Goepel - SCANBOOSTER II Multifunctional JTAG/Boundary Scan Controller
SCANBOOSTER II
- controller for Embedded Testing and Programming
- high flexibility through multifunctional I/O channels for mixed-signal tests ·
- modularity and scalability due to configurable TAP Interface Cards
- integrated compact unit controllable via USB 2.0 and GBit-LAN
PicoTAP ATE
- Controller for embedded testing and programming
- Low-cost module with high performance and multifunctional architecture
- available in a housing or as a PCBA for spacesaving installation in the test system
- integrated compact unit controllable via USB 2.0
SCANBOOSTER II
If you are looking for a compact yet powerful module to enter the world of Embedded JTAG Solutions, SCANBOOSTER II is the perfect choice. The latest generation of the JTAG/Boundary Scan controller offers almost unlimited possibilities to combine state-of-the-art embedded technologies: for testing, validation, debugging or programming.
The SCANBOOSTER II complements the existing range of SCANFLEX II solutions with a stand-alone product range in the low and medium power range and is used for JTAG/Boundary Scan test, (C)PLD/FPGA programming and conditionally for in-system programming of FLASH components such as NAND, NOR, SPI, I²C and eMMC.
PicoTAP ATE
The PicoTAP ATE is an ultra-compact JTAG/Boundary Scan controller for use in the laboratory and production. The small controller is a flexibly configurable compact unit that supports a variety of so-called embedded access technologies. Embedded instruments in hardware design are used to test and program complex boards with greatly reduced physical access. It is ideally suited for integration into various test systems.
The PicoTAP ATE is available in two versions, without housing as an industrial version and with housing as a desktop version.
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SCANBOOSTER II |
PicoTAP ATE |
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|---|---|---|
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Power Supply |
5,0 V via power supply unit | 5,0 V via USB connector |
|
Control Interface |
Gbit LAN and USB 2.0 | USB 2.0 |
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Maximum TCK Frequency |
16 MHz | 15 MHz (no continuous bursts) |
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Number of TAP Slots |
2 | 1 |
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TIC Modules |
||
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Internally available TIC modules (Test bus Vout and Vin depend on the selected TIC) |
SFX II TIC01/LX SFX II TIC01 SFX II TIC01/VX SFX II TIC120/LX SFX II TEM(/ISO) |
Typ TIC020 (permanently mounted, test bus Vout: 1,2 V - 3,6 V and Vin: 0,0 V - 3,0 V (programmable)) |
|
Externally available TIC modules (SFX II TEM or SFX II TEM/ISO required, Test bus Vout and Vin depend on the selected TIC) |
TIC02/S(R) (also available as a variant with an extended temperature range) TIC03/ACP TIC022/SR (also available as a variant with an extended temperature range) TIC022-MUX/SR TIC022-HVPGR/SR TIC122/S(R) SFX II TIC422/S(R) |
|
|
SFX/LS Interface |
None | None |
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Number of SFX I/O Modules |
on controller: 0 external: 0 | on controller: 0 external: 0 |
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Number of MPP I/O MPP Groups |
32 / 4 (each group has 8 pins and the Vio can be programmed from 0.9 V - 3.6 V) | 0 / 0 |
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MPP Connector Type |
40-pin male connector with 2,54 mm pitch | none |
|
rAdditional resources for UUT or user |
depending on the TIC module, further resources may be available | 4 AUX signals |
|
Further Software Features |
ADYCS (Active Delay Compensation - Technology to compensate for signal delays) | |
Compatibility SCANFLEX II
Due to the optimized price/performance ratio, the modules can also be used in very cost-sensitive applications, with full support from the integrated JTAG/Boundary Scan software platform SYSTEM CASCON. Due to its compatibility with the more powerful SCANFLEX II platform, the test programs can be transferred directly.
More Product Information
RAPIDO is a multi-site programmer for inline programming and testing.
Are you developing your next electronic assembly and are dealing with "test and programming" concerns?
Your complex boards feature difficult to contact fine-pitch components (e.g. BGA, FPGA) while test and programming still must be efficient?
RAPIDO is an outstanding, "lightning-fast" solution for programming and test using embedded system access (ESA) technologies. Special mechanics ensure precise board contacting from both sides, even for high probe counts.
The system can easily be integrated into a production line, keeping up even with high-volume manufacturing cycle times.
SCANFLEX II CUBE is the new generation modular JTAG/Boundary Scan controller. Based on the latest multi-core processors and FPGAs, SCANFLEX II CUBE opens new ways for the Embedded JTAG Solutions. The multifunctional architecture of the SCANFLEX II CUBE allows users to combine numerous technologies flexibly and with high performance on a single platform.
- 8 independent and parallel Test Access Ports (TAP) for up to 100 MHz
- Synchronized operation of embedded test, debugging and programming
- Programmable multifunctional 64 channel I/O signal unit
- Programmable TAP protocols for numerous processor debug interfaces
- Support of up to 31 parallel controlled SCANFLEX I/O modules
- Controllable via USB 3.0 and GBit LAN
- a fully integrated software platform
- maximum productivity due to intelligent tools
- maximum safety for the test vectors
- extended test depth for non-scannable circuitry
- combination of state-of-the-art test and programming strategies
- deep interaction and integration capability for other ATEs
- maximum modularity and scalability
- personalisation of the entire system (myCASCON)
- support during the entire product life cycle
- a portfolio containing more than 100 software tools and edition
The BARCUDA VP230 is the right system if you are looking for a complete turnkey solution for flexible testing and programming of your electronic assemblies. The stand-alone unit uses the technologies of embedded JTAG solutions such as VarioTAP or ChipVORX. However, you can also expand these to meet the functional test requirements of your electronics production.
With BARCUDA VP230 you can test and program assemblies with or without JTAG/Boundary Scan - with no need to configure a special in-house test system.
With a standard, robust interface "VPC G12 Receiver" from Virginia Panel Corporation (VPC), you can choose the adapter supplier (for needle bed adapters) for contacting your assembly and implement any mechanical requirements.
BARCUDA VP230 is equipped with a complete power-up unit and TAP control for 16 boards, which can be scaled up to 32 boards. It can also be expanded with analogue measurement cards, additional I/O channels and your specific hardware.
JULIET is a professional JTAG / Boundary Scan Tester suitable for production. It combines the complete system electronics together with the adaptation of the UUT via an exchangeable adaptor in a compact system.
The JULIET testers are based on standard components like SYSTEM CASCON™, SCANBOOSTER™, and SCANFLEX® II, hence they are compatible to systems already used in development, and flexibly upgradable. A total of six different JULIET versions cover all possible production applications, from the simple test execution to the complete repair station with graphical failure visualisation, and make the system ideal for fast prototyping and low volume production.
- support of many programmable devices, e.g. eMMC, NOR and NAND, CPLDs, FPGAs
- programming interfaces e.g. SPI, SWD, I2C, JTAG, UART, DAP
- support of data streaming for flexible programming data handling
- real parallel high-speed programming
- FlashFOX® master unit with up to 8 high-speed programming channels to the POD
- very compact POD unit for easy integration into ATE systems
- simple adaptation to existing systems on the hardware side
- API available for easy software integration in existing systems
- suitable for industrial use in 24/7 operation
- anti-piracy protection (security)
SCANBOOSTER II
- controller for Embedded Testing and Programming
- high flexibility through multifunctional I/O channels for mixed-signal tests ·
- modularity and scalability due to configurable TAP Interface Cards
- integrated compact unit controllable via USB 2.0 and GBit-LAN
PicoTAP ATE
- Controller for embedded testing and programming
- Low-cost module with high performance and multifunctional architecture
- available in a housing or as a PCBA for spacesaving installation in the test system
- integrated compact unit controllable via USB 2.0
Goepel Electronics
Website
With advanced testing and inspection systems for electronic assemblies and printed circuit boards, GÖPEL electronic helps discerning customers from various industry sectors to maintain their commitment to quality.
The company’s wide range of technology provides a basis for finding manufacturing defects at every stage of the product life cycle – from design to end-of-line.
