FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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- HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
- Up to 5 Gpts of acquisition memory enables detailed viewing of long events
- 15.6" 1900 x 1080 Full HD capacitive touchscreen
- New ProBus2 input supports up to 8 GHz bandwidth and direct compatibility with a wide variety of existing ProBus probes - 50Ω and 1MΩ coupling modes support all input types on a single connector
- MAUI with OneTouch user interface for intuitive and efficient operation
- Deep toolbox enables and simplifies complex analysis
- Intuitive navigation to quickly find important features in long waveforms
- Zone Trigger – Simple Triggering for Complex Signals
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Sub-sampling
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (48 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
Superior Mechanics
- Highly stable granite base
- Independent, coarse movement of X and Y axes, combined with easy fine adjustments
- Excellent measurement accuracy and repeatability
- Fast navigation and high-precision probe positioning
See "Specifications & Details" tab for more key features
- High performance GPS disciplined Time/Frequency standard
- Ethernet Interface for management and control
- Network Time Protocol (NTP)
- Multiple 1PPS outputs with individual delay compensation
- Multiple Low Phase Noise 10MHz outputs with software programmable level
- Time Code outputs including Have Quick, IRIG A, IRIG B, IRIG E, IRIG G
- Sync to GPS or to Have Quick/1PPS per ICD-GPS-060
- Choice of internal disciplined OCXO or Rubidium Oscillator
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Low noise GigE Vision InGaAs SWIR camera
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VGA resolution
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Power over Ethernet (PoE+)
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large pixel with high dynamic
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Strong sensor cooling, no condensation
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Very strong sensor cooling for low-noise imaging with long exposure times
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GigE Vision interface with PoE+
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Comprehensive I/O control options
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Automated on-board image correction
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Extended operating temperature range
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High performance Camera Link InGaAs SWIR camera
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QVGA resolution
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Efficient cooling with fan, no condensation
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Simple camera configuration via GenCP
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Nitrogen-filled cooling chamber to avoid condensation
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Up to 344 fps at full resolution
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Camera Link interface with GenCP support
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Comprehensive I/O control options
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Automated on-board image correction
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TEC1 sensor cooling
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Extended operating temperature range
Introducing Southwest Microwave’s newest high-performance connector, the groundbreaking 0.8 mm (145 GHz) high-performance thread-in connector. This cutting-edge design ensures exceptional signal integrity while delivering the industry’s lowest VSWR, RF leakage, and insertion loss.
- Will mate with IEEE 287 & IEC 61169-64 standards
- DC to 145 GHz
- Field replaceable and reusable
- Comprehensive Test Solutions - Our CTS 4.0 Series offers complete test solutions for emissions and immunity compliance testing of AC and DC power products, ensuring your products are ready for global markets.
- Single & Three Phase Operation - Offers flexibility
- Direct PC Bus Access - Provides high sampling rate and resolution for accurate measurements and high-speed data transfers
- PC-Based Harmonic & Flicker Testing - Provides real-time full-color data display updates and continuous PASS/FAIL monitoring
- Supports Global Standards - Supports European and Japanese standards
- Easy To Use Interface - Provides IEC test setup, data analysis, display, MS Word test reports, and data files generated in MS Excel format
- High Resolution - Data storage to disk for post-acquisition analysis and reporting
- Single Step - Single Step and Fast Forward replay of recorded test data at 200 mSec
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Affordable GigE Vision InGaAs SWIR camera
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QVGA resolution
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Power over Ethernet
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Compact industrial design, no fan
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Up to 344 fps at full resolution
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GigE Vision interface with PoE+
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Comprehensive I/O control options
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Automated on-board image correction
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Stabilized sensor-cooling, no fan
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Extended operating temperature range
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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