High voltage differential probes provide high CMRR over a broad frequency range (up to 400 MHz) to simplify the measurement challenges found in noisy, high common-mode power electronics environments. The probe’s design is easy-to-use and enables safe, precise high voltage floating measurements.

• 500 MHz - 4 GHz bandwidths 
• Up to 40 GS/s sample rate 
• 15.4” capacitive touch screen 
• MAUI with OneTouch 
• Powerful, Deep Toolbox 
• Exceptional Serial Data Tools 
• 16 digital channels with 1.25 GS/s 
• Huge Applied Offset Range 
• Optional Application Packages

• Bandwidth models from 8 GHz to 30 GHz
• Low loading and high impedance for minimal signal disturbance
• Wide variety of tips:
  • Standard and high-sensitivity 30 GHz solder-in tips
  • High-temperature solder-in tip with 1-meter lead
  • QuickLink adapter for mixed-signal probing
  • Handheld browser tip
  • Tips for direct oscilloscope connection to CrossSync PHY protocol analyzer interposers
• Built-in tip identification for simple setup and precise signal reproduction
• Ideal for debug and validation of:
  • PCIe 1.0 to 6.0
  • DDR3/LPDDR3
  • DDR4/LPDDR4/LPDDR4X
  • DDR5
  • Other high-speed serial interfaces

• Uses standard PC Ethernet port & hardware 
• Supports cable lengths up to 100 m (CAT-5e or CAT-6) 
• Simplified set-up with field proven Sapera LT software featuring CamExpert 
• Engineered to accommodate industrial environment with a ruggedized screw mount RJ-45 connector

Fully Integrated: With the ProBus™ interface, the AP033 becomes an integral part of the oscilloscope. The probe sensitivity and offset can be controlled from the oscilloscope front panel, the probe front panel, or by using remote control commands (GPIB or RS-232). Sensitivity, offset, input capacitance, and common mode voltage range are displayed on the oscilloscope screen. When used with a LeCroy digital oscilloscope, no external power supply is required.

• High speed 60 kHz x3 (Color) or 120 kHz (Mono), and high resolution 28 μm or 900 dpi 
• No missing or interpolated pixels 
• Exposure control 
• RGB colors (Color) or Mono/HDR mode
• Precalibrated pixel size for metrology applications 
• Camera Link HS fibre interface

• Choice of 4 GHz or 6 GHz bandwidth models
• Up to 5 Vpk-pk dynamic range with low noise
• ±3 V offset range
• Low loading and high impedance for minimal signal disturbance
• Ideal for DDR2, DDR3, LPDDR2
• Deluxe soft carrying case
• Innovative QuickLink architecture
• Wide variety of tips and leads
  • Solder-In Lead
  • Optional Positioner (Browser) Tip
  • Quick Connect Lead
  • Square Pin Lead
  • HiTemp Solder-In Lead

AI, cloud computing, and hyperscalers are accelerating the demand for ultra-high-speed, low-latency connectivity, taking us past Gigabit Ethernet and into the era of Terabit Ethernet.

Teledyne LeCroy’s Terabit Ethernet solutions are engineered to help you take full advantage of this new technology cycle. The Xena Ethernet Test Platform gives developers of semiconductor, NEMs, and hyperscalers the solutions they need to validate next-gen silicon, network devices, and interconnects with confidence.

From Layer 1 signal integrity and Layer 2 traffic generation and analysis, we have the solutions you need to simulate, stress, and certify real-world performance. Support for 224Gbps electrical lanes, advanced FEC, and PCS diagnostics ensure readiness for tomorrow’s networks. Compact, desktop-friendly hardware combined with intuitive software and powerful automation ensure seamless lab-to-production workflows.

Whether you’re path-finding 1.6T or optimizing 800G deployments, Xena can fast-track your innovation cycle. Test smarter, deploy faster and reap the rewards.

• Global shutter and rolling shutter CMOS sensors available 
• USB3 Vision 
• High sensitivity with both front and back illuminated sensors (BSI) 
• Side mounted USB connectors for ease of use in OEM solutions 
• High sensitivity with pixel sizes from 2 µm to 3.45 µm 
• Windows operating system and Linux SDKs (for embedded vision systems) 
• 3-Year Warranty