FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe
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Ideal for multiport RF/Microwave and high-speed digital signal testing
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Mix DC and RF/Microwave signals on one probe
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Long lifetime – typically over one million (1,000,000) touchdowns
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Excellent performance in temperatures ranging from 10 K to 200°C
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Probe on any pad material with no damage
The Multi |Z| Probe® is a new dimension in RF/microwave multiport and digital signal testing. It uses the same patented technology as other |Z| Probes, but can carry up to 16 RF/microwave signals on one probe. Additionally, DC and RF/microwaves signals can be mixed on the probe, allowing you to add power biasing along with RF signals.
When several individual pads must be contacted by a single probe, it is extremely important that the contact structures are perfectly aligned. Thanks to the MEMS technology used, the Multi |Z| Probe can contact up to 35 pads. Furthermore, small variances in pad height, are easily overcome by the spring-like movement of the independent contacts.
The Multi |Z| Probe can be configured to test DC signals for your DC-test applications if necessary. For single-ended applications, please see the |Z| Probe. For applications requiring just two signals, the Dual |Z| Probe is available. The Multi |Z| Probe can also be integrated into the |Z| Probe Card for high-throughput RF testing.
More Product Information
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DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
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Full thermal range of -60°C to +300°C
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Reliable and repeatable contact
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Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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High thermal stability components
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On-axis probe-to-pad alignment
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Flexibility from hot only to full thermal range of -60°C to +300°C
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Thermally induced drift can be automatically re-aligned for 30 μm pads in a temperature range from -40°C to 150°C (the effective temperature range depends on pad size, probe card holder and probe card)
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3 performance level configurations (fully-shielded / shielded / open)
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
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User-centered design minimizes training costs and enhances efficiency
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Up to 65 GHz system bandwidth
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Up to 130 GBaud detectable baud rate
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Up to 160 GS/s sample rate
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Real-time acquisition for testing of coherent modulated optical communications links
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Built-in dispersion compensation, polarization de-multiplexing, and carrier recovery algorithms
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Supports DP-QPSK, DP-16QAM, and a wide variety of other PSK and QAM formats
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Support for custom modulation formats
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Built-in local oscillator
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Adaptive calibration – Receiver can be disconnected and reconnected without factory calibration
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Accommodates a combination of up to four Cascade Microtech probes
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Configurable for mixed-signal RF/mmW testing
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Quick and easy repairs to be performed in the field, by simply replacing individual probes
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Adaptable to new device layouts by exchanging individual probes
- Support for the highest speeds available in CoaXPress 2.0
- Connect to and capture from up to four cameras or combine connections for even higher data rates
- Simplify cabling with PoCXP support between cameras and vision computer
- Offload host computer of custom image processing using a field-programmable gate array (FPGA) device
- Distribute image processing workload across multiple computers through data forwarding capability
- Synchronize with sensors, encoders, and controllers with ample auxiliary I/Os for each CoaXPress connection
- Use license fingerprint for Aurora Imaging Library and avoid the need for a separate hardware key
- Monitor and troubleshoot acquisition performance in detail using Aurora Gecho event-logging tool
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Up to 50mm measurement range using a 9.5 mm stainless steel rod
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Rugged aluminum enclosure with IP67 rating; suitable for outdoor installations
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Internal protection of connectors/splices
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Double-ended design supports multiplexing of many sensors on one fiber
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Fully temperature compensated over the entire operating range
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Fast response time, stable measurements, high resolution
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Up to 100 GHz Industry leading analog bandwidth
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Acquisition module configurations with up to:
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4 channels at 36 GHz
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2 channels at 65 GHz
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1 channel at 100 GHz
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Up to 240 GS/s sample rate
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Long Memory - Up to 1.5 Gpt/ch
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Modular Design - build a system with up to 20 acquisition modules, for:
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80 channels at 36 GHz
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40 channels at 65 GHz
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20 channels at 100 GHz
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ChannelSync™ Architecture for 130 fs matching between channels
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Multi-Lane eye, Jitter and Noise Analysis with SDAIII-CompleteLinQ
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Optical Modulation Analysis with Optical-LinQ
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PAM4 Eye, Jitter and Noise Measurements with PAM4 Signal Analysis
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Industry’s only true hardware 14.1 Gb/s serial trigger
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Add 12.5 GS/s mixed-signal capability at any time with the HDA125 high-speed digital analyzer
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Fully isolated experiment space for true 4K temperatures during probing
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Cryogenic positioners to provide large travel ranges without warming up the device
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Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
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A soft vacuum bellows provides a compliant mounting interface for the cryocooler
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Quick release vacuum feedthroughs for easy configurability
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A large rectangular port for high signal capacity
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Spin mode is a dynamic mode intended to provide a simulation of a spinning satellite.
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Enhanced Eclipse mode is a dynamic mode that allows the user to easily program and initiate an eclipse event with total control over all of the V-I curve parameters and dwell times.
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Operates with Sequential Shunt Regulators and Maximum Power Point Trackers
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Multiple redundant OVP/OIP layers
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Software-driven design allows for field updates for adding new features, capability or modifications due to industry changes
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ADS-B Target Generator
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ADS-B squitter encode/decode
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DO-260, DO-260A and DO-260B data parsing
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DO-260B canned tests available (option)
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Generates ATCRBS/Mode S interrogations Multi-receiver test capability (option)
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UAT TX/RX capability (optional)
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Pulse and frequency measurement
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10.4 inch touch screen LCD display for operator control of all test set capabilities
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Remote controlled via GPIB or Ethernet
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Two independent transmitters and receivers
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TX/RX data logging capability
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Full diversity testing capability
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Data parsing in engineering units
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000