SlimVue Microscope

• Combined eye-pieces and CCD camera mount
• 3x zoom and quick lens exchange
• Quick lens exchange
• 1 um optical resolution
• Minimized scope footprint
• Fast change from navigation optics to high-resolution optics
• Resolving ‹ 50 μm pads
• Simple integration with any mmW modules

Application Specific Sigma Kits

• Engraved guides on mmW platen
• Supports broadband, load pull, coax RF and banded waveguide configuration
• Optical feedback on platen position (gauge)
• Adaptable to any mmW/sub-THz applications
• Seamless integration with any mmW modules and tuners
• Fast mounting and setup change

THz measurement capability

• Rock-solid mechanical design
• Submicron stage accuracy
• Optical feedback on platen and probe position (gauge)
• Motorized positioner
• <+-1 um separation repeatability
• Micrometer-accurate and repeatable probe placement and overtravel
• Highly-precise and stable THz measurements

• A real-time diagnostic tool supports EMC/EMI debugging. 
• Fast visualize EMC/EMI problems. 
• Enables easy comparison of countermeasures before and after. 
• Capable of measurement from entire products to single components. 
• Factor-editor function provides correction of antenna characteristics, cable loss and preamplifier. 
• User friendly compact design. 
• Customer supplied spectrum and probes acceptable (Please consult)

• Solve machine vision applications efficiently by constructing flowcharts instead of writing program code, using field-proven tools for analyzing, classifying, locating, measuring, reading and verifying
• Use a single program for creating both application logic and operator interface
• Leverage deep learning for visual inspection through image classification and segmentation tools
• Rely on a common underlying vision library for the same results with an Iris GTX smart camera, vision systems or third-part computer
• Work with multiple cameras all within the same project or per project running concurrently and independently from one another, platform permitting
• Interface to Zebra AltiZ and third party 3D sensors to visualize, process and analyze depth maps and point clouds
• Communication options include discrete Zebra I/Os, RS-232, and Ethernet (TCP/IP, CC-Link IE Field Basic, EtherNet/IP, Modbus, OPC UA, and PROFINET, and native robot interfaces)
• Maximize productivity with instant feedback on image analysis and processing operations
• Receive immediate pertinent assistance through an integrated contextual guide
• Maintain control and independence through the ability to create custom flowchart steps
• Test communication with PLC using the built-in PLC interface emulator
• Protect against inappropriate changes with the Project Change Validator tool

This model is for carrying out a high pressure noise test of individual automotive manufacturers' demands. It simulates representative high voltage noise of HV and EV.

• Single-phase 3 wire 
• AC85 - 240V16A 
• 50/60Hz 
• DC125V16A 
• Pulse: ~ 500V 50kHz (option)

The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices. 

In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35).NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test. 

• A TEM horn antenna compliant with IEC 61000-4-39 Ed.1. 
• Test without changing the antenna in the frequency range of 380MHz to 6GHz. 
• Low VSWR and high GAIN enable efficient electromagnetic wave radiation. 
• Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT. 
• Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.

Three Probe Technologies

• Infinity Probe: best for Al (Si)
• ACP Probe: best for AU (III-Vs)
• |Z| Probe: robust solution (long lifetime)
• Precision contact on a wide variety of materials from 26 GHz to 67 GHz
• Accurate results with excellent crosstalk
• Matching cables and substrates included

Precise Contact Solution

• RF chuck ±3 μm surface planarity
• Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
• Precision probe alignment
• Consistent contact force and overtravel
• Stable contact performance

WinCal Calibration Software

• Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
• Automated calibration monitoring
• Unique measurement & analysis methods
• Accurate S-parameter measurements
• Automatic calibration setup for higher efficiency
• Fast and easy data interpretation and reporting

Reproduces transient voltage surge phenomena generated in a vehicle and evaluates the immune resistibility of DUT against the surge. The output waveforms are five as high-repeating pulse, giant pulse, field decay pulse, trapezoidal waveform + high-repeating pulse and high repeating pulse + giant pulse.