• IRIG A & B, NASA 36 and 1 PPS inputs 
• HaveQuick sync option 
• Propagation delay compensation 
• Zero latency time reads 
• Match time output 
• External event time tags 
• Three user programmable rates 
• Conduction cooled

STAR (EWC15-NG) is a new generation of transceiver for high performance Telemetry, Tracking & Command (TT&C) services. It inherits from the EWC15 products, that have been used in key space missions such as ROSETTA, DEEP IMPACT, PARASOL, MICROSCOPE.

• SPA available from 70KHz to 20/40/70/110/125/145 and 220GHz. Also available for banded configuration to 1.1THz.
• Dual SPA mode available: suitable for Mixers/Amplifier/ Harmonics /Spurious testing.
• SPA available on all ports. User can define which port to use as SPA port.
• Several detection types available in classical mode: Peak, minimum, RMS, Mean.
• Various math functions can be applied on SPA mode like Min hold/max hold/ user defined equations.
• Sources and receivers can be independently configured. Can be used as Tracking Generator.
• For units that have a dual source, a dual drive option is available. Support for external source control also possible.
• Phase synchronization for units with Dual source available. This feature allows users to control and configure the phase between the two sources.
• Source and receiver attenuator available with VNA can be activated in SPA mode. Recommendation to use option 62 (with attenuator on receiver side) for measuring the spectrum content of high-power devices.
• Software option: easy to install and upgrade existing user equipment.

Linea line scan cameras deliver the performance and features usually found in high-end cameras at an attractive price point. Based on advanced CMOS line scan technology, Linea GigE cameras have a 2k or 4k single line 7.04 µm x 7.04 µm pixel array. With excellent sensitivity and speed, Linea surpasses the requirements of demanding applications —such as materials grading and inspection, transportation safety, and general purpose machine vision.

OptoVue

• Revolutionary technology advancement for wafer and die-level photonics probing
• Real-time in-situ calibrations
• Singulated die testing
• True die-level edge coupling
• In-situ power measurements
• Advanced calibration technologies
• Enables autonomous measurements

Horizontal Die-Level Edge Coupling

• Highest accuracy in test results
• Lowest coupling loss
• Repeatable measurement results due to exclusive automated fiber-to-facet alignment technology
• Reduced risk of damaging fibers with collision avoidance technology
• Ease of use for less experienced users
• Enables close simulation of real-world conditions with device performance closest to the final application

See "Specifications & Details" tab for more key features

• Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
• Guarantees fully-guarded measurements to fA and fF levels
• Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
• Allows probing of different pad materials and sizes
• Fast replacement of worn probes without the need for tools

• This ultra high intensity line light series is built to handle the most extreme line scan lighting requirements. 
• Provides an intensity level of 2,100 klx (working distance of 75 mm). 
• Pre-engineered for expandability in 150 mm (6”) increments up to 2400 mm (94.5”). 
• Available in multiple wavelengths. 
• In the event of abnormally high ambient temperatures, the device automatically shuts down when the housing reaches 60°C and resumes operation at 56°C. 

Note: Requires third party power supplies – refer to spec sheet.