FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
More Product Information
Safran’s SEEING™ 130 Wide includes a unique medium focal length catadioptric optics, limited by diffraction only and with ultra-low distortion, offering perfect imaging over 35 mm full-frame image format. It is fitted with a 10megapixel sensor.
SEEING™ 130 Wide enables high Signal to Noise Ratio for multispectral (MS), hyperspectral (HS) and low light level imaging. SEEING™ 130 Wide includes a spectral filter with 23 bands covering Blue, Green, Red, Near InfraRed and Red Edge MS, for a broad spectral range between 475 and 900nm. SEEING™ 130 Wide has a large Field of View of 6.3° x 4.3° / 54 x 36 km2 from a 500km/310 miles orbit.
In addition to its a thermal design within a robust structure, SEEING™ 130 Wide has a low SWaP, saving launch and operational costs.
- High speed 120 kHz, high resolution 28 μm or 900 dpi
- No missing or interpolated pixels
- Exposure control
- Mono/HDR mode
- Precalibrated pixel size for metrology applications
- Camera Link HS fibre interface
- High power density / low ripple and noise
- High programming resolution with Ethernet interface
- Constant voltage and current mode
- Remote sensing
- Isolated analog control and monitoring (optional)
- Part of the MicroBrite™ family of high performance, compact machine vision lights.
- Our DF196 Series delivers direct illumination at a low angle to cast shadows used to identify surface defects, embossed text, etc.
- This dark field ring light is more directional and less diffuse than the DF198.
- Available in 4 sizes with an intesity of 72kLux (working distance of 25mm with DF196-100)
- Support the most high-performance Camera Link cameras with available support for Full and 80-bit mode at up to 85 MHz
- Perform deterministic image acquisition by way of the jitter-free Camera Link 2.1 interface
- Maximize system compatibility with the choice of PCIe® 2.1 x1, x4 or x8 connectivity
- Eliminate missed frames with ample onboard buffering and PCIe bandwidth
- Optimize multi-camera applications via support for up to four Base or two Full/80-bit Camera Link cameras per board
- Minimize space requirements and maximize PC compatibility through a half-length design with mini Camera Link connectivity for true single-slot operation
- Improve and simplify system connectivity with Power-overCamera-Link (PoCL) support at extended cable lengths
The SPARTE 900 series antenna stands as a testament to reliability and performance, tailored for mission-critical applications where telemetry reception is paramount. This field-proven product ensures accurate tracking of flying targets, such as aircraft or space launch vehicles, even at significant distances, thanks to its high gain and large aperture design.
The robust and durable construction of the SPARTE 900 series guarantees optimal performance in any scenario: an aluminum-alloy reflector for enhanced surface accuracy, SCM tracking feeds for dependable and precise tracking, and dual-drive motors for redundancy and no-backlash operation.
Additionally, the SPARTE 900 series comes equipped with a riser that integrates the Antenna Drive cabinet and any necessary equipment, allowing for optimal positioning in close proximity to the antenna.
Next Generation Wafer Probing
- Continues the Infinity family’s Industry leading electrical performance
- High temperature capability (175° C +) for automotive device characterization and other applications
- Better tip visibility for enhanced placement accuracy and repeatability
- Improved tip life/durability with solid rhodium contacts
- New tip architecture enables support for narrower pitches (e.g. 25um)
- Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness
The laboratory and research industry faces unique challenges including long-standing, legacy pain points and frequently evolving needs. These include paramount safety and regulatory requirements for lab workers and patients alike, the need for high containment and sterility, and the integration of cutting-edge technologies. Complex and sensitive facilities require specialized testing solutions to ensure compliance, safety, and reliability. Effective planning and laboratory design and construction are crucial to creating environments that support advanced research and manufacturing processes, especially in the pharmaceutical and medical device sectors.
-
Camera Link InGaAs SWIR camera
-
VGA resolution
-
Large pixel with high dynamic
-
Compact industrial design, no fan
-
Simple camera configuration via GenCP
-
Compact industrial design
-
Very high intra-scene dynamic range of 73 dB
-
Camera Link interface with GenCP support
-
Comprehensive I/O control options
-
Automated on-board image correction
-
Stabilized sensor cooling, no fan
-
Extended operating temperature range
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement