AMETEK - Thermal Vacuum Heater Power - TVAC satellite chamber
Total power subsystem integration
- Ethernet communication
- Full sub-system wiring
- Single P.O.
- Custom interface to suit customer requirements
Description |
TVAC Satellite Chamber |
---|---|
Industry |
Space Power |
Application |
Power Bus |
Function |
Provides programmable power to heater elements |
More Product Information

- High Intensity: up to 9x brighter than the existing SL191 Pattern Projecting Spot Light and more than 3x brighter than the leading competitive structured light projector.
- Projection patterns are easily configured with available reticles, including line, grid, cross, multiple lines, and half sphere, with custom reticles available.
- Customizable: available in multiple wavelengths, including white.
- Constructed with a large heat sink for improved LED thermal management to facilitate increased brightness while maintaining safe operating temperatures.
- Ideal solution for machine vision inspection applications requiring structured illumination, including edge detection, locating offsets, and assessing topography.
- Requires a reticle and lens (sold separately); see available reticles here.

- Enables wafer probing up to 100 A pulsed and 10A DC
- Innovative multi-fingertip design provides even distribution of current
- Supports up to 500 V
- Replaceable Tungsten probe tips
- Temperature range of -60°C to 300°C
- Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
- Prevents against thermal runaway
- Measure devices on wafer at higher currents than ever before
- Small scrub minimizes damage to aluminum pad
- Small footprint – tip fits on a 1 mm pad

Environmental Control
- Wafer temp verified <4.5 K (with 44 RF probes in contact)
- Magnetic field suppression to <200 nT
- Highly uniform wafer temperature
- Precise thermal stability and control
- Solid construction with granite base enables precision motion and vibration control
See "Specifications & Details" tab for more key features

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Functional temperature range of -263 to +150°C
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Stainless steel tip material for thermal decoupling
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Coaxial cable with TCE matched inner and outer conductors
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Consistent tip geometry even at cryogenic temperatures

Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features

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Best price per contact – typically over one million (1,000,000) touchdowns
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RF/Microwave signal is shielded and completely air isolated in the probe body
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Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
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Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
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Probe on any pad material with minimal damage

When a catalog product cannot completely satisfy a requirement, AMETEK Programmable Power's Solutions Business provides custom power supply systems and integrations. The solutions range from OEM integration for medical and semiconductor industries to modular avionics ATE power subsystems to turnkey solar array simulators for satellites. We also can modify power supplies to meet your application requirements.

- The SL164 is characterized as a Compact High Intensity Spot Light with sufficient thermal management to provide 200kLux at a working distance of 4” (100mm).
- A very wide range of wavelengths are available from UV to IR.
- Multiple beam spreads are also available as is a diffuser option.

- Light-tight version and EMI-shielded version for low noise and light-sensitive measurements
- Application flexibility, ideal for use in high frequency applications
- Sized to accommodate thermal chucks, laser cutter, and video equipment on the probe system
- Suitable for integration with vibration isolating tables

AMETEK Programmable Power
Located in San Diego, California, AMETEK Programmable Power designs, manufactures, and markets precision, AC and DC programmable power supplies, electronic loads, application specific power subsystems, and compliance test solutions for customers requiring and valuing differentiated power products and services. Also part of our business is VTI Instruments, which delivers precision modular instrumentation and systems for electronic signal distribution, acquisition, and monitoring, used in the world's most demanding test applications.
AMETEK Programmable Power boasts one of the industries' broadest portfolios of programmable power products under the well-known and respected Sorensen, Elgar, and California Instruments brands. AMETEK Programmable Power’s products serve a wide range of stimulus (T&M) and process power needs in applications including semiconductor fabrication, commercial and defense ATE, oil exploration, solar array and battery string simulation, avionics, general R&D and EMC compliance testing.
VTI Instruments provides products and systems which are used to monitor and record data that characterizes the physical integrity and performance of aircraft, engines, and other large structures, as well as automate the functional testing of complex electronic systems. VTI Instruments is recognized as an industry leader with a reputation of providing reliable data, first time, every time.
With strong brands, a broad product portfolio, exceptional precision power conversion and control expertise, proven power system integration capabilities and deep applications knowledge, AMETEK Programmable Power is your source for programmable power supplies, precision data acquisition instruments, and more.
Contact Details
AMETEK Programmable Power, Inc. − San Diego
9250 Brown Deer Road, San Diego, CA 92121, USA
Phone: 858-450-0085
Fax: 858-458-0267
Email: sales.ppd@ametek.com for general inquiries
Test & Measurement
