Anritsu

Since its founding in 1895, Anritsu has been a pioneer in the telecommunications field, marking its 120 years of growth with achievements that include creating the world’ s first practical wireless telephone, which paved the way for today’s smartphones. We would like to express our sincere gratitude to our customers and everyone else who has made this possible.

With its measurement business as the pillar supporting the further advancement of its mobile broadband services, Anritsu offers solutions that are indispensable for building a safer and more secure society in a broad range of fields including quality assurance inspection equipment for foods and pharmaceutical products, remote monitoring and control systems, traffic shapers, and high-speed electronic devices.

Contact Details

US Headquarters

Anritsu Corporation

490 Jarvis Drive 

Morgan Hill, CA 95037-2809

Americas Sales and Support

450 Century Parkway

Suite 190

Allen, TX 75013

Phone (Toll-free/All locations): 1-800-Anritsu (1-800-267-4878) for Sales, Technical and Service

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Products

Anritsu - MA8100A - NEON® Signal Mapper

Anritsu - MA8100A - NEON® Signal Mapper

Integrating NEON’s capability to automatically collect geo-referenced test data with Anritsu handheld spectrum analyzer products saves valuable time and money by
  • Eliminating the need to manually perform "check-ins" at each test point by automatically calculating indoor location
  • Providing vastly more data than is possible with manual processes by recording data with every step
  • Removing typical data recording errors caused by "guesstimating" locations in large buildings through automatic indoor location and path estimation
  • Delivering actionable data in areas not easily analyzed such as stairways and elevators by recording and referencing measurements in 3D
  • Enabling quick analysis of signal coverage and faster problem resolution by delivering the industry’s only geo-referenced 3D visualization
  • Providing color-graded measurement results in 2D and 3D views. Measurement values can be seen by clicking on each point. A .csv file of all measurements is also provided

Anritsu - ME7838A/E/D/G - VectorStar Broadband VNA

Anritsu - ME7838A/E/D/G - VectorStar Broadband VNA

The VectorStar ME7838 Series broadband VNA offers the widest available single frequency sweep from 70 kHz to 110, 125, and 145 GHz with mmWave bands to 1.1 THz.
  • The ME7838A or E version can easily be upgraded to 145 GHz
  • All versions may be configured to include banded millimeter-wave modules up to 1.1 THz
  • Industry-best calibration and measurement stability: 0.1 dB vs 0.6 dB over 24 hrs.
  • All versions support the 3744x-Rx receiver for noise figure measurements, including the ability to characterize differential noise figure, to 125 GHz
  • Compact, lightweight mmWave modules (0.6 lb vs 7+ lbs and 1/50 the volume) offer low cost installation on smaller probe stations.

Anritsu - ME7838A4 - VectorStar 4 Port Broadband VNA

Anritsu - ME7838A4 - VectorStar 4 Port Broadband VNA

The VectorStar ME7838E4, ME7838A4, and ME7838D4 Series broadband VNA offers the widest available 4-port single sweep measurements from 70 kHz to 110, 125, 145, and 150 GHz with mmWave bands up to 1.1 THz
  • The ME7838E4 4-port system sweeps from 70 kHz to 110 GHz
  • The ME7838A4 4-port system sweeps from 70 kHz to 110/125 GHz
  • The ME7838D4 4-port system sweeps from 70 kHz to 145/150 GHz
  • All systems may be configured to include banded millimeter-wave modules up to 1.1 THz
  • Industry-best calibration and measurement stability: 0.1 dB vs 0.6 dB over 24 hrs
  • All systems also supports the 3744x-Rx receiver for noise figure measurements to 125 GHz
  • Compact, lightweight mmWave modules offer low cost installation with industry-best performance

