Maury MW - Calibrated Noise Sources - NC5000A Series
- Outstanding stability
- Fast switching speed
- Ripple-free response over standard waveguide bands
The NC5000A Series AWGN noise sources feature outstanding stability, switching speed, and ripple-free response over standard waveguide bands. The high stability of the NC5000A Series allows these units to be used in place of cumbersome gas tube noise sources.
Ripple in the output of noise sources has a direct effect on measurement accuracy, so Noisecom has tailored the response of the NC5000A Series so that ripple is minimized throughout the specified frequency range.
|
Noise Output Rise and Fall Times |
Noise Output Variation with Temperature |
Noise Output Variation with Voltage |
Operating Temperature |
Input Power |
|---|---|---|---|---|
|
Less than 1 μs |
Less than 0.01 dB/°C |
Less than 0.1 dB/1 % ΔV |
0 to +85°C | +28 VDC at 30 mA max |
More Product Information
- Frequency Ranges: 9 kHz to 9 GHz, 13 GHz, and 20 GHz
- Measurements: Occupied Bandwidth, Channel Power, ACPR, C/I, Emission Mask, Spurious Emissions, Field Strength
- 3G and 4G Measurement options for LTE (FDD & TDD), CDMA, W-CDMA, WiMAX, GSM, and TD-SCDMA
- Interference Analyzer: Spectrogram, Signal Strength, RSSI, Mapping
- Dynamic Range: > 106 dB in 1 Hz RBW @ 2.4 GHz
- DANL: –164 dBm in 1 Hz RBW @ 1 GHz preamp On
- Phase Noise: –112 dBc/Hz @ 10 kHz offset at 1 GHz
- 1 Hz to 10 MHz Resolution Bandwidth (RBW)
- Tracking Generator up to 20 GHz
- PIM Hunting
- PIM Alert (a downloadable easyTest™ script)
- Standard three-year warranty (battery one-year warranty)
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
- Complete solution - battery test, simulation & solar array simulator software included
- Highest power density up to 37 kW in 4U rack height (9.25 kW/U)
- Fastest and cleanest power available (fastest transient response and low output ripple and noise)
- Universal 3-Phase AC Input accepts 180 VAC to 528 VAC
- Longest manufacturer-based reliability guarantee: 5-year warranty
- Parallel system power up to 1.2 MW
- Output voltage up to 2,000 V
- Bidirectional output current up to ±150 A, up to ±4,800 A in parallel
- True extended wide-range autoranging output
- Regenerative to 95%
- Color touch panel user interface
- Seamless transition between source and sink
- Built-in islanding detection
- Low Noise Amplifier (preamp)
- 9 kHz - 8 GHz
- Typical gain: 27 dB
- Noise Figure: 2.7 dB
- High performance GPS disciplined Time/Frequency standard
- Ethernet Interface for management and control
- Network Time Protocol (NTP)
- Multiple 1PPS outputs with individual delay compensation
- Multiple Low Phase Noise 10MHz outputs with software programmable level
- Time Code outputs including Have Quick, IRIG A, IRIG B, IRIG E, IRIG G
- Sync to GPS or to Have Quick/1PPS per ICD-GPS-060
- Choice of internal disciplined OCXO or Rubidium Oscillator
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-Noise Binning Mode
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Smear reduction
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Shading correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 32 dB)
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Auto exposure (39 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets
- Capture/display/analyze peak and average power
- Frequency range from 4 kHz to 40 GHz
- Industry-leading video bandwidth (195 MHz) and rise time (3 ns)
- Industry-leading 100,000 measurements per second
- Industry-leading 100 ps time resolution
- Synchronous multi-channel measurements (up to 4 channels)
- Sensors can be used as standalone instruments
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Defect pixel correction (on/off)
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Fixed pattern noise correction (on/off)
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Region of interest (ROI)
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Gain (manual control, 0 to 20 dB)
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Exposure (manual control, 44.2 µs to 1.4 s)
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Gamma correction
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Reverse X
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DeviceLinkThroughputLimit (easy bandwidth control)
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Sync out modes: Waiting for a trigger, exposing, readout, imaging
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Storable user sets
The overall performance of a power meter dependents on the power sensor employed. Maury has a variety of quality power sensors to meet virtually all applications. Maury has a complete line of Peak and Average power sensors up to 40 GHz for all of your fast rise time, wide bandwidth and wide dynamic range applications. In this document, browse through our large variety of advanced sensor solutions.
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Maury Microwave is a pioneering leader in the design and manufacture of precision RF and Microwave calibration, test & measurement, and modeling solutions that are powering global efforts toward a more secure, more connected, future.
Maury Microwave offers Measurement and Modeling Device Characterization Systems and Services including nonlinear passive, active and hybrid-active fundamental and harmonic load pull, non-50Ω X-Parameter modeling, pulsed IV Pulsed s-parameters and compact transistor modeling, and patent-pending ultra-fast/accurate noise parameters.
