NoiseKen - Impulse Noise Simulator (INS series)
NoiseKen simulators to reproduce fast rise-up noises which are generated when switching ON / OFF electric current on the inductive load.
Since the pulse includes broadband frequency and its rise-up time is fast at 3ns or less, it can make the noise coupling dense and effective to reproduce the malfunctions of electronics equipment under the test.
It can realize performance evaluation of electronics equipment's upon reproduction of line noises which are intruded to the power supply lines or induced noises onto the telecommunication lines.
Discontinuation notice of INS-4020 / 4040 and INS-AX2 series:
In observance of the Minamata convention on mercury, products that include mercury have been restricted of export from Japan. This includes the INS-4020, INS-4040, INS-AX2 series that used a mercury relay switch, and now have been succeeded by the INS-S220 and INS-S420. Maximum output voltage of INS-S220 is 2kV, and that of INS-S420 is 4kV.
Specification
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Paramter |
INS-220 |
INS-S420 |
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Pulse Setting-1 |
0.50kV ～ 0.99kV ±10% 0.01kV step |
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100ns ～1000ns ±10% 50ns step |
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1ms ～ 999 ms ±10% 1ms step |
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Pulse Setting-2 |
1.00kV ～ 2.00 kV ±10% 0.01kV step |
0.50kV ～ 4.00kV ±10% 0.01kV step |
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50ns ～ 1000 ns ±10% 50ns step |
50ns ±15%、100ns～1000ns ±10% 50ns stepp |
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10ms ～ 999 ms ±10% 1ms stepp |
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Output Voltage |
0.5 ～ 2.00kV±10％ （10V step） |
0.5 ～ 4.00kV±10％ （10V step） |
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Polarity |
+ / - |
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Rise Time |
＜3ns |
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Output Impedance |
50Ω |
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Terminal Resistor |
50Ω |
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Pulse Repetition Mode |
LINE PHASE |
50Hz/60Hz coupling phase angle 0 ～ 360°±10° synchronized with L-N of EUT supply or external CDN |
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VARIABLE |
1ms ～ 999ms ±10 %（～ 1kV）10ms ～ 999ms ±10 %（1kV ～ 2kV |
10ms ～ 999ms ±10 % |
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EXT TRIG |
Period：>10ms Input signal level：TTL/open collector negative logic Pulse width：>1ms Also functions for timing reference signals input from an external injection unit. |
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1 SHOT |
Single pulse generation, each time the 1 SHOT button is pressed. Synchronized (phase angle set on the PHASE control) or asynchronized pulse period. |
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Memory Storage |
5 tests |
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Test Time |
1s ～ 999s ±10% 1s step |
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Coupling Switch |
L(+), N(－), PE ／ PULSE OUT ※manual switch by coaxial cable |
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Coupling Mode |
common-mode / normal-mode ※manual switch by short plug |
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EUT Power Capacity |
Single phase AC240V / DC125V 16A (L(+), N(－), PE) |
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External Control |
- |
RS-232C compliant optical communication |
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Power Supply |
AC100 ～ 240V 50Hz/60Hz |
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Operating Temperature / Operating Temperature |
15 ～ 35℃ / 25 ～ 75％ |
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Dimensions / Weight |
（W）430×（H）249×（D）540mm (protrusions excluded) / approximate 20kg |
（W）430×（H）349×（D）540mm (protrusions excluded) / approximate 23kg |
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HV Coaxial Cable |
NMHV type ※ NoiseKen original |
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Accessories |
coaxial cable 30cm (02-00013A): 2pcs, SG short plug (02-00106A): 1pc, SG cable (05-00103A): 1pc, outlet panel: 1pc, AC cable: 1pc, manual instruction: 1 volume, accessory bag: 1pc |
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To solve the trouble in the market high frequency, energy volume of test pulse can be adjustable
Even narrow pulse with 50ns-100ns width contains less energy, twice fast transient due to rise and fall and inducted coupling occurred by sharp electromagnetic field effect electric circuit greatly.
Wide pulse with 800ns-1000ns contains more energy, so voltage fluctuation is easily to effect circuit.
The rise time of impulse simulator is faster than IEC61000-4-4 fast transient/burst test, so spectrum is high. When it injects noise to EUT, noise is easier to invade electric circuit internally.
Spectrum and amplitude is different due to Impulse width, so it is recommended to test with different pulse width.
Test reproduction is improved. More quantitative test is available.
The usual mercury relay changes into semiconductor relay, so test pulse stability is improved. More quantitative and high reproduction test is available. Also, waveform distortion due to mercury relay's deterioration.
Mal-function rate is up. Test time is to be shortened.
The repetition of pulse in test is faster than the old product. Mal-function rate is up and test time is expected to be shortened.
Connection is simplified. Connection time is shortened.
Outlet panel to which EUT is easyily to be connected is adopted. EUT is easy to connect by using outlet panel ( sold separately ) complying to each country's socket shape.
INS Test Setup Example
Method or test to power supply lines
- Connect power supply line for EUT to EUT LINE INPUT on the simulator main unit (hereafter called as main unit) through an isolation transformer
- Lay a ground plane and insulation sheet under main unit and EUT, and ground them for securing
- Connect power supply cable of EUT to main unit (Fold and bind the cable so it can be short in case the length is long)
- Connect short adaptor to SG. Connect SG terminal of main unit and FG terminal (In case it is there) of EUT to ground plane with low impedance braided wire shortly and securely
- Connect 50Ω TERM OUT connector to connector of phase (L1 or L2, PE if necessary) the noise is intended to be injected with coaxial cable
Method or test to interconnection lines
- ①Lay a ground plane and insulation sheet under main unit and EUT, and ground them for securing
- Open coupling adaptor CA-805B (Option) and clamp interface cable with the adaptor. Connect connector of the adaptor to PULSE OUT of main unit. Connect the one another connector of the adaptor to 50Ω TERM IN of main unit. In case for coupling adaptor CA-803A (Option), connect PULSE OUT of main unit and connector of the adaptor
- Connect power supply cable of EUT to arbitrary power source since no high voltage pulse is injected in this test
- Connect SG terminal and FG terminal of EUT to ground plane
More Product Information
- A real-time diagnostic tool supports EMC/EMI debugging.