Anritsu - ME7848A - VectorStar™ Opto-Electronic Network Analyzers

Anritsu - ME7848A - VectorStar™ Opto-Electronic Network Analyzers

  • Fast and accurate opto-electronic measurements — The VectorStar ME7848A 200 series ONA enables error-corrected transfer function, group delay, and return loss measurements of E/O and O/E components and subsystems.
  • MN4765B O/E calibration module — The O/E calibration module is a thermally stabilized photodiode reference standard detector that can eliminate drift over temperature. Accurate bias voltage to the photodiode is maintained internally.
  • MN4775A E/O converter — The E/O converter includes a lithium niobate (LiNbO3) modulator stabilized by a fully automatic bias controller and a tunable or fixed wavelength laser source. Excellent converter stability ensures characteristics remain consistent during measurement of opto-electronic DUT detectors and receivers.
  • National Institute of Standards and Technology (NIST) derived characterization — Magnitude and phase characterization of the O/E calibration module is obtained using a primary standard characterized by NIST and held in the Anritsu Calibration Lab.
  • Internal VNA de-embedding for simplified calibration — The built-in application menus provide instructions that guide the user through the set-up and calibrations required for making E/O, O/O, and O/E measurements.
  • Excellent stability and repeatability — Use of full 12-term calibration with de-embedding results in stable and repeatable measurements of opto-electronic devices using the VectorStar VNA.
  • Modularity and upgradeability — The VectorStar ME7848A ONA can be easily modified to a different wavelength by adding the appropriate MN4775A E/O converter and MN4765B O/E calibration detector. The VectorStar ME7838A 100 series can be upgraded to a 200 series by including the appropriate MN4775A E/O converter.

Anritsu - ME7868A - Distributed Modular 2-port Vector Network Analyzer

Anritsu - ME7868A - Distributed Modular 2-port Vector Network Analyzer

  • 2-port VNA with frequency options from 1 MHz to 8 GHz / 20 GHz / 43.5 GHz
  • Extend remote ports 100+ meters apart with PhaseLync synchronization
  • Small and lightweight ports enable direct connection to DUT eliminating long cable runs
  • Guaranteed performance to 43.5 GHz with Extended-K™ ports
  • PC control takes advantage of external computer processing power and functionality
  • No on-board data storage makes use in secure applications more convenient
  • Common ShockLine control software delivers powerful debug and test capabilities

Anritsu - MP1825B - 4 Tap Emphasis

Anritsu - MP1825B - 4 Tap Emphasis

  • 32.1Gbps 4-tap emphasis
  • Jitter transparent for the jitter tolerance test
  • Compact remote head to minimize cable loss and ISI
  • Can be used as a front head with any Pulse Pattern Generator
  • Compensate or inject ISI and DDPWS

Anritsu - MP1861A - 56G/64G bit/s MUX

Anritsu - MP1861A - 56G/64G bit/s MUX

  • 56G/64G bit/s Wide Bandwidth: CEI-56G, 400 GbE, FEC Bit Rate
  • 2:1 MUX, 1:2 DEMUX: Expand 28G/32G 2ch BERT to 56G/64G
  • Compact Remote Head: Reduces DUT connection cable losses
  • Excellent Signal Quality and Rx Sensitivity: High-accuracy measurements of semiconductor chip
    • Intrinsic random jitter 200 fs rms (typ.)
    • Max. variable amplitude output: 3.5 Vp-p
    • Input sensitivity: 25 mV (typ.), single-end, eye height
  • Versatile Signal Integrity Measurement Functions: Supports CEI-56G, 400 GbE tests
    • TJ/DJ/RJ/Bathtub Jitter, Eye Diagram, Eye Margin Auto-measurements
    • Jitter tolerance tests (using MU181500B)
      • Supports generation of SJ, RJ, BUJ, SSC, Dual Tone SJ, Half Period Jitter (Even/Odd Jitter)
      • SJ generation with large amount: 0.55 UI @ fm 250 MHz
    • Crosstalk tests and Skew tolerance using variable data skew by using multi-channel
  • High Expandability
    • Sync pattern generation and BER measurements for up to four channels simultaneously
    • Emphasis signal generation (using MZ1854A, MP1861A 2ch sync, 57.8 Gbit/s)
    • PAM4 signal generation (using MZ1854A, MP1861A 2ch sync, 56.2 Gbit/s)
  • Supports burst signal test
  • Max. 512 Mbit/ch programmable data pattern
  • Auto PPG-to-MUX phase adjustment at bit rate change using auto-alignment function

