VTI Instruments - VXI Chassis
VXI Chassis include 6-slot VXIbus mainframes (CT-100C), 5-slot VXIbus mainframes (CT-310A), and modular 13-slot VXIbus mainframes (CT-400, pictured).
The first VXIbus specification was introduced to the test and measurement community in 1987 and was initially developed to provide a card-based instrumentation platform for applications that required high density and high performance. The platform continues to thrive today by leveraging off the original specifications which define the necessary physical (real estate/cooling) and electrical standards for demanding applications and has established itself as the ‘time-tested bus you can trust’ for requirements that must be supported in excess of ten-fifteen years.
The VXIbus was well conceived by leading test and measurement companies to solve the most demanding test applications. The VXIbus is established. It has a 25+ year history of success and continues to be the leading modular instrument test platform. The VXIbus is time tested, providing systems designers with security in the knowledge that their test platform will outlive the device being tested. The VXIbus is thriving and has proven that it has the flexibility to evolve with the development of new technologies.
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CT-100C |
6-slot VXIbus mainframe |
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CT-310A |
5-slot VXIbus Mainframe (for Rack and Portable Use) |
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CT-400 |
Modular 13-slot VXIbus Mainframe |
More Product Information
- Combine up to 6 SPDT and 6 multiport high-performance building blocks in a 2U footprint
- Extended life and self-terminating options provide maximum design flexibility
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI Trigger Event implementation provides seamless test synchronization with external devices
- 24-bit, delta-sigma ADC, simultaneous sampling
- Programmable Sample Rate up to 128kSPS
- Full, Half & Quarter Bridge with 120Ω, 350Ω & 1kΩ bridge completion
- Voltage Excitation: 0.5V to 10V
- Current Excitation: 0.46mA
- 2-Wire & 4-Wire Ohms/RTD
- Bridge Zero Balancing
- Built-In-Self-Test (BIST)
- Strain Lead Wire Calibration
- Shunt Calibration: 50kΩ, 100kΩ & External provided by User
- TEDS Support
- LXI Ethernet Interface
- IEEE-1588 Synchronization
- Power over Ethernet (PoE) or 10–50 V DC input
- Built-in Parallel Data Streaming
- Full-featured Embedded Web Interface
- Compact 1U Half-rack Form Factor
The SMP7500 is a 96-channel 300MA open-collector/relay drivers, and the SMP7600A (pictured) and SMP7600A-S-11351 are 5 W programmable loads.
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Provides an effectively noise free environment around the device under test (DUT)
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World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
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Up to 4x faster flicker noise thermal testing on 30 μm pads
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Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
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Provides fully managed and filtered AC power to the entire system – prober and instruments
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Filters harmful noise generated by external thermal control systems
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Reduced “antenna effect” injection of unwanted RF noise into the measurement path
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Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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User-centered design minimizes training costs and enhances efficiency
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
See more Key Features on Specifications & Details tab
- Combine up to 12 fail-safe building blocks, dual SPDT, SP4T, SP6T, or transfer switch in a compact 1U footprint
- Front “pluggable” relays facilitate field maintenance
- Embedded web interface provides interactive utility to monitor and control relays from anywhere in the world
- Flexible API supports IVI and Linux development environments minimizing software investment
- LXI Trigger Event implementation provides seamless test synchronization with external devices
- Store up to 128 relay state configurations for quick recall, including an automatic power up state
- Define exclude lists to avoid setting an undesirable configuration
- Relay odometer tracks closures to facilitate preventative maintenance
- 8 frequency counter channels, 16 isolated digital I/O channels, 2 isolated DAC channels in a single card
- Single frequency measurement range that works from 0.05 Hz to 1 MHz
- Very stable TCXO base clock, 50 MHz ±1 ppm
- 195 kΩ Input impedance with selectable coupling (AC/DC)
- Wide differential input voltage range (±48 V) with up to 250 V working common mode voltage
- Programmable threshold and hysteresis levels with 1 mV resolution
- Support for quadrature encoder
- Isolated DIO channels with up to 60 V compliance
- Isolated and independent 16-bit DAC channels, configurable for voltage or current output
The LXI mainframes family includes 2-slot, half-rack LXI switching and data acquisition mainframes (EX1202/EX1262), 16-slot, 3U LXI switching and data acquisition mainframes (EX1208A and EX1208B, pictured), and 6-slot, 1U LXI switching and data acquisition mainframes (EX1206A).
- 8 frequency counter channels, 16 isolated digital I/O channels, 2 isolated DAC channels in a single card
- Single frequency measurement range that works from 0.05 Hz to 1 MHz
- Very stable TCXO base clock, 50 MHz ±1 ppm
- 195 kΩ Input impedance with selectable coupling (AC/DC)
- Wide differential input voltage range (±48 V) with up to 250 V working common mode voltage
- Programmable threshold and hysteresis levels with 1 mV resolution
- Support for quadrature encoder
- Isolated DIO channels with up to 60 V compliance
- Isolated and independent 16-bit DAC channels, configurable for voltage or current output
- Direct PC bus access data acquisition system provides the required sampling rate and resolution to meet IEC 61000-4-7 measurement requirements and supports high-speed data transfers.
- PC-based Harmonic and Flicker test software provides real-time full-color data display updates and continuous PASS/FAIL monitoring.
- Automatic calculation of the maximum permissible system impedance Zsys, using the Zref and measured Flicker parameters, as required per EN/IEC 61000-3-11.
- Intuitive operating software provides IEC test setup, data analysis, display, with test reports in and MS Word format.
- High resolution, no gap acquisition data storage to ensure that all data can be streamed to disk (in ASCII format if needed) for later review and replay of the actual test.
- Single Step and Fast playback mode of test results.
VTI Instruments
VTI Instruments, an AMETEK Programmable Power brand, provides products and systems which are used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems. VTI Instruments is recognized as an industry leader with a reputation of providing reliable data, first time, every time. A sustained focus on innovation and technology enables customers to optimize their capital investment through product longevity, while ensuring unmatched measurement integrity and data reliability.
VTI Instruments has customers in over 30 different countries and in a wide variety of industries including aerospace, defense, power generation, automotive and consumer electronics.
Contact Details
AMETEK Programmable Power, Inc. (VTI Instruments) − San Diego
9250 Brown Deer Road, San Diego, CA 92121, USA
Phone: 858-450-0085
Fax: 858-458-0267
Email: sales.ppd@ametek.com for general inquiries
Test & Measurement
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