
- UHV compatible IVC can
- Mechanical heat switches
- Operation test
More Product Information
Customized Solutions for a Variety of Challenging Applications
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DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
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Full thermal range of -60°C to +300°C
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Reliable and repeatable contact
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Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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High thermal stability components
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On-axis probe-to-pad alignment
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Flexibility from hot only to full thermal range of -60°C to +300°C
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Thermally induced drift can be automatically re-aligned for 30 μm pads in a temperature range from -40°C to 150°C (the effective temperature range depends on pad size, probe card holder and probe card)
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3 performance level configurations (fully-shielded / shielded / open)
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
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User-centered design minimizes training costs and enhances efficiency
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Advanced MicroVac chuck surface for minimum contact resistance between wafer and chuck
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Safety-rated interlock system for high-power testing (meets EN 60947-5-1, EN 60204-1)
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Supports fully automated testing up to 10kV by eliminating arcing point
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Full wafer access via locking roll-out stage
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Coaxial, triaxial, and pin jack feed-troughs available
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Convenient instrument connection kits
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Load/unload wafer to hot/cold chuck (-60° C to +300° C)
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Up to 15% faster transition times than other systems in the market
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Versatile temperature range for extreme environments
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IEEE 1588 PTP
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Power over Ethernet
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P-Iris and DC-Iris lens control
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Monochrome (GT1380) and color (GT1380C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Flexible Product Line
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Low power DC modules
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Low power AC modules
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High power DC, 19" rack mounted loads
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High power AC, 19" rack mounted loads
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26 Total Models
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Flexible Control
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Remote: GPIB, RS-232, Analog
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Manual: Front Panel
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DC Modes: CC, CR, CV, CP
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AC Modes: CR, CC with crest factor control
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Dynamic mode with slew rate control
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Flexible Data Feedback
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GPIB, RS-232
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Current monitor output (SLM DC only)
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Front panel
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Cryogen-free option available
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Flexible sample space
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Low noise, low vibration
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Long holding time
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Stable He-3 pot temperature
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The BL Series of Back-lit Backlights offer a low profile design with a planar, back-lit array of LEDs.
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BL Series backlights are part of our pre-engineered, expandable family of products.
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Expandable products provide custom size and power options with short lead times.
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Model numbers include the BL0202, BL0404, and BL0808.
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This series comes with LB111 Mounting Brackets.
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APS-H optical format CMOS sensor
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PoCXP
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4-DIN type connector
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79.7 fps at full resolution
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Extended near-infrared (X-2620B NIR) model
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Extended feature set with Sequencer Control and Multiple Region of Interest selection to support advanced imaging applications
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On-board Defect Pixel and 2D Fixed Pattern Noise Correction for improved image quality
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Simplified firmware update in the field via interface cables using GenICam File Access
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Robust, fan-less design for industrial imaging applications
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Heat-dissipation optimized housing to reduce image noise
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Build-in tripod adapter and multiple mounting holes for eased system integration
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DIN 1.0/2.3 CoaXPress connectors for secure operation in industrial environments
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Single cable solution using Trigger and Power over CoaXPress
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Comprehensive I/O functionality for extended control of connected system components
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Select between B 270 ASG protection glass and filter types: IRC30 IR cut filter or Schneider 486 IR cut filter
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000