Anritsu - MP1862A - 56G/64G bit/s DEMUX

Anritsu - MP1862A - 56G/64G bit/s DEMUX

  • 56G/64G bit/s Wide Bandwidth: CEI-56G, 400 GbE, FEC bit rate
  • 2:1 MUX, 1:2 DEMUX: Expand 28G/32G 2ch BERT to 56G/64G
  • Compact Remote Head: Reduces DUT connection cable losses
  • Excellent Signal Quality and Rx Sensitivity: High-accuracy measurements of semiconductor chip
    • Intrinsic Random Jitter 200 fs rms (typ.)
    • Max. variable amplitude output: 3.5 Vp-p
    • Input sensitivity: 25 mV (typ.), single-end, eye height
  • Versatile Signal Integrity Measurement Functions: Supports CEI-56G, 400 GbE tests
    • TJ/DJ/RJ/Bathtub Jitter, Eye Diagram, Eye Margin Auto-measurements
    • Jitter tolerance tests (using MU181500B)
      • Supports SJ, RJ, BUJ, SSC, Dual Tone SJ, Half Period Jitter (Even/Odd Jitter)
      • SJ generation with large amount: 0.55 UI @ fm 250 MHz
    • Crosstalk tests using variable data skew by using multi-channel
  • High Expandability
    • Sync pattern generation and BER measurements for up to four channels simultaneously
    • Emphasis signal generation (using MZ1854A, MP1861A 2ch sync, 57.8 Gbit/s)
    • PAM4 signal generation (using MZ1854A, MP1861A 2ch sync, 56.2 Gbit/s)
    • Supports burst signal test
    • Max. 512 Mbit/ch programmable data pattern
    • Auto PPG-to-MUX phase adjustment at bit rate change using auto-alignment function

Anritsu - MP1900A - Signal Quality Analyzer-R

Anritsu - MP1900A - Signal Quality Analyzer-R

MP1900A series is an 8-slot modular, high-performance BERT supporting all-in-one Physical layer measurements of both high-speed network interfaces as NRZ and PAM4, and PCI Express/USB, bus interfaces

Anritsu - MP2100B - BERTWave™ (10G BERT,Sampling Oscilloscope)

Anritsu - MP2100B - BERTWave™ (10G BERT,Sampling Oscilloscope)

  • Built-in 4ch BERT and sampling oscilloscope
  • Simultaneous 4ch Bit Error Rate (BER) measurements
  • High-quality waveform PPG (1 ps rms Jitter)
  • High-input sensitivity (10 mVp-p minimum input sensitivity)
  • High-speed Eye Mask test and Eye pattern analysis at 150 ksample/s max.
  • Supports differential signal BER measurement, Eye Mask test and Eye pattern analysis
  • Up to six built-in Bessel filters for full-featured application support
  • Compact (18 cm deep) test set for optical module evaluation
  • Simultaneous measurement of BER, Jitter, Eye pattern and Eye Mask
  • Supports WDP measurements
  • Calculates optimum values for sampling simultaneously with equalizer and emphasis values to display Eye Pattern
  • Simultaneous Eye Pattern, Eye Mask and Jitter measurements of simulated waveform

Anritsu - MP2110A - BERTWave™ (100G BERT,Sampling Oscilloscope)

Anritsu - MP2110A - BERTWave™ (100G BERT,Sampling Oscilloscope)

For 100/200/400G Multichannel Optical Module/Device R&D and Manufacturing
All-in-One BERT and Sampling Oscilloscope

Anritsu - MS2024B - VNA Master

Anritsu - MS2024B - VNA Master

VNA Master (500 kHz to 4 GHz)
  • 2-port, 1-path Vector Network Analyzer (VNA)
  • Intuitive Graphical User Interface (GUI) with convenient Touch Screen
  • Outstanding calibration stability
  • User-defined overlays for viewing multiple S-Parameters
  • Exceptional RF immunity
  • IF Bandwidth selections of 10 Hz to 100 kHz
  • 100 dB Transmission Dynamic Range
  • 850 µs/data point sweep speed
  • Internal Bias Tee option
  • Vector Voltmeter option, ideal for cable phase matching
  • Standard three-year warranty (battery one-year warranty)

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