- Fast visualize EMC/EMI problems.
- Enables easy comparison of countermeasures before and after.
- Capable of measurement from entire products to single components.
- Factor-editor function provides correction of antenna characteristics, cable loss and preamplifier.
- User friendly compact design.
- Customer supplied spectrum and probes acceptable (Please consult)
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High SNR mode (up to 24 dB better signal-to-noise ratio)
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Low-noise binning mode
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Smear reduction
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Shading correction
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Defect pixel correction
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Area of interest (AOI), separate AOI for auto features
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Binning
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Decimation
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Auto gain (manual gain control: 0 to 24 dB)
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Auto exposure (636 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation, color correction
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Reverse X
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count)
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Storable user sets
Thin plate broadband antenna has been developed for efficient immunity testing against hand-held transmitters and cellular phones. Many pieces of spot frequency antennas had to be used in turn thus fur. This new Thin-plate Broadband Antenna is a single antenna solution eliminating the need for antenna changes and dramatically reducing the test time. Furthermore, this antenna with its small-size and lightweight properties and a flexible handle is suitable for testing in narrow spaces.
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A wide frequency range eliminating the need for antenna changes
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30W maximum power input allows high filed strengths
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High efficiency due to a low VSWR and high gain
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Suitable for broadband digital modulation thanks to a good VSWR flatness
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Small, light-weight and flat antenna easy to use in narrow spaces
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Easy handling with a flexible arm
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A wide radiation pattern makes directivity of the fields no longer an issue
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High SNR mode (up to 24 dB better signal-to-noise ratio)
-
Low-noise binning mode
-
Shading correction
-
Defect pixel correction
-
Area of interest (AOI), separate AOI for auto features
-
Binning
-
Decimation
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Auto gain (manual gain control: 0 to 24.4 dB)
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Auto exposure (25 µs to 67 s)
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Auto white balance
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Look-up table (LUT)
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Hue, saturation
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Color correction
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Local color anti-aliasing
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Reverse X/Y
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Deferred image transport
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Trigger programmable, level, single, bulk, programmable delay
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Sequence mode (changes the camera settings on the fly)
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SIS (secure image signature, time stamp for trigger, frame count etc.)
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Storable user sets
Scope of delivery
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Camera and IEEE 1394b cable (other configurations on request)
Focus recommends TRL Calibration Kits for applications such as load pull & noise parameters. Due to high reflection and low loss, tuner S-parameter measurements represent a challenge for VNA’s, because of error term determination and coupler directivity. Long experience has taught us not to rely on other calibration techniques than TRL (Thru-Reflect-Line). The popular SOLT technique is conditionally useable, but not guaranteed, up to 4GHz. The much convenient ECal method has provided questionable and inconsistent results. Our Customers are advised to be very careful with VNA calibrations, because the whole measured data depends on that.
Because of this, and to save our customers time and doubt, Focus has developed and offers a set of precise and reliable TRL calibration kits from 0.03 to 110 GHz with the following connector types: 7/16, N, APC-7, 3.5mm, 2.9mm, 2.4mm, 1.85mm, WR-15, WR-10. Our calibration kits are compatible with all commercial network analyzers.
For more information on TRL Calibration Kits, please read the following paper on TRL Versus SOLT
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High SNR mode (up to 24 dB better signal-to-noise ratio)
-
Low-noise binning mode
-
Smear reduction
-
Shading correction
-
Defect pixel correction
-
Area of interest (AOI), separate AOI for auto features
-
Binning
-
Decimation
-
Auto gain (manual gain control: 0 to 24 dB)
-
Auto exposure (129 µs to 67 s)
-
Auto white balance
-
Look-up table (LUT)
-
Hue, saturation, color correction
-
Reverse X
-
Deferred image transport
-
Trigger programmable, level, single, bulk, programmable delay
-
Sequence mode (changes the camera settings on the fly)
-
SIS (secure image signature, time stamp for trigger, frame count)
-
Storable user sets
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Provides an effectively noise free environment around the device under test (DUT)
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World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
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Up to 4x faster flicker noise thermal testing on 30 μm pads
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Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
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Provides fully managed and filtered AC power to the entire system – prober and instruments
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Filters harmful noise generated by external thermal control systems
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Reduced “antenna effect” injection of unwanted RF noise into the measurement path
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Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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User-centered design minimizes training costs and enhances efficiency
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
See more Key Features on Specifications & Details tab
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
- Low noise
- Excellent line⁄load regulation
- Coarse and fine voltage controls
- Constant voltage or constant current operation with automatic crossover and mode indication
- Individual ON⁄Off switch per output (not including fixed output)
- Switchable 3.3V⁄5V output on triple output model
- Switchable remote sense (XPH 1810 and XPH 4210 models)
NoiseKen
For over 40 years from its foundation in 1975, Noise Laboratory has been focusing on immunity test equipment and related solutions.
Now their product lines include various types of immunity test equipment ranging from those conforming to IEC 61000-4 series standards, other international or national immunity standards and even to customer's in-house test standards.
Contact Details
Shinyei Corporation of America Head Office - Sole Authorized distributor of NoiseKen products
1120 Avenue of the Americas, 4th Floor, New York, NY 10036, USA
Phone: 917-484-7884
Fax: 212-704-4206
Test & Measurement
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