With their radial and flat incoming light, LUMIMAX® LED Dark Field Illuminations are the preferred option for inspecting surfaces. Their special light guide means that this LED Dark Field Illumination geometry can be used to show edges, cavities and other surface defects in high contrast.

The Dark Field Lights in the DFL series are available in several sizes for continuous and strobe mode.

Integrated controllers, powerful LEDs and standardised LUMIMAX® connections guarantee simple and stable integration of the LED Dark Field Illumination into the system environment.

• The Linear Coaxial Light provides a type of diffuse illumination; diffuse light from an internal source is folded downwards along the camera’s imaging axis and onto the imaging plane. 
• High speed machine vision line scan applications receive greater image contrast with a Linear Coaxial Light. 
• The DL110 includes a high efficiency, coated, easy to clean dust cover to protect the beamsplitter.

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements

• Supports all cellular technologies compliant with 3GPP/3GPP2 UE RF TRX tests including LTE/LTE-Advanced, Cat-M1/NB-IoT, NTN NB-IoT, W-CDMA/HSPA, GSM/EGPRS, TD-SCDMA/HSPA
• Support LTE-Advanced Downlink Carrier Aggregation 5CCs SISO tests in one unit
• Supports LTE-Advanced Downlink Carrier Aggregation 2CCs 4x4 MIMO and 4CCs 2x2 MIMO tests in one unit
• Supports LTE-Advanced Downlink Carrier Aggregation 4CCs 4x4 MIMO and 6CCs 2x2 MIMO tests in two units
• Supports LTE-Advanced Downlink Carrier Aggregation 5CCs 4x4 MIMO tests in three units
• Supports VoLTE voice/video echoback tests
• Supports up to 6 GHz
• 160 MHz wide frequency bandwidth (Generator/Analyzer)
• Next generation GUI with large touch panel
• Backwards compatibility with the MT8820 series

Flexibility

• DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
• Full thermal range of -60°C to +300°C
• Compatible with TopHat or IceShield
• Usage of manual and motorized positioners, probe cards within EMI-shielded environment
• Upgrade path to meet your future needs
• Stable and repeatable measurements over a wide thermal range

High accuracy and repeatability

• Reliable and repeatable contact
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Advanced EMI-shielding with PureLine and AttoGuard technologies available
• Superior low-leakage and low-noise measurements
• Safe and accurate hands-off testing
• Minimizes settling times for efficient measurements over full thermal range

See "Specifications & Details" tab for more key features

OptoVue

• Revolutionary technology advancement for wafer and die-level photonics probing
• Real-time in-situ calibrations
• Singulated die testing
• True die-level edge coupling
• In-situ power measurements
• Advanced calibration technologies
• Enables autonomous measurements

Horizontal Die-Level Edge Coupling

• Highest accuracy in test results
• Lowest coupling loss
• Repeatable measurement results due to exclusive automated fiber-to-facet alignment technology
• Reduced risk of damaging fibers with collision avoidance technology
• Ease of use for less experienced users
• Enables close simulation of real-world conditions with device performance closest to the final application

See "Specifications & Details" tab for more key features

Measurement Accuracy

• Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
• Minimize AC and spectral noise with effective shielding capability
• Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
• Shortest signal path test integration for accurate, thermally stable, and low-error data collection

See "Specifications & Details" tab for more key features

• High Intensity: up to 9x brighter than the existing SL191 Pattern Projecting Spot Light and more than 3x brighter than the leading competitive structured light projector. 
• Projection patterns are easily configured with available reticles, including line, grid, cross, multiple lines, and half sphere, with custom reticles available. 
• Customizable: available in multiple wavelengths, including white. 
• Constructed with a large heat sink for improved LED thermal management to facilitate increased brightness while maintaining safe operating temperatures. 
• Ideal solution for machine vision inspection applications requiring structured illumination, including edge detection, locating offsets, and assessing topography. 
• Requires a reticle and lens (sold separately); see available reticles here.

• With an intensity of over 150 klx at 300 mm WD in continuous operation, the SL316 UltraSeal Spot Light delivers industry-leading intensity with consistent uniformity. 
• Available with narrow, medium, and wide lensing options as well as a non-lensed configuration for high dispersion. 
• Configurable in eleven wavelength options. 
• Compatible with all Ai inline and discreet control systems. The SL316 can be operated in continuous, gated continuous, pulsed, and adaptive pulsed modes with dimming options for brightness control.