Teledyne LeCroy - High Voltage Differential Probes
High voltage differential probes provide high CMRR over a broad frequency range to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
|
Device Under Test |
Recommended Model |
Safety Class |
Bandwidth |
Cable Length |
Tip Accessories Included |
|---|---|---|---|---|---|
|
120 V/240 V Half-Bridge Circuit Topologies |
1 kV |
25 MHz |
2 m |
Yes |
|
|
1 kV |
25 MHz |
2 m |
No |
||
|
1 kV |
120 MHz |
2 m |
Yes |
||
|
1 kV |
120 MHz |
2 m |
No |
||
|
1.5 kV |
400 MHz |
2 m |
Yes |
||
|
380 V - 600 V Class Electrical Apparatus |
1 kV |
120 MHz |
2 m |
Yes |
|
|
1 kV |
120 MHz |
2 m |
No |
||
|
1 kV |
80 MHz |
6 m |
Yes |
||
| HVD3220 | 1.5 kV | 400 MHz | 2 m |
Yes |
|
| Solar PV Inverter | HVD3106A | 1 kV | 120 MHz | 2 m |
Yes |
| HVD3206A | 1.5 kV | 120 MHz | 2 m |
Yes |
|
| HVD3206A-6M | 1.5 kV | 80 MHz | 6 m |
Yes |
|
| HVD3220 | 1.5 kV | 400 MHz | 2 m |
Yes |
|
| 5 kV Electrical Apparatus | HVD3605A | 6 kV | 100 MHz | 6 m |
Yes |
More Product Information
Introducing Auriga’s 5th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
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Revolutionary technology advancement for wafer and die-level photonics probing
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Real-time in-situ calibrations
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Highest accuracy in test results
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Lowest coupling loss
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Dark, shielded and frost-free
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-40°C to +125°C
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
- Boost performance by up to 3x over its precursor thanks to an Intel x6000 series embedded processor
- Capture high-resolution images at high speed through a choice of CMOS sensors from two to 16 Megapixels
- Deploy in dirty, humid, or harsh industrial environments by way of a compact IP67-rated design
- Communicate actions and results to other automation and enterprise equipment via real-time digital I/Os, and Ethernet (TCP/IP, CC-Link IE Field Basic, EtherNet/IP™2, Modbus® , PROFINET® , and native robot interfaces)
- Handle Human-Machine Interface (HMI) function by way of VGA and USB connectivity
- Simplify vision setup and upkeep via integrated lens focusing and illumination intensity control
- Synchronize to the manufacturing line through the support for incremental rotary encoders
- Solve machine vision applications efficiently with Aurora Design Assistant by constructing flowcharts instead of writing program code
- Maintain control and independence through the ability to code custom flowchart steps
- Tackle machine vision applications with utmost confidence using field-proven tools for analyzing, locating, classifying, measuring, reading, and verifying
- Leverage deep learning for visual inspection through image classification and segmentation tools
- All-in-one microstage - no separate controller
- Direct high-level command interface (I2C or SPI)
- USB adapter enables direct connection to PC
- Small: < 32x32x11 mm including controller
- Absolute encoding: high repeatability, no homing
- Low power: 6 VDC, ~5 W (only when moving)
- For integration into battery powered devices
- Long stroke: 15 mm
- High force: 1 N (~100g load vertical, ~200g horizontal)
- High stiffness with crossed roller bearing design
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Responsive and easy to use management software
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Highly scalable UDP/TCP layer 4 traffic generation
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High performance TLS testing suite
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Use your own application traffic or AppMix to create and scale realistic application traffic
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1U and 2U rack mounting hardware with a wide range of port speeds offers low entry and yet a scalable solution
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Ease of use
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Free software (incl. VulcanManager and VulcanAppMix)
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Free tech support product lifetime
- This High Intensity Spot Light is engineered for long throw and high brightness illumination.
- Built with 12 high current LEDs focused to produce even illumination at distances beyond 300mm.
- Designed to replace our previous SL185 with 3X the brightness (110Klux @ 300mm).
- Available in a wide range of wavelengths.
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Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
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Enables up to 5x faster time to accurate data
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Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact
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RF/microwave device characterization, 1/f, WLR, FA and design debug
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Wide range of extremly performant, reliable thermal chuck systems from ATT
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Easy on-screen navigation, wafer mapping, and operation of accessories and thermal systems with Velox
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User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
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Complete Test Solutions
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Complete test solutions for emissions and immunity compliance testing of AC and DC powered products
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Single & Three Phase Operation
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Offers flexibility
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Direct PC Bus Access
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Provides high sampling rate and resolution for accurate measurements and high speed data transfers
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PC based harmonic & flicker testing
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provides real-time full color data display updates and continuous PASS/FAIL monitoring.
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Supports Global Standards
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Supports European and Japanese standards
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Easy To Use Interface
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Provides IEC test setup, data analysis, display, MS Word test reports, and data files are generated in MS Excel format
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High resolution
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Data storage to disk in for post-acquisition analysis and reporting
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Single Step
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Single Step and Fast Forward replay of recorded test data at 200 mSec
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- Part of the MicroBrite™ family of high performance, compact machine vision lights.
- Our DF196 Series delivers direct illumination at a low angle to cast shadows used to identify surface defects, embossed text, etc.
- This dark field ring light is more directional and less diffuse than the DF198.
- Available in 4 sizes with an intesity of 72kLux (working distance of 25mm with DF196-100)
Teledyne LeCroy
Teledyne LeCroy is a leading provider of oscilloscopes, protocol analyzers and related test and measurement solutions that enable companies across a wide range of industries to design and test electronic devices of all types. Since our founding in 1964, we have focused on creating products that improve productivity by helping engineers resolve design issues faster and more effectively.
Oscilloscopes are tools used by designers and engineers to measure and analyze complex electronic signals in order to develop high-performance systems and to validate electronic designs in order to improve time to market. Protocol analyzers are tools used by designers and engineers to generate and monitor traffic over high speed serial data interfaces, including DDR, PCI Express, Fibre Channel, Serial ATA, SAS, USB and others. Both products are critical in the development of a wide variety of demanding design applications.
We utilize both of these important product areas in combination to tackle the most demanding serial data test applications, offering tailored solutions to help our customers perfect their chips, interfaces, subsystems and products which utilize these important communications standards. With the explosion in the use of serial data communications technologies in semiconductors, between devices on circuit boards and between computers and peripherals, we are aimed at a growing and important market.
Our oscilloscopes offer a powerful combination of large and informative displays combined with advanced waveshape analysis capabilities typically tailored to enhance the productivity of engineers in specific applications areas such as serial data test, disk drive test and automotive bus analysis.
Headquartered in Chestnut Ridge, New York, LeCroy has sales, service and development subsidiaries in the US and throughout Europe and Asia. LeCroy products are employed across a wide variety of industries, including semiconductor, computer, consumer electronics, military/aerospace, automotive/industrial, and telecommunications.
Contact Details
Headquarters Teledyne LeCroy
700 Chestnut Ridge Road, Chestnut Ridge, NY 10977-6499, USA
Phone: 800-553-2769 or 845-425-2000
Phone Support: 1-800-553-2769
Fax Sales: 845-578-5985
Email Sales: contact.corp@teledynelecroy.com
Email Support: support@teledynelecroy.com (Oscilloscopes, Waveform Generators, Signal Integrity)
Test & Measurement
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