In this webinar, Eric reviews why de-embedding is necessary and explains the math that underlies the de-embedding calculations as well as the process by which the measured test fixture is removed from the device-under-test measurement (as described in the IEEE 370-2020 standard). Eric explains and compares the 2x-Thru, 1x-Thru and in situ methods and provides a live demonstration using a test fixture board and various test boards.

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All registrants will receive a link to the recording after the live event.