FormFactor - Cascade FPC Probe - Rugged, deep reach RF probing for modules and circuit boards
-
DC-40 GHz bandwidth
-
10 ps rise time
-
Low insertion and return loss
-
2 mils of tip-to-tip compliance
-
High probing angle and clearance
The FPC probe is a high frequency 50 ohm coaxial probe that offers a signal line with either one or two low-inductance fixed-pitch ground contacts. The probe tip structure is lithographically defined for unsurpassed impedance control, preserving the highest integrity possible when launching and receiving signals from SMT boards, hybrids and multi-chip modules(MCM).
- Maintains 50-ohm environment which allows accurate high-frequency measurement of microelectronic modules
- Compliant tips allow probing of non-planar structures
- BeCu tips provide longer probing life and reduce probe damage
- Access contacts close to components, module walls, or other obstructions
More Product Information
-
Ideal for multiport RF/Microwave and high-speed digital signal testing
-
Mix DC and RF/Microwave signals on one probe
-
Long lifetime – typically over one million (1,000,000) touchdowns
-
Excellent performance in temperatures ranging from 10 K to 200°C
-
Probe on any pad material with no damage
-
Superior field confinement reduces unwanted couplings to nearby devices and transmission modes
-
Superior measurement accuracy and repeatability
-
Small scrub minimizes damage to aluminum pad
-
Typical contact resistance < 0. 05 Ω on Al, <0.02Ω on Au
-
Save valuable wafer space and reduce pad parasitics by being able to shrink pad geometries to 25 x 35 µ m (best case)
-
Long holding time: 80 hours with 10 STP liter He-3 gas
-
Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
-
Sample can be loaded or removed when the cryostat is cold
-
Low noise, low vibration
-
Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
-
Sample can be loaded or removed when the cryostat is cold
-
High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
-
Sample probe and a load-lock with gate valve
-
Comprehensive I/O connections: Standard setup of up to 24 RF lines (up to 20 GHz) and 48 DC lines, with extensions to higher I/O connections possible.
-
Non-magnetic construction: Capable of characterizing qubits below 50 mK without magnetic interference when required.
-
Sample size: Proven with chips up to 10×10 mm in size.
-
Pressure-based contact: Connect test and measurement I/O to DUT pads using pressure only. No permanent connection required.
-
Cryogen-free option available
-
Flexible sample space
-
Low noise, low vibration
-
Long holding time
-
Stable He-3 pot temperature
-
Provides an effectively noise free environment around the device under test (DUT)
-
World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
-
Up to 4x faster flicker noise thermal testing on 30 μm pads
-
Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
-
Provides fully managed and filtered AC power to the entire system – prober and instruments
-
Filters harmful noise generated by external thermal control systems
-
Reduced “antenna effect” injection of unwanted RF noise into the measurement path
-
Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
-
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
-
Enables full access to the chuck and the auxiliary sites
-
Intuitive, and precise movement of chuck in X, Y, and Z-direction
-
User-centered design minimizes training costs and enhances efficiency
-
Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000