FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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- Our EuroBrite™ lineup outdoes the competition in so many ways. With more features at a competitive price point, there’s no better value in machine vision lighting:
- Complete built-in control for continuous and strobe modes.
- Adaptive Power™, a feature of the EuroBrite™ lighting controller, utilizes an onboard thermistor to maximize light output in continuous mode.
- Adaptive Overdrive,™ another feature of the EuroBrite™ lighting controller, provides a maximal output pulse in strobe mode regardless of the exposure period.
- IP67 sealed enclosure suitable for washdown environments.
- Rugged construction that has been tested to withstand over 1000lb.
- Industrial grade LEDs providing high-intensity illumination of 136klux (working distance of 100mm).
High flexibility
- Re-configurable for DC, RF, mmW, FA, WLR and more
- Thermal range: -60˚C to 300˚C available
- Upgrade path to meet your future needs
- Stable and repeatable measurements over a wide thermal range
See "Specifications & Details" tab for more key features
- High DC power density up to 150 kW in a single bay rack-mount cabinet. Up to 240 kW in a dual bay rack.
- Fast load transient response provides protection from undesired voltage excursions.
- Fast slew rate with exceptional rise/fall times for speed-critical applications.
- Low ripple suitable for the most sensitive applications.
- Low audible noise with temperature controlled variable speed fans.
- High accuracy voltage/current measurements without external DMMs.
- Modular architecture simplifies sparing and maintenance.
The 0.9 mm SuperMini connectors product line provides the superior performance of Southwest Microwave’s standard-sized, high frequency connectors in a miniaturized footprint which is ideal for reduced-size PCB and panel applications, offering ultra-broad bandwidth and coupling nut mating.
0.9 mm SuperMini connectors are rugged and durable, feature a 360° raised grounding ring and a temperature range of -55°C to 165°C.
The connectors provide mode-free operation through 67 GHz, offering well-matched impedance, excellent repeatability and the industry’s lowest VSWR (1.2:1), insertion loss (0.7 dB) and RF leakage (≤ -100 dB).
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
- Smart Stage: Embedded controller, no separate electronics
- Operate directly using I2C or SPI ASCII commands -or-
- Evaluate with Pathway™ PC Software and USB adapter
- Cost-effective, long-life: For high-volume production
- Small size: 32 x 32 x 10 mm
- High resolution: 0.5 μm with absolute encoding
- High speed: 35 mm/s
- Long stroke: 8 mm
- Power: 5 V DC input, ~ 3.2 W peak when moving
- High repeatability: (± 2 μm typical)
An EMC Chamber with 5 meter test range ensuring EMC compliance testing for Emission and Immunity testing. Ferrite and hybrid pyramidal absorbers are combined in a unique pattern within a SmartShield high performance chamber. Operating at a 5m test distance, this EMC chamber is compliant to CISPR-16-1-4 / ANSI C63.4 with a measurement zone diameter of 2 to 4 meters.
- Power bypass inductance: 8 nH
- Standard DCQ probes have flat tip needles available in nickel-plated tungsten or BeCu with diameters of 0.75 mil, 1.0 mil and 1.5 mil.
- Supports collinear and non-standard needle configurations
- Up to 16 DC for standard; maximum of 24 DC for custom
- Ideal for probing the entire circuit for functional test
- DC probes can provide power or slow logic to circuit under test
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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