Optical Test Equipment
Products
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High Port Count
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Rapid Switching Time at 30 ms
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Low Insertion Loss (< 1.5 dB)
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Low Wavelength Dependent Loss (< 0.3 dB)
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O, C and L band operation
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USB 2.0 Interface
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Verify quality of optical fiber cable assemblies, connectors and short-run networks
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Troubleshoot and distinguish between macro-bends, splices, connectors and breaks
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Locate insertion loss points – save hours of troubleshooting time
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Verify return loss of multiple points in a fiber assembly or harness simultaneously
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Verify and maintain aircraft and shipboard networks
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Customize GUI for automated pass/fail verification of your fiber assembly using software development kit
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Ultra-high resolution (10 μm sampling) reflectometer with “zero dead zone”.
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Measure RL, IL, distributed loss, length, polarization states, phase derivative and group delay
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80 dB dynamic range
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Backscatter-level sensitivity (-130 dB)
Industry-leading combination of measurement speed, range, accuracy and resolution
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12 Hz acquisition rate
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8.5 meter measurement range
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0.0034% time-of-flight delay accuracy
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20 micron sampling resolution
Streamlined user interface and Software Development Kit (SDK) included
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Optimize throughput with customized interface
Automatically locates reflective events and yields RL, IL and event location
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Multi-channel (or single-channel) measurements of strain-multiplex: Over 300,000 measurement locations
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Flexible, lightweight and easy to install sensors reduce time to first measurement
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Passive, corrosion resistant, dielectric, flexible sensors go where other sensors can’t – in bends, around corners, embedded inside materials
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Long sensor life – no drift or recalibration required, cycle counts >107
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Large strain range and high resolution allow for mapping of complex strain fields and large strain gradients
The OVA simultaneously performs these optical component characterizations every 3 seconds:
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Insertion Loss (IL)
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Return Loss (RL)
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Polarization Dependent Loss (PDL)
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Phase Response
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Group Delay (GD)
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Chromatic Dispersion (CD)
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Polarization Mode Dispersion (PMD) / Second Order PMD
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Min/Max Loss due to Polarization
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Impulse Response
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Jones Matrix Elements
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Phase Ripple – Linear and Quadratic
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Full C-band tunability
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Integrated wavemeter with sub-picometer accuracy
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Smooth, linear scans
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Narrow linewidth, low noise
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External triggering
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2 optical detectors and data acquisition channels
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Industry leading wavelength accuracy and resolution
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USB interface and full complement of software drivers
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Full C-band tunability
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Smooth, linear scans
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Narrow linewidth, low noise
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Wavelength calibration in seconds
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Integrated wavelength and power monitors
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External triggering
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2 optical detectors and data acquisition channels
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Industry leading wavelength accuracy and resolution