FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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Image optimization features:
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Auto gain (manual gain control: 0 to 26 dB; 1 dB increments)
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Auto exposure (18 µs to 126 s; 1 µs increments)
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Black level (offset)
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Decimation
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Gamma correction
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Three look-up tables (LUTs)
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Pixel defect masking
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Piecewise Linear HDR mode
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Region of interest (ROI), separate ROI for auto features
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Reverse X/Y
Camera control features:
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Auto-iris (video type)
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Event channel
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Image chunk data
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IEEE 1588 Precision Time Protocol (PTP)
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Storable user sets
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StreamBytesPerSecond (bandwidth control)
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Stream hold
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Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
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Temperature monitoring (main board)
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Trigger over Ethernet (ToE) Action Commands
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Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
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Online design configuration tool helps you to specify your probe in minutes
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All designs are fully quadrant compatible
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Full solution includes probes, calibration substrates, stations, accessories and software
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Scalable architecture for future needs
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Guarantees fully-guarded measurements to fA and fF levels
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Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
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Allows probing of different pad materials and sizes
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Fast replacement of worn probes without the need for tools
- The SL223 is characterized as a MicroBrite™ Spot/Coaxial Light and is designed primarily to replace fiber optic light sources in coaxial lensing applications.
- Optional couplers are available for use with Dolan-Jenner, Fostec, and Moritex fiber bundles.
- The SL223 is also designed for general lighting purposes where a very intense, miniaturized light source is required. General purpose spot lights may be used to create both dark field and bright field affects, depending on how they are deployed during the inspection.
- The spot light is designed to provide 8.1kLux at a working distance of 4” (100mm) and is available in a very wide range of wavelengths from UV to IR.
- The SL223 is rated for IP65 washdown capability.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PNA for On-wafer R&D Measurements from RF to millimeter wave to Terahertz
Image optimization features:
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Auto gain (manual gain control: 0 to 22 dB)
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Auto exposure (manual exposure control: 100 µs to 1 s, 1 µs increments)
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Binning (horizontal and vertical) (sum)
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Decimation X/Y
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Enhanced Defect Pixel Correction (DPC)
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Fixed Pattern Noise Correction (FPNC)
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Gamma correction
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Three look-up tables (LUTs)
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Region of interest (ROI)
Camera control features:
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EF lens control (order option -18)
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Event channel
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Image chunk data
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IEEE 1588 Precision Time Protocol (PTP)
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RS232
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Storable user sets
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StreamBytesPerSecond (bandwidth control)
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Stream hold
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Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
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Temperature monitoring (main board and sensor board)
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Trigger over Ethernet (ToE) Action Commands
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Power bypass inductance: 8 nH
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Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
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Supports collinear and non-standard needle configurations
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Up to 16 DC for standard; maximum of 24 DC for custom
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
- Ruggedized
- Flight Qualified
- Available with vibration-isolated OCXO or CSAC Oscillator options
- Gigabit Ethernet
- GNSS, SAASM, or M-Code supported
- Designed for GPS denied environments
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Proven technology: designed in conjunction with several top STM groups in the world
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Quiet, low vibration operation
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Low running costs and reduced maintenance
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Easy operation and fast cool-down; load sample when the system is cold for TL models
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Calibrated RuO and CMN thermometry read by model 372S resistance bridge are installed on the mixing chamber plate
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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