NoiseKen - Thin Plate Broadband Antenna
Thin plate broadband antenna has been developed for efficient immunity testing against hand-held transmitters and cellular phones. Many pieces of spot frequency antennas had to be used in turn thus fur. This new Thin-plate Broadband Antenna is a single antenna solution eliminating the need for antenna changes and dramatically reducing the test time. Furthermore, this antenna with its small-size and lightweight properties and a flexible handle is suitable for testing in narrow spaces.
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A wide frequency range eliminating the need for antenna changes
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30W maximum power input allows high filed strengths
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High efficiency due to a low VSWR and high gain
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Suitable for broadband digital modulation thanks to a good VSWR flatness
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Small, light-weight and flat antenna easy to use in narrow spaces
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Easy handling with a flexible arm
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A wide radiation pattern makes directivity of the fields no longer an issue
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Model |
NKU07M32G |
NKU2460G |
|---|---|---|
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Frequency Range |
(660) 700 MHz ～ 3.2 GHz |
2.4 GHz ～ 6 GHz |
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VSWR |
≦ 2 |
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Maximum Power Input |
20 W (continuous) 30 W (continuous 10 minutes) |
10 W (CW) |
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Input Impedance |
50 Ω |
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Connector |
SMA(J) |
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Dimensions |
W50mm × D8mm × H186 mm (protrusions excluded) |
W35mm × D10mm × H108 mm (protrusions excluded) |
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Weight |
73.5g |
20 g |
VSWR
Antenna and Dedicated Flexible Antenna Handle
SYSTEM CONFIGURATION EXAMPLE
APPLICATION
In-vehicle testing (ISO 11451-3 Ed.4: On-board transmitter)
Testing for automotive electronics (ISO 11452-9 Ed.2: Portable transmitter)
More Product Information
Safran’s SEEING™ 130 Wide includes a unique medium focal length catadioptric optics, limited by diffraction only and with ultra-low distortion, offering perfect imaging over 35 mm full-frame image format. It is fitted with a 10megapixel sensor.
SEEING™ 130 Wide enables high Signal to Noise Ratio for multispectral (MS), hyperspectral (HS) and low light level imaging. SEEING™ 130 Wide includes a spectral filter with 23 bands covering Blue, Green, Red, Near InfraRed and Red Edge MS, for a broad spectral range between 475 and 900nm. SEEING™ 130 Wide has a large Field of View of 6.3° x 4.3° / 54 x 36 km2 from a 500km/310 miles orbit.
In addition to its a thermal design within a robust structure, SEEING™ 130 Wide has a low SWaP, saving launch and operational costs.
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Safe and convenient integration kits to support T.I.P.S. “LuPo” High Voltage / High Power Probe Cards
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Prevent thin wafers from curling and breaking
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Safety interlock system with clear enclosure for operator safety during device measurements
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Convenient connection kits for easy and safe system integration with power device analyzers from Keysight Technologies and major suppliers
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Up to 25% lower air consumption (CDA) than other systems in the market (300l/min) with no compromise in transition times
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Windows 10 compatibility enables highest performance and safe operation with state-of-the-art hardware
See more Key Features on Specifications & Details tab
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Power bypass inductance: 8 nH
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Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
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Supports collinear and non-standard needle configurations
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Up to 16 DC for standard; maximum of 24 DC for custom
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
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Proven technology: designed in conjunction with several top STM groups in the world
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Quiet, low vibration operation
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Low running costs and reduced maintenance
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Easy operation and fast cool-down; load sample when the system is cold for TL models
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Calibrated RuO and CMN thermometry read by model 372S resistance bridge are installed on the mixing chamber plate
Customers can leverage our multi-tier approach to customization to reduce engineering costs.
- Our adaptable Build-to-Order (BTO) system provides for very short lead times and allows a product to be configured from a large set of predetermined parameters, with hundreds of thousands of BTO combinations available. BTO products are indicated in the product data-sheet and are shipped within 1-3 weeks, depending on the product.
- Our Semi-Custom products require some additional design and documentation effort but can be a smart choice when more flexibility is required.
- Lastly, a full Custom product can be developed when your budget and time frame allows. This option supplies you with a fully custom-designed and built lighting solution that will be engineered to fit your exact machine vision needs.
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Built for extreme environments, our IP69K certified lights are specifically engineered to withstand everything from prolonged liquid immersion to high-pressure steam cleaning.
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Crevice-free design with smooth-bodied surfaces to diminish the chance of material buildup while improving its ease of cleaning.
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Proprietary nickel finish for vastly improved corrosion protection and engineered with thermal management in mind – housing is 11X more thermally conductive than stainless steel.
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Advanced MicroVac chuck surface for minimum contact resistance between wafer and chuck
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Safety-rated interlock system for high-power testing (meets EN 60947-5-1, EN 60204-1)
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Supports fully automated testing up to 10kV by eliminating arcing point
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Full wafer access via locking roll-out stage
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Coaxial, triaxial, and pin jack feed-troughs available
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Convenient instrument connection kits
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Load/unload wafer to hot/cold chuck (-60° C to +300° C)
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Up to 15% faster transition times than other systems in the market
See more Key Features on Specifications & Details tab
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Full-radius, nickel-plated tungsten needles
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Power bypass inductance: 16 nH
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Supports collinear and non-standard needle configurations
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Support up to a maximum of 12 ceramic blades DC needles / contacts
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
NoiseKen
For over 40 years from its foundation in 1975, Noise Laboratory has been focusing on immunity test equipment and related solutions.
Now their product lines include various types of immunity test equipment ranging from those conforming to IEC 61000-4 series standards, other international or national immunity standards and even to customer's in-house test standards.
Contact Details
Shinyei Corporation of America Head Office - Sole Authorized distributor of NoiseKen products
1120 Avenue of the Americas, 4th Floor, New York, NY 10036, USA
Phone: 917-484-7884
Fax: 212-704-4206
Test & Measurement
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