NEO NXB - 12020A Voltage / Current Breakout Test Box
- On-Off power switch
- 20 A Circuit Breaker
- 8’ Flexible Power Cord
- Outlets – (4) 5-20R
Test Tap:
- 3ft.
- (2) fork terminals (current)
- (1) fork terminals (ground)
- (2) Shielded Banana (voltage)
Multiple outlets provide flexibility in connecting equipment under test. Tester pigtail interface simplifies connecting to a variety of voltage/current measuring systems.
| Voltage | Current | Input | Output | Test Output | Switch/Breaker |
| 120/240 | 20A | AC Line - Cord | 5-20 R [4] | Pigtail | Yes |
Application
More Product Information
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
- NEO 941 parts are AS5836 compatible (Clam Shell Clamps not Included)
- NEO 942 parts are AS1653 compatible (Clam Shell Clamps not Included)
-
15’ Flexible Power Cord
-
IEC C13 / C14 Connectors
Test Tap:
-
3ft.
-
(2) fork terminals (current)
-
(1) fork terminals (ground)
-
(2) Shielded Banana (voltage)
- Up to 96 differential channels per full rack mainframe
- Constantly monitor input signals for fault conditions
- Flexible configurations for detecting edges, out-of-bounds conditions and measuring pulse widths
- Inputs can be masked, inverted, and combined to produce interrupts
- Can be used as a time stamp module and as a digital I/O
- Programmable debounce circuitry prevents erroneous readings
- 10 V and 100 V input ranges
- On-board memory stores events with IEEE 1588 timestamps
- Synchronize reading of input states with other scanned analog channels
The AL-4164 and AL-4166 programmable controllers offer real-time control of positioning subsystems used in near-field and far-field antenna measurement systems. They may be configured to drive planar scanners and general purpose far-field positioners that are encoder-based or involve simultaneous motion.
NEO
NEO offers a line-up of Power measurement breakout boxes designed for use with Yokogawa's precision power analyzers.
Test & Measurement
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