• Revolutionary technology advancement for wafer and die-level photonics probing
• Real-time in-situ calibrations
• Singulated die testing
• True die-level edge coupling
• In-situ power measurements
• Advanced calibration technologies
• Enables autonomous measurements

See "Specifications & Details" tab for more key features

• Enables wafer probing up to 100 A pulsed and 10A DC
• Innovative multi-fingertip design provides even distribution of current
• Supports up to 500 V
• Replaceable Tungsten probe tips
• Temperature range of -60°C to 300°C
• Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
• Prevents against thermal runaway
• Measure devices on wafer at higher currents than ever before
• Small scrub minimizes damage to aluminum pad
• Small footprint – tip fits on a 1 mm pad

• The RL127 is characterized as a Large High Dispersion Bright Field ring light. 
• Non-lensed LEDs disperse light at broad angles, providing “soft” lighting for applications that require short to medium working distances. 
• The low-profile design is only .75” (19mm) thick, with an O.D. of 4.6” (117mm) and I.D. of 2.61” (66.3mm) allowing it to be used in space constrained applications. 
• The I.D. provides a standard 67mm diameter thread with a pitch of .75mm for further mounting flexibility. 
• A wide variety of wavelengths are available from UV to IR. An optional polarizer and/or diffuser may be used to further condition the light output. 
• The RL121 delivers 20kLux at a working distance of 100mm.

• The RL3940 is characterized as a Folded Beam Dark Field ring light. 
• Precisely aimed LEDs, along with an aluminum beam folder, provide a specific and repeatable light pattern on the imaging plane. 
• The light provides up to 11kLux at a working distance of .6” (15mm). 
• The RL3940 is available in a wide range of wavelengths from UV to IR. 
• The folded-beam configuration provides dark field illumination in a compact 3.9” (100mm) housing. 
• The housing’s large inner diameter can accommodate lenses up to 55mm in diameter. 
• The light can also be ordered with an optional mounting ring.

Cryogenic Temperatures

• Fully isolated experiment space for true 4K temperatures during probing
• Cryogenic positioners to provide large travel ranges without warming up the device
• Integrated helium pot for high temperature stability of the device under test
• Fully dry cryogen-free cooler eliminates the need for expensive helium circulation systems
• Rapid cool liquid nitrogen option for faster cool down times

See "Specifications & Details" tab for more key features

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements

Next Generation Wafer Probing

• Continues the Infinity family’s Industry leading electrical performance
• High temperature capability (175° C +) for automotive device characterization and other applications
• Better tip visibility for enhanced placement accuracy and repeatability
• Improved tip life/durability with solid rhodium contacts
• New tip architecture enables support for narrower pitches (e.g. 25um)
• Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness

• High Intensity: up to 9x brighter than the existing SL191 Pattern Projecting Spot Light and more than 3x brighter than the leading competitive structured light projector. 
• Projection patterns are easily configured with available reticles, including line, grid, cross, multiple lines, and half sphere, with custom reticles available. 
• Customizable: available in multiple wavelengths, including white. 
• Constructed with a large heat sink for improved LED thermal management to facilitate increased brightness while maintaining safe operating temperatures. 
• Ideal solution for machine vision inspection applications requiring structured illumination, including edge detection, locating offsets, and assessing topography. 
• Requires a reticle and lens (sold separately); see available reticles here.