FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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- Easy separation of cable jackets from the electrical conductor
- Suitable for samples with a high strip force
- Also designed for larger sample outer diameters (depending on wall thickness)
- Suitable preparation before cutting cable samples for measuring (e.g. with the ORC-series)
- Robust, stable construction
- Easy to use
The new Light Hub for Zebra Iris GTX Smart Cameras (HCS-150-ZEB) streamlines machine vision system setup. This innovative controller acts as a central hub, directly powering your Zebra Iris GTX Smart Camera while managing triggering and analog dimming control between the camera, compatible lights, and I/O accessories.
Equipped with Advanced Illumination’s SignaTech™ technology, the Light Hub delivers 4 amps of continuous output and up to 8 amps of overdrive strobe. This empowers you to choose from a vast array of Advanced Illumination lighting configurations, ensuring optimal illumination for your application. Whether you need seamless integration with an 3×3 infrared backlight or would like to overdrive strobe a 70″ high intensity bar light, the Light Hub delivers.
- Combine up to 6 SPDT and 6 multiport high-performance building blocks in a 2U footprint
- Extended life and self-terminating options provide maximum design flexibility
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI Trigger Event implementation provides seamless test synchronization with external devices
- Modular
- Control up to 95 assets
- Control multiple AC and DC power supplies and loads in one mainframe
- Create “virtual assets”
- Web browser control
- User configurable
- Highest Power Density
- Simple integration
- PFC
- Universal AC/DC input
- Up to 6kW in one mainframe
- 1kW DC modules
- PFC ≥0.95
- Reduced space and logistics hassles
- High power density
- Handles DC and AC power and load modules
- User configurable
- Universal AC/DC input
- Ease of integration
- Web browser control
- Trigger bus
- Configure modules to parallel or series operation “on the fly”
- Single or dual-channel display
- Agilent HP 437 & Agilent HP 438, and Boonton 4220A & 4230A emulation
- Automatically loads sensor data
- Simple software control via SCPI language
- IEEE-488 and RS-232 interfaces standard
The 4240 series of CW RF power meters provides the high speed measurement capability needed in a production environment, as well as the simplicity of operation required for bench top use. It provides very accurate measurements from -70 dBm to +44 dBm (sensor dependent) and has a rapid display update rate for tuning applications. The easy to read LCD displays both channels simultaneously with numeric and bar graph information.
Safran’s SEEING™ 130 Wide includes a unique medium focal length catadioptric optics, limited by diffraction only and with ultra-low distortion, offering perfect imaging over 35 mm full-frame image format. It is fitted with a 10megapixel sensor.
SEEING™ 130 Wide enables high Signal to Noise Ratio for multispectral (MS), hyperspectral (HS) and low light level imaging. SEEING™ 130 Wide includes a spectral filter with 23 bands covering Blue, Green, Red, Near InfraRed and Red Edge MS, for a broad spectral range between 475 and 900nm. SEEING™ 130 Wide has a large Field of View of 6.3° x 4.3° / 54 x 36 km2 from a 500km/310 miles orbit.
In addition to its a thermal design within a robust structure, SEEING™ 130 Wide has a low SWaP, saving launch and operational costs.
The all new Linea HS™ delivers line rates up to an incredible 400 kHz at 32k resolution — over 13 Gpixels/sec via CLHS interface. With up to 128 TDI stages (plus an extra 64 in HDR mode) for unmatched sensitivity and incredibly low noise, Linea HS excels in the highest speed, lowest light applications.
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Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
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Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
- Flexible bench configuration empowers users to easily set up instruments and DUTs to match any measurement workflow.
- Automated, multi-instrument calibration workflows empower users to achieve high accuracy results across diverse setups with minimal user intervention.
- Built-in system calibration verification instills confidence in measurement accuracy before data collection begins.
- Comprehensive small-signal, large-signal, and pulsed testing captures real-world device behavior for reliable design and modeling.
- Powerful visualization and analytics suite empowers users to quickly interpret results, extract models, and drive faster design decisions.
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
