FormFactor - Cascade Light Wave Probe - Multi-configurable optical probe for photonic device characterization
The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and receivers, and LEDs.
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- Substrate material: High-resistivity silicon
- Substrate thickness: 275 µm
- Dielectric constant: 11.8
- Nominal Z0: 50 Ω
- The SL2507 is characterized as a Small Aimed Spot Light.
- Precisely aimed LEDs provide a level of lighting control not found in traditional illuminators.
- A range of standoffs and fields of view may be specified at the time of order.
- The spot light is available in a wide range of wavelengths from UV to IR.
- Diffuser and polarizer options are also available.
- The SL2507 provides 2.6kLux at a working distance of 4” (100mm).
- The Wide Linear Diffuse Light series is ideal for the inspection of elongated or cylindrical objects.
- Perfect for inspections requiring a multi-camera setup.
- Can be provided with up to 4 viewing ports.
- Expandable lengths from 6” – 36” (152 – 194mm) in 6” increments.
- The DL225 series of square coaxial lights features a modular heat sink and circuit design for enhanced performance, product availability and lead time.
- These coaxial lights are available in a wide variety of wavelengths from UV to IR.
- They provide intensities from 18kLux for the DL225-025 to approximately 50kLux for the larger models.
- The SL164 is characterized as a Compact High Intensity Spot Light with sufficient thermal management to provide 200kLux at a working distance of 4” (100mm).
- A very wide range of wavelengths are available from UV to IR.
- Multiple beam spreads are also available as is a diffuser option.
- Tests and validates performance directly on silicon without post-dicing packaging
- Dramatically reduces time to data and shortens development cycles
- Enables high scalability for high volume manufacturing
- Offers flexibility in chip design with full grid probing
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (39 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
- Revolutionary technology advancement for wafer and die-level photonics probing
- Real-time in-situ calibrations
- Singulated die testing
- True die-level edge coupling
- In-situ power measurements
- Advanced calibration technologies
- Enables autonomous measurements
See "Specifications & Details" tab for more key features
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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