FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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Coaxial and triaxial measurements up to 10,000 V
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High-quality construction with low-noise electrical performance
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Replaceable probe tips in a variety of tip sizes
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Temperature range of -60°C to 300°C
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Triaxial measurement ensures a much better understanding of device leakage in the off state
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Highly reliable, stable and repeatable measurements
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Integrally designed as part of a complete measurement solution
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
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Power bypass inductance: 8 nH
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Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
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Supports collinear and non-standard needle configurations
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Up to 16 DC for standard; maximum of 24 DC for custom
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Ideal for probing the entire circuit for functional test
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DC probes can provide power or slow logic to circuit under test
- Up to 65 GHz
- Up to 80 Channels @ 36 GHz
- Up to 160 GS/s
- Up to 512 Mpts/Ch
- 50 fs rms Sample Clock (Intrinsic) Jitter
- Jitter Between All Channels of <130 fs rms
The ES9910 Ethernet switch/router, an advanced solution that offers seamlessly integrated, highly flexible, and fully managed LAN/VLAN connectivity for mission-critical systems.
This versatile technology serves onboard operations for both manned and unmanned ground, air, and sea vehicles, empowering them with top-notch networking capabilities.
The ENERTEC™ mission data processing and distribution units offer cost-effective, dependable solutions for acquiring, processing, storing, utilizing, and distributing field and mission data.
These units undergo rigorous validation and formal qualification testing, adhering to standard test methods such as DO-160 and MIL-STD-810 to ensure their reliability and performance.
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Fast GigE Vision InGaAs SWIR camera
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VGA resolution
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TECless
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Power over Ethernet
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Compact industrial design, no fan
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Up to 301 fps at full resolution
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GigE Vision interface with Power over Ethernet
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Comprehensive I/O control options
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Automated image correction
The new Light Hub for Zebra Iris GTX Smart Cameras (HCS-150-ZEB) streamlines machine vision system setup. This innovative controller acts as a central hub, directly powering your Zebra Iris GTX Smart Camera while managing triggering and analog dimming control between the camera, compatible lights, and I/O accessories.
Equipped with Advanced Illumination’s SignaTech™ technology, the Light Hub delivers 4 amps of continuous output and up to 8 amps of overdrive strobe. This empowers you to choose from a vast array of Advanced Illumination lighting configurations, ensuring optimal illumination for your application. Whether you need seamless integration with an 3×3 infrared backlight or would like to overdrive strobe a 70″ high intensity bar light, the Light Hub delivers.
- Universal GPS , IRIG A, B, E, G, NASA36, and HaveQuick inputs
- 12 channel GPS receiver
- 16 programmable outputs for time codes and pulse rates
- Output codes include NTP, IRIG A, B, E, G, H, NASA36, HaveQuick, 1PPS
- Electrical time code input/output
- Dual Independent Ethernet ports with integrated web server control
- High Stability Oven Controlled Oscillator Standard
- 9-Digit Time Display
- Redundant Hot Swappable Power Supplies
- 1U 19” rack mount
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Highly stable granite base
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Independent, coarse movement of X and Y axes, combined with easy fine adjustments
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Re-configurable for DC, RF, mmW, FA, WLR and more
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Full thermal range of -60°C to +300°C
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Low-profile, straightforward design
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Spacious top chambers for up to 12 positioners
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Reduces electrical noise by providing a fully electromagnetically shielded, ultra-low-noise, light-tight environment
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Enables accurate low-noise measurements of atto amperes, femtofarads and microvolts at temperatures down to -60°C
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FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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