• Supports PCI Express Rev 2.0 x4 or higher, backwards compatible with PCIe Rev 1.10 slots 
• Up to 512MB of high-speed image memory 
• Single slot solution with reconfigurable camera control and general purpose input/outputs

• Compact probe head
• Supports fine pitch SMD probing
• Rugged, sharp tip
• HF optimized connection accessories
• Over 30 accessories
• Low input capacitance

Linea line scan cameras deliver the performance and features usually found in high-end cameras at an attractive price point. Based on advanced CMOS line scan technology, Linea GigE cameras have a 2k or 4k single line 7.04 µm x 7.04 µm pixel array. With excellent sensitivity and speed, Linea surpasses the requirements of demanding applications —such as materials grading and inspection, transportation safety, and general purpose machine vision.

With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.

• Static power analysis - like a dedicated power analyzer
• Dynamic power analysis – capture more information
• Complete test coverage – control system, power section, motor
• Comprehensive mechanical interface
• Harmonics calculation option
• Vector display option (THREEPHASEVECTOR)
• Waveform Transformations option (THREEPHASEdq0)
• 16 Channels with OscilloSYNC™

AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

• 150 MHz, 2 analog channels
• 8 synchronized digital channels (T3AWG2152-D only)
• 16-bit vertical resolution
• 128 MPts @Ch waveform memory
• Max sampling rate of 600 MS/s

An affordable yet high performance solution for all AFG and AWG functions, specializing in key applications such as Automotive Ethernet Transmitter Distortion Test and Double Pulse Testing. The 8 synchronized digital channels (T3AWG2152-D only) are ideal for digital design debugging and validation.

• Highest resolution – 12 bits all the time 
• More capability – integrates multiple instruments into one 
• Comprehensive probe support – supports over 30 probes in 9 categories 
• MAUI with OneTouch user interface for intuitive and efficient operation