FormFactor - Cascade High Current Probe - Test power devices on wafer with high-performance and low-contact resistance on smaller pads
- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad
Designed specifically for testing power devices on wafer, the HCP probe reduces probe and device destruction at high currents by minimizing contact resistance at the wafer-to-probe interface to prevent device heating at the tip. The innovative multi-finger design distributes the current over multiple contact points at the tip and is joined by a single heatsink which pulls heat from the probe tip.
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- Boost performance by up to 3x over its precursor thanks to an Intel x6000 series embedded processor
- Capture high-resolution images at high speed through a choice of CMOS sensors from two to 16 Megapixels
- Deploy in dirty, humid, or harsh industrial environments by way of a compact IP67-rated design
- Communicate actions and results to other automation and enterprise equipment via real-time digital I/Os, and Ethernet (TCP/IP, CC-Link IE Field Basic, EtherNet/IP™2, Modbus® , PROFINET® , and native robot interfaces)
- Handle Human-Machine Interface (HMI) function by way of VGA and USB connectivity
- Simplify vision setup and upkeep via integrated lens focusing and illumination intensity control
- Synchronize to the manufacturing line through the support for incremental rotary encoders
- Solve machine vision applications efficiently with Aurora Design Assistant by constructing flowcharts instead of writing program code
- Maintain control and independence through the ability to code custom flowchart steps
- Tackle machine vision applications with utmost confidence using field-proven tools for analyzing, locating, classifying, measuring, reading, and verifying
- Leverage deep learning for visual inspection through image classification and segmentation tools
- Single or dual-channel display
- Agilent HP 437 & Agilent HP 438, and Boonton 4220A & 4230A emulation
- Automatically loads sensor data
- Simple software control via SCPI language
- IEEE-488 and RS-232 interfaces standard
The 4240 series of CW RF power meters provides the high speed measurement capability needed in a production environment, as well as the simplicity of operation required for bench top use. It provides very accurate measurements from -70 dBm to +44 dBm (sensor dependent) and has a rapid display update rate for tuning applications. The easy to read LCD displays both channels simultaneously with numeric and bar graph information.
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Smear reduction
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24 dB)
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Auto exposure (129 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets
LUMIMAX® LED area lights are for versatile use in all areas of Machine Vision for incident or backlight tasks. Their designs allow for any arrangement around the object to be inspected.
LED Area lights in the LG series are based on our LightGuide technology. State-of-the-art LightGuide technology guarantees the maximum degree of homogeneity and irradiance intensity over the entire light field. Variants with additional collimation accessories improve image contrast and minimise the glare effect at manual workstations. See in our Video - Principle Collimated Backlight Video the detailed principle of the collimated backlight.
The area lights of the LGCB series with a camera hole can also be used as a flat dome within a reflected light application and thus create a full-area, shadow-free illumination of the test object.
With the lightings of the BASIC series even price-sensititve applications can be reliably implemented.The focus here is on the realization of essential functions at high quality. A smart and lightweight design ease the integration in confined or moving machine vision systems.
Power switching up to 16A and high voltage mux cards
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High performance GigE Vision InGaAs SWIR camera
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QVGA resolution
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Power over Ethernet
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no condensation
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efficient cooling with fan
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Nitrogen-filled cooling chamber to avoid condensation
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Up to 344 fps at full resolution
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GigE Vision interface with PoE
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Comprehensive I/O control options
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Automated on-board image correction
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TEC1 sensor-cooling
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Extended operating temperature range
- Image circle: 30 mm - 100 mm
- 11 focal lengths: 28 mm - 120 mm
- Covering a wide working distance range
- Lenses for specific magnifications available
- Very low distortion and high resolution
- V38-Mount, compatible to the V38 mounting system
- Initial apertures: F2.8 - F5.6
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
- MIL-STD-1275E Compliant: Dedicated design for conducted susceptibility testing on 28VDC circuits.
- Spike & Surge Testing: Handles spikes up to 260V / 2J and surges up to 200V / 470J.
- High Current Capability: 16A continuous or up to 400A with the optional DM400 decoupling diode module.
- Adjustable Waveforms: Configurable rise times, pulse durations, and voltages for precise test conditions.
- User-Friendly Control: Remote interface via RS232 or USB, with optional control software for automated testing.
Enhance your EMC testing with the PG1275E Pulse Generator—precision, compliance, and versatility combined.
FormFactor, Inc.
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FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
