FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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- Ruggedized
- Flight Qualified
- Available with vibration-isolated OCXO or CSAC Oscillator options
- Gigabit Ethernet
- GNSS, SAASM, or M-Code supported
- Designed for GPS denied environments
- This DCS Series Controller provides Lighting Control Flexibility in a slim 112 mm x 124 mm x 23 mm package.
- Plug-n-Play compatibility with Ai lighting Products, featuring SignaTech™ technology.
- Seamless switching from continuous-on to gated on/off and strobe overdrive; 3 independently configurable trigger inputs.
- Din-rail mount, UL 508a Panel listed and GUI, Web Browser or command line setup and control tools, SDK.
- 1 output, 3 channels – designed to drive multi-channel RGB / segment lights, as well as single higher current draw lights.
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Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
Image optimization features:
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Auto gain (manual gain control: 0 to 33 dB)
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Auto exposure (manual exposure control: 15 µs to 26.8 s)
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Auto white balance (GT4905C only)
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Binning (horizontal and vertical)
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Color correction, hue, saturation (GT4905C only)
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Column defect masking
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Decimation X/Y
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Gamma correction
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Three look-up tables (LUTs)
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Region of interest (ROI), separate ROI for auto features
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Reverse X/Y
Camera control features:
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EF lens control (order option -18)
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Event channel
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Image chunk data
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IEEE 1588 Precision Time Protocol (PTP)
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RS232
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Storable user sets
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StreamBytesPerSecond (bandwidth control)
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Stream hold
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Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
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Tap mode switchable in Vimba Viewer 2.0 or later (four-tap, one-tap)
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Temperature monitoring (main board and sensor board)
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Trigger over Ethernet (ToE) Action Commands
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
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Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements
- The RL113 High Intensity Bright Field ring light offers a very wide array of wavelengths from UV to IR.
- With intensities of up to 45.5kLux at 12” (300mm), the RL113 is particularly well suited to longer working distances.
- A rugged, heavy enclosure, compliant with IP67 requirements, is well suited to demanding environments.
Next Generation Wafer Probing
- Continues the Infinity family’s Industry leading electrical performance
- High temperature capability (175° C +) for automotive device characterization and other applications
- Better tip visibility for enhanced placement accuracy and repeatability
- Improved tip life/durability with solid rhodium contacts
- New tip architecture enables support for narrower pitches (e.g. 25um)
- Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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