support of many programmable devices, e.g. eMMC, NOR and NAND, CPLDs, FPGAs programming interfaces e.g. SPI, SWD, I2C, JTAG, UART, DAP support of data streaming for flexible programming data handling real parallel high-speed programming FlashFOX® master unit with up to 8 high-speed programming channels to the POD very compact POD unit for easy integration into ATE systems simple adaptation to existing systems on the hardware side API available for easy software integration in existing systems suitable for industrial use in 24/7 operation anti-piracy protection (security)

SCANBOOSTER II controller for Embedded Testing and Programming high flexibility through multifunctional I/O channels for mixed-signal tests ·  modularity and scalability due to configurable TAP Interface Cards integrated compact unit controllable via USB 2.0 and GBit-LAN PicoTAP ATE Controller for embedded testing and programming Low-cost module with high performance and multifunctional architecture available in a housing or as a PCBA for spacesaving installation in the test system integrated compact unit controllable via USB 2.0

SCANFLEX II CUBE is the new generation modular JTAG/Boundary Scan controller. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform. 8 independent and parallel Test Access Ports (TAP) for up to 100 MHz Synchronized operation of embedded test, debugging and programming Programmable multifunctional 64 channel I/O signal unit Programmable TAP protocols for numerous processor debug interfaces Support of up to 31 parallel controlled SCANFLEX I/O modules Controllable via USB 3.0 and GBit LAN