FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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- DC-40 GHz bandwidth
- 10 ps rise time
- Low insertion and return loss
- 2 mils of tip-to-tip compliance
- High probing angle and clearance
- Full-radius, nickel-plated tungsten needles
- Power bypass inductance: 16 nH
- Supports collinear and non-standard needle configurations
- Support up to a maximum of 12 ceramic blades DC needles / contacts
- Ideal for probing the entire circuit for functional test
- DC probes can provide power or slow logic to circuit under test
- 1.2" (19.3 mm) max. sensor size
- Very high resolution down to 2.4µm pixel size
- Low chief ray angle suitable for all SONY Pregius™ generations
- C-Mount lens
- 5 focal lengths: 12 mm - 50 mm
- Initial aperture: F2.8
- Tiny “all-in-one” solution: no external control board needed
- Superior image quality: sub-micron lens movement with very low tilt. Now with higher dynamic stability
- Low voltage & power: 3.3 VDC input, zero power position hold
- Simple system integration: accepts high-level motion commands over standard serial interface (I2C or SPI)
- Flexible, production-ready system: compatible with M8 to M16 lenses and with typical image formats from 1/3” to 1/1.8”
- Lowest cost, fastest time to market: Fully-engineered “plug and play” solution
An EMC Chamber with 5 meter test range ensuring EMC compliance testing for Emission and Immunity testing. Ferrite and hybrid pyramidal absorbers are combined in a unique pattern within a SmartShield high performance chamber. Operating at a 5m test distance, this EMC chamber is compliant to CISPR-16-1-4 / ANSI C63.4 with a measurement zone diameter of 2 to 4 meters.
- Our EuroBrite™ lineup outdoes the competition in so many ways. With more features at a competitive price point, there’s no better value in machine vision lighting:
- Complete built-in control for continuous and strobe modes.
- Adaptive Power™, a feature of the EuroBrite™ lighting controller, utilizes an onboard thermistor to maximize light output in continuous mode.
- Adaptive Overdrive,™ another feature of the EuroBrite™ lighting controller, provides a maximal output pulse in strobe mode regardless of the exposure period.
- IP67 sealed enclosure suitable for washdown environments.
- Rugged construction that has been tested to withstand over 1000lb.
- Industrial grade LEDs providing high-intensity illumination of 85klux (working distance of 100mm).
- Daisy chain up to 4 for a combined length of 24”.
- Bandwidth models from 8 GHz to 30 GHz
- Low loading and high impedance for minimal signal disturbance
- Wide variety of tips:
- Standard and high-sensitivity 30 GHz solder-in tips
- High-temperature solder-in tip with 1-meter lead
- QuickLink adapter for mixed-signal probing
- Handheld browser tip
- Tips for direct oscilloscope connection to CrossSync PHY protocol analyzer interposers
- Built-in tip identification for simple setup and precise signal reproduction
- Ideal for debug and validation of:
- PCIe 1.0 to 6.0
- DDR3/LPDDR3
- DDR4/LPDDR4/LPDDR4X
- DDR5
- Other high-speed serial interfaces
The SMX-6xxx product family includes the SMX-6101 (pictured), SMX-6103, SMX-6106, SMX-6111, SMX-6115, SMX-6116, and SMX-6144.
- 96 digital lines configurable as either input or output
- Five available power supply rails for custom designs
- Mix and match with standard SMIP switching and digital I/O modules to create high density configurations
- VXI plug&play driver simplifies software development
- On-board connector header for simplified migration to PCB implementation
- Access to 16 MHz clock for use in complex designs
- Multiple front panel connector options
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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