FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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More Product Information
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Load-lock chamber: Cycle devices 10X faster in a cryogenic environment
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High-density electrical interface at cryogenic temperatures: More pins on the device enables more test structures to be probed with a single cooldown
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Base temperature of < 2K or < 4K with high cooling power: Test devices at the temperatures that matter most for pre- screening and evaluating device performance
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Low vibration: Stable contact with the device under test and enables low noise measurements
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Different substrate carriers for wafers up to 150 mm or single dies
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Up to six positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Ergonomic and straightforward design
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Intuitive, manual operation
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for probe platen
See more Key Features on Specifications & Details tab
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Responsive and easy to use management software
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Highly scalable UDP/TCP layer 4 traffic generation
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High performance TLS testing suite
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Use your own application traffic or AppMix to create and scale realistic application traffic
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1U and 2U rack mounting hardware with a wide range of port speeds offers low entry and yet a scalable solution
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Ease of use
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Free software (incl. VulcanManager and VulcanAppMix)
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Free tech support product lifetime
- Accurate & reliable time data from a trusted source
- Remote configuration and status via web browser, remote monitoring with SNMP
- Synchronization between users – eradicates discrepancies
- System time stamping, such as e-commerce transactions, e-mail sent & received, is highly accurate
- Automatic systems procedures such as backups occur at the correct time and in the correct order
- Additional time signal outputs can feed to other systems
- Multiple time source fall back and priority configuration can ensure high synchronization availability
- Various oscillator choices allow for long holdover to maintain time accuracy when synchronization signals are absent
- High-density, compact (1U) precision data acquisition instruments
- LXI™ LAN connectivity
- Fully integrated signal conditioning maximizes performance and accuracy
- Easily integrate thermocouples, voltages, RTDs, thermistors, frequency, strain and pressure on an per-channel basis
- Distributed, synchronized measurements over the wire
- Scalable architecture easily expands from tens to thousands of channels
- DC version available for test cells requiring closer proximity to test article
- End-to-end self-calibration ensures optimum runtime performance
- Web-based access for monitoring and control
- Exlab turnkey software for simplified setup, control and data display
- DigRF v4 Decodes
- Low-speed (26 Mb/s)
- Medium-speed (1248 Mb/s)
- High-speed (1456 Mb/s)
- DigRF v3 Decodes
- Low-speed (6.5 Mb/s)
- Medium-speed (26 Mb/s)
- High-speed (312 Mb/s)
- Convert DigRF 3G and v4 I and Q digital data to corresponding analog waveforms
- Correlate analog waveforms with protocol decode on one screen
- View decoded data in hexadecimal format
- Decode information expands as the time base is adjusted or zoomed
- Convenient table display with quick “Zoom to byte” capability
- Quick search capability for specific message packets
- Eight ports of 8 I/O bits each
- High current capability for control of external relays, 300 mA sink
- Simulate and receive digital data at up to 2 MHz sample rates
- Selectable output voltages range from 3.3 V to 60 V
- Setup outputs and scan inputs as part of EX1200 measurement sequencing engine
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
For more information please contact your local sales representative.
- Highest resolution – 12 bits all the time
- More capability – integrates multiple instruments into one
- Comprehensive probe support – supports over 30 probes in 9 categories
- MAUI with OneTouch user interface for intuitive and efficient operation
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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