FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
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Enables wafer probing up to 100 A pulsed and 10A DC
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Innovative multi-fingertip design provides even distribution of current
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Supports up to 500 V
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Replaceable Tungsten probe tips
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Temperature range of -60°C to 300°C
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Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
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Prevents against thermal runaway
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Measure devices on wafer at higher currents than ever before
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Small scrub minimizes damage to aluminum pad
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Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
More Product Information

- High-intensity LED digits
- Simple to customize for specific applications with our large range of options
- Excellent readability
- Suitable for interior applications

High Intensity Bar Lights with a large degree of available customization:
- 16 available wavelengths
- Expandable in 6″ (150mm) increments up to 84″ (2.13m)
- Optional heat sink for higher performance and/or high ambient temperatures
- Optional light conditioning including polarization and diffusion
- Optional IP65 rated sealing for washdown environments
- – 3 lens options for narrow, medium and wide beam spreads
All available with 2 week lead times

- The Narrow Linear Diffuse Light series is ideal for precision scanning of highly reflective materials.
- The DL151 is available in a wide range of wavelengths and provides up to 28kLux at a 1” (25mm) standoff.
- The extruded aluminum enclosure can be expanded in 2″ (51mm) increments from 2″ to 70″ (1778mm).

Linea line scan cameras deliver the performance and features usually found in high-end cameras at an attractive price point. Based on advanced CMOS line scan technology, Linea GigE cameras have a 2k or 4k single line 7.04 µm x 7.04 µm pixel array. With excellent sensitivity and speed, Linea surpasses the requirements of demanding applications —such as materials grading and inspection, transportation safety, and general purpose machine vision.

- The LL158 Series produces an oblique (30°) line of illumination for line scan applications in a passively cooled design.
- When oriented across a moving web or conveyor line, unlike standard line lights, this linear light’s unique geometry highlights engraved or raised lines that run parallel to the material travel.
- Provides an intensity level of 53kLux (working distance of 75mm).
- Pre-engineered for expandability in 6” (152mm) increments up to 90” (2.28m).
- Available intensity control provides illuminance adjustability for every 6″ increment via a 0 – 10v input.
- Allan deviation σ(τ) = 2.7×10-11 T-1/2 for long life version and σ(τ) = 8.5×10-12 T-1/2 for high performance version
- Front or Rear access connectors
- 3U high (133mm / 5.24”) — less than 200mm depth, compatible with ETSI and 19” standards
- Accuracy better than ±1×10-12 / ±5×10-13 for high performance version
- 10 MHz low noise direct output
- Programmable 1 / 5 / 10 MHz TTL output
- 10 years warranty on cesium tube (3 years for high performance version)
- Redundant DC power supply inputs
- Remote control and monitoring via RS232 (fully manageable locally and remotely using SyncView Plus management system.


- Tiny “all-in-one” solution: no external control board needed
- Superior image quality: sub-micron lens movement with very low tilt. Now with higher dynamic stability
- Low voltage & power: 3.3 VDC input, zero power position hold
- Simple system integration: accepts high-level motion commands over standard serial interface (I2C or SPI)
- Flexible, production-ready system: compatible with M8 to M16 lenses and with typical image formats from 1/3” to 1/1.8”
- Lowest cost, fastest time to market: Fully-engineered “plug and play” solution
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-Noise Binning Mode
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Smear reduction
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Shading correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (39 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets

FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
