• The RL36120 is characterized as a Large Aimed Bright Field ring light. 
• Precisely aimed LEDs provide a level of lighting control not found in traditional illuminators. 
• A range of standoffs and fields of view may be specified at the time of order. 
• The ring light is available in a wide range of wavelengths from UV to IR, including a 3 channel RGB version. Diffuser and polarizer options are also available. 
• The large inner diameter of the ring light can accommodate lenses up to 55mm in diameter. 
• The light can also be ordered with an optional mounting ring.

The LN112-30 Lens Adaptor is used for creating a 30° focused beam spread when attached to a SL112 or SL162.

• Guaranteed performance to 43.5 GHz with Extended K™ ports
• High output power allows measurement of high attenuation devices
• Wide dynamic range enables measurement of very low reflection artifacts
• Excellent corrected directivity minimizes measurement uncertainty
• SmartCal™ auto calibration unit reduces calibration and setup time
• Time domain with time gating option grants easier and faster fault identification
• Modern LAN interface for remote control is faster than GPIB
• A common GUI and SCPI interface within the ShockLine family
• Bias tee option simplifies test setups where the DUT needs DC biasing
• Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction
• E-Band VNA
  • Extended frequency range covering E-band and major parts of V band
  • Fully assembled test system eliminates setup errors and increases reliability
  • Tethered modules connect directly to the DUT increasing measurement stability

• IRIG’s A and B and NASA 36 time code inputs
• +3.3V or +5V signalling
• 1PPS Sync input
• External Event (Time Tag) input
• Three programmable pulse rate outputs
• Match Time output
• Industrial Temperature Range option
• Optional on-board GPS option
• Optional HaveQuick input/output
• Optional IRIG B time code output

AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

• Repeatable high product quality due to automated production processes
• Highest reproducibility of beam quality
• Optical output power up to 40 mW
• Wavelengths from 640 nm - 685 nm
• Fixed focus
• IP 50 (optional IP 67)

The ZX10 is a compact high-performance laser module developed for industrial image processing applications. In automated production, a 14-axis robot precisely aligns all optical components, resulting in exceptional beam quality with a boresight error of less than 0.8 mrad. Depending on the application, the laser is available in red or infrared wavelengths and can be flexibly adapted to customer-specific requirements. With its rugged industrial design and high power stability, the ZX10 is particularly suited for use in sensors, testing devices, and machinery. Setting new benchmarks in precision and reliability, it is a trusted choice for advanced machine vision systems.

• Comprehensive Test Solutions - Our CTS 4.0 Series offers complete test solutions for emissions and immunity compliance testing of AC and DC power products, ensuring your products are ready for global markets.
• Single & Three Phase Operation - Offers flexibility
• Direct PC Bus Access - Provides high sampling rate and resolution for accurate measurements and high-speed data transfers
• PC-Based Harmonic & Flicker Testing - Provides real-time full-color data display updates and continuous PASS/FAIL monitoring
• Supports Global Standards - Supports European and Japanese standards
• Easy To Use Interface - Provides IEC test setup, data analysis, display, MS Word test reports, and data files generated in MS Excel format
• High Resolution - Data storage to disk for post-acquisition analysis and reporting
• Single Step - Single Step and Fast Forward replay of recorded test data at 200 mSec

• 8 Independent Channels, 2 Output Connectors 
• Includes built-in pre-programmed sequencing. 
• Provides control for computational imaging, including photometric stereo, extended depth of field, combined bright field + dark field, high dynamic range, and high resolution color. 
• Ideal for multi-channel lights and multi-light stations. Due to power output constraints, some configurable light lengths may be limited. 
• Housed within a compact enclosure with DIN rail mounting. 
• Driven with SignaTech™ for improved safety and easy operation. 

NOTE: NOT COMPATIBLE WITH C1 CONNECTORS

• The Narrow Linear Diffuse Light series is ideal for precision scanning of highly reflective materials. 
• The DL151 is available in a wide range of wavelengths and provides up to 28kLux at a 1” (25mm) standoff. 
• The extruded aluminum enclosure can be expanded in 2″ (51mm) increments from 2″ to 70″ (1778mm).