FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
More Product Information
Our EuroBrite™ lineup provides industry leading technology with value pricing for an unmatched performance / price ratio:
- Complete built-in control for continuous and strobe modes.
- Adaptive Power™, a feature of the EuroBrite™ lighting controller, utilizes an onboard thermistor to maximize light output in continuous mode.
- Adaptive Overdrive,™ another feature of the EuroBrite™ lighting controller, provides a maximal output pulse in strobe mode regardless of the exposure period.
- IP67 sealed enclosure suitable for washdown environments.
- Rugged construction that has been tested to withstand over 1000lb.
- Industrial grade LEDs providing high-intensity illumination of 45klux (working distance of 200mm).
- Daisy chain up to 4 for a combined length of 48”.
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Auto gain (manual gain control: 0 to 33 dB)
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Auto exposure (manual exposure control: 15 µs to 26.8 s)
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Auto white balance (GT4905C only)
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Binning (horizontal and vertical)
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Color correction, hue, saturation (GT4905C only)
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Column defect masking
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Decimation X/Y
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Gamma correction
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Three look-up tables (LUTs)
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Region of interest (ROI), separate ROI for auto features
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Reverse X/Y
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EF lens control (order option -18)
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Event channel
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Image chunk data
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IEEE 1588 Precision Time Protocol (PTP)
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RS232
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Storable user sets
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StreamBytesPerSecond (bandwidth control)
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Stream hold
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Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
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Tap mode switchable in Vimba Viewer 2.0 or later (four-tap, one-tap)
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Temperature monitoring (main board and sensor board)
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Trigger over Ethernet (ToE) Action Commands
- Designed for use with specific Probe Systems
- Tables to suit all facility requirements and applications
- Stable probing, even in submicron range
- Granite platen ensures rigidity and temperature stability
- Can be combined with the Shield Enclosures
- The Narrow Linear Diffuse Light series is ideal for precision scanning of highly reflective materials.
- The DL151 is available in a wide range of wavelengths and provides up to 28kLux at a 1” (25mm) standoff.
- The extruded aluminum enclosure can be expanded in 2″ (51mm) increments from 2″ to 70″ (1778mm).
- The SL2420 is characterized as a Medium Aimed Spot Light.
- Precisely aimed LEDs provide a level of lighting control not found in traditional illuminators.
- A range of standoffs and fields of view may be specified at the time of order.
- The spot light is available in a wide range of wavelengths from UV to IR.
- Diffuser and polarizer options are also available.
- The SL2420 provides 10.1kLux at a working distance of 4” (100mm).
- The IC Inline Controller provides steady and optimal current to lights from a small package when larger, more versatile discrete controllers are not necessary.
- The IC provides continuous-on and DC gating on/off control as well as 0-10 volt analog dimming.
- All ICS models employ reverse input polarity protection.
- A wash down version is provided with any light to which it is attached is also wash down.
- 0 – 100% Intensity Control with optional DCS-MP, purchased separately, will provide manual intensity control via an external potentiometer.
- Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
- Application flexibility, ideal for use in high frequency applications
- Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
- Suitable for integration with vibration isolating tables
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Use with liquid nitrogen or helium, depending on the target temperature
- Accessories available, such as black bodies and optical motion analysis tools
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
See "Specifications & Details" tab for more key features
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement