Focus Microwaves - Manual Tuners
Focus offers a complete range of manual tuners. The MMT series use the same RF technology and precision as a comparable automatic tuner.
They are available in octave and multi-octave bands between 400 MHz and 18 GHz and provide high VSWR at DUT reference plane with a high reliability.
For harmonic tuning requirements, the MMT series can be enhanced, referring to as option –H2 and –H23, using a similar concept as Focus’ harmonic rejection tuners (PHT).
For more information on Automated Tuners, Click here!
Model |
Min Frequency |
Max Frequency |
Type |
Datasheets |
| MMT304 | 0.4 GHz | 3.0 GHz | Manual | |
| MMT306 | 0.6 GHz | 3.0 GHz | Manual | |
| MMT308 | 0.8 GHz | 3.0 GHz | Manual | |
| MMT316 | 1.6 Ghz | 3.0 GHz | Manual | |
| MMT606 | 0.6 GHz | 6.0 GHz | Manual | |
| MMT704 | 0.4 GHz | 7.0 GHz | Manual | |
| MMT708 | 0.8 GHz | 7.0 GHz | Manual | |
| MMT716 | 1.6 GHz | 7.0 GHz | Manual | |
| MMT808 | 0.8 GHz | 8.0 GHz | Manual | |
| MMT1804 | 0.4 GHz | 18.0 GHz | Manual | |
| MMT1808 | 0.8 GHz | 18.0 GHz | Manual |
More Product Information
Image optimization features:
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (manual exposure control: 30 µs to 33.5 s)
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Auto white balance (GT6600C model only)
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Binning (horizontal and vertical)
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Color correction, hue, saturation (GT6600C only)
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Column defect masking
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Decimation X/Y
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Gamma correction
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Three look-up tables (LUTs)
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Region of interest (ROI), separate ROI for auto features
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Reverse X/Y
Camera control features:
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EF lens control (order option -18)
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Event channel
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Image chunk data
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IEEE 1588 Precision Time Protocol (PTP)
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RS232
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Storable user sets
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StreamBytesPerSecond (bandwidth control)
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Stream hold
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Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
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Tap mode switchable in Vimba Viewer 2.0 or later (four-tap, one-tap)
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Temperature monitoring (main board and sensor board)
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Trigger over Ethernet (ToE) Action Commands
Focus Microwaves’ DELTA series of electro-mechanical tuners is designed specifically for high frequency on wafer measurements. The tuner’s low profile allows it to be placed within the wafer perimeter and allows for a direct connection between the probe tip and the tuner, eliminating all possible insertion loss between the DUT and the tuner. This revolutionary new tuner design enables the engineer to achieve optimum tuning range, with a tuner whose footprint and weight has been dramatically reduced.
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Different substrate carriers for wafers up to 150 mm or single dies
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Up to six positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Ergonomic and straightforward design
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Intuitive, manual operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
Image optimization features:
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (manual exposure control: 10 µs to 26.8 s)
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Auto white balance (GT1660C only)
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Binning (horizontal and vertical)
-
Color correction, hue, saturation (GT1660C only)
-
Column defect masking
-
Decimation X/Y
-
Gamma correction
-
Three look-up tables (LUTs)
-
Region of interest (ROI), separate ROI for auto features
-
Reverse X/Y
Camera control features:
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P-Iris and DC-Iris lens control
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Event channel
-
Image chunk data
-
IEEE 1588 Precision Time Protocol (PTP)
-
RS232
-
Storable user sets
-
StreamBytesPerSecond (bandwidth control)
-
Stream hold
-
Sync out modes: Trigger ready, input, exposing, readout, imaging, strobe, GPO
-
Tap mode switchable in Vimba Viewer 2.0 or later (four-tap, one-tap)
-
Temperature monitoring (main board and sensor board)
-
Trigger over Ethernet (ToE) Action Commands
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Revolutionary technology advancement for wafer and die-level photonics probing
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Highest accuracy in test results
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New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
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Minimized coupling losses with minimal trench dimensions
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Industry standard for vertical coupling to wafer-level grating couplers
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Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
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Dark, shielded and frost-free
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-40°C to +125°C
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Leveraging considerable expertise through an innovative engineering team
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Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
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Exclusive FormFactor-developed automated test methodology
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Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
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FormFactor-developed graphical user interface to manually control the optical positioning system
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Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
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High spatial resolution
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IEEE 1588 PTP
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Power over Ethernet
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Defect pixel masking
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Monochrome (GT4400) and color (GT4400C) models
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-5e or CAT-6)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
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Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Different substrate carriers for wafers up to 100 mm or single dies
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Up to six positioners
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Independently cooled cold shield
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Probe positioners placed inside vacuum chamber
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Ergonomic and straightforward design
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Simple microscope operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
- Detented, 30 position potentiometer for repeatable dimming with cable inline controllers
- Built in DIN-rail or panel mounting feature
- Flip up cover for potentiometer to prevent accidental adjustments
- Spring clamp wiring terminal for vibration proof installation
- NEW M12 selector switch for use with iCS 2 (IC) and iCS 3 (I3) M12-based lights
- Repair-focused environment for XJDeveloper / XJRunner tests.
- Full Connection test.
- RAM, Flash and other non-JTAG device tests.
- Flash, FPGA, CPLD and EEPROM programming.
- Layout Viewer* to show the physical location of faulty nets, pins and components.
- Schematic Viewer* to show the circuit design around faults.
- Direct control of the pins/balls of JTAG devices.
- View pin states graphically in real time or capture them in the Waveform Viewer.
- Trace signals to identify shorts, opens and other faults.
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
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