Focus Microwaves - RAPID-VT Digital Tuners
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Supports the latest 5G FR1 and IEEE 802.11ax standards
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up to 1GHz active load pull bandwidth capability
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Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
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This system can be used in all parts of the design cycle
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Initial device characterisation
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MMIC or PA design
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Design verification testing
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Product testing in the factory
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Focus Microwaves’ RAPID digital tuner technology is now available for very wideband communication signals, supporting the latest 5G FR1 and IEEE 802.11ax standards. This new architecture leverages the raw performance of National Instruments PXIe-5841* PXI Vector
Signal Transceiver.
The Rapid VT, utilizes two PXIe-5841 VSTs to make a VNA architecture with up to 1GHz active load pull bandwidth capability. The system solution provides a flexible load pull test platform that can be used to test the latest high bandwidth and high modulation cellular
standards such as 1024QAM 802.11ax but can also be configured for fast load pull and s-parameter measurements. This opens up the possibility of using this system in all parts of the design cycle, from initial device characterisation, to MMIC or PA design, design verification testing and ultimately to product testing in the factory.
S Parameter Performance Summary
Load Pull Performance Summary
Document
More Product Information
Noise measurements allow the determination of the four Noise Parameters of a device (transistor). There are four Noise Parameters which fully describe the noise behaviour of an active or passive device at a given frequency.
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Supports the latest 5G FR1 and IEEE 802.11ax standards
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up to 1GHz active load pull bandwidth capability
-
Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
-
This system can be used in all parts of the design cycle
-
-
Initial device characterisation
-
MMIC or PA design
-
Design verification testing
-
Product testing in the factory
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Quick and easy probe tip navigation
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Z drive can work in the same range as the chuck
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Enables higher separation gap while the DUT stays in focus
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Automatically configure and optimize performance
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24/7 operating
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Increased MTBF
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Protects the measurement setup
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Prevents involuntary mechanical contact between lens and probes
See more Key Features in Specifications & Features tab
Rugged storage array satisfying advanced storage requirements with limitless capacity for sensitive data, rapidly accessed and protected using fast NVMe SSDs and a secure host.
- Light, Durable, Ready for Extremes - Much lighter yet more rugged than any solution on the market. SWaP optimized for field-deployment.
- Ultra-fast Read/Write Speeds - Quickly store and retrieve large amounts of critical data in seconds with 27.2 GBs read/write speeds.e
- Full Control & Configurability - Drive magazines that hold 8 drives at once or 24 individually removable drives enable quick removal and replacement.
Focus Microwaves’ DELTA series of electro-mechanical tuners is designed specifically for high frequency on wafer measurements. The tuner’s low profile allows it to be placed within the wafer perimeter and allows for a direct connection between the probe tip and the tuner, eliminating all possible insertion loss between the DUT and the tuner. This revolutionary new tuner design enables the engineer to achieve optimum tuning range, with a tuner whose footprint and weight has been dramatically reduced.
- Small
- Complete, closed-loop system with embedded controls in less than 28 x 13.2 x 7.5 mm
- Precise
- 0.5 µm resolution
- 6 mm of travel
- Simple system integration
- High-level motion commands over standard serial interface (I2C or SPI)
- Flexible system, fast to market
- Rapidly configurable for push or pull motion
- Low voltage / low power use
- 3.3 V input, <500 mW power use
- Holds position when power is off
- Repair-focused environment for XJDeveloper / XJRunner tests.
- Full Connection test.
- RAM, Flash and other non-JTAG device tests.
- Flash, FPGA, CPLD and EEPROM programming.
- Layout Viewer* to show the physical location of faulty nets, pins and components.
- Schematic Viewer* to show the circuit design around faults.
- Direct control of the pins/balls of JTAG devices.
- View pin states graphically in real time or capture them in the Waveform Viewer.
- Trace signals to identify shorts, opens and other faults.
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High spatial resolution
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IEEE 1588 PTP
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Power over Ethernet
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Defect pixel masking
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Monochrome (GT5400) and color (GT5400C) models
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Comprehensive I/O functionality for simplified system integration
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Planarity adjusted (PA) EF Lens Mount (option -18) for electronic control of aperture and autofocus
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Easy camera mounting via standard M3 threads at all sides and 1/4-20 tripod mounting hole
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
The energy industry is primed for a wave of monumental change. The transition to renewable and alternative energy sources, advancements in energy storage, the rise of smart grids, and the electrification of transportation are driving significant changes domestically and globally. These developments mean organizations require new testing protocols, enhanced safety standards, advanced testing equipment, and comprehensive interoperability and cybersecurity assessments. Regulatory changes and technological innovations further complicate testing requirements, demanding scalable and real-world simulation capabilities. When testing facilities must adapt rapidly to support R&D efforts, it’s essential that they ensure the safe, efficient, and sustainable deployment of new energy technologies. All of these factors demand energy laboratories that are future-proofed for innovative solutions.
Focus Microwaves
Focus Microwaves is a pioneering engineering company, built around the innovations of its founder Dr. Christos Tsironis who developed his first manual tuner in 1973 and is the inventor of most existing electro-mechanical tuner families. The success of Focus is based on the engineering and manufacturing skills of its highly motivated and experienced team of engineers and technicians, who have been trained and encouraged to develop new technologies. In addition, listening to our customers needs and insights helps us discover and develop new and measurement methods on an ongoing basis, relentlessly pushing the limits of what is possible.
From humble beginnings in 1988, Focus has become the main supplier of advanced Load Pull and Noise Tuner Systems. Our mission is to provide effective, reliable and innovative solutions for non-50 Ohm testing (Noise and Load Pull) of RF microwave transistors, thus enabling our customers to compete in the marketplace with better designs and to advance the understanding and knowledge of the field.
Contact Details
Focus Microwaves Inc. Main Head Office
4555 Chem. du Bois-Franc, Saint-Laurent, QC H4S 1A8, Canada
Phone: +1-514-684-4554
Test & Measurement
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