FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
Customization Examples

Waveguide with customized bracket

300 mm chuck with large tweezer pocket

RF positioner with micrometer screws

Double-side setup for emission microscopy

Combined microscope movement for scope and black body

mmW setup with North/South positioner platform
More Product Information

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Long holding time: 80 hours with 10 STP liter He-3 gas
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Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
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Sample can be loaded or removed when the cryostat is cold
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Low noise, low vibration
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Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)

The highly flexible modular GMDR system is a versatile and future-proof solution for acquisition, recording, dissemination and replay of FTI data in ground station applications.
With its high integration, incomparable range of supported video interfaces and full compatibility with global leading MDR products, the GMDR integrates seamlessly into customers‘ existing test range topologies.
With its intelligent data reduction through segmentation, pre-selection and filtering as well as the capability to freely disseminate subsets of data among several network destinations, GMDR efficiently reduces the operator‘s workload when analyzing test results.
For standard PCM/Ch7-Telemetry applications, two simplified, cost-efficient variants with integrated PCM/Ch7-Telemetry signal boards and one Data Express technology (DE50)- compatible storage media slot are available.

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Combined eye-pieces and CCD camera mount
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3x zoom and quick lens exchange
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Engraved guides on mmW platen
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Supports broadband, load pull, coax RF and banded waveguide configuration
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Rock-solid mechanical design
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Submicron stage accuracy

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Advanced MicroVac chuck surface for minimum contact resistance between wafer and chuck
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Safety-rated interlock system for high-power testing (meets EN 60947-5-1, EN 60204-1)
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Supports fully automated testing up to 10kV by eliminating arcing point
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Full wafer access via locking roll-out stage
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Coaxial, triaxial, and pin jack feed-troughs available
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Convenient instrument connection kits
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Load/unload wafer to hot/cold chuck (-60° C to +300° C)
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Up to 15% faster transition times than other systems in the market

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Highly stable granite base
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Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
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Re-configurable for DC, RF, mmW, FA, WLR and more
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Multiple accessories: Thermal chucks, motorized microscopes and positioners, dark box, and more
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Low-profile, straightforward design
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Easy and ergonomic operation
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Front or backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module
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Front or backside probing capability

- A real-time diagnostic tool supports EMC/EMI debugging.
- Fast visualize EMC/EMI problems.
- Enables easy comparison of countermeasures before and after.
- Capable of measurement from entire products to single components.
- Factor-editor function provides correction of antenna characteristics, cable loss and preamplifier.
- User friendly compact design.
- Customer supplied spectrum and probes acceptable (Please consult)

- Boost performance by up to 3x over its precursor thanks to an Intel x6000 series embedded processor
- Capture high-resolution images at high speed through a choice of CMOS sensors from two to 16 Megapixels
- Deploy in dirty, humid, or harsh industrial environments by way of a compact IP67-rated design
- Communicate actions and results to other automation and enterprise equipment via real-time digital I/Os, and Ethernet (TCP/IP, CC-Link IE Field Basic, EtherNet/IP™2, Modbus® , PROFINET® , and native robot interfaces)
- Handle Human-Machine Interface (HMI) function by way of VGA and USB connectivity
- Simplify vision setup and upkeep via integrated lens focusing and illumination intensity control
- Synchronize to the manufacturing line through the support for incremental rotary encoders
- Solve machine vision applications efficiently with Aurora Design Assistant by constructing flowcharts instead of writing program code
- Maintain control and independence through the ability to code custom flowchart steps
- Tackle machine vision applications with utmost confidence using field-proven tools for analyzing, locating, classifying, measuring, reading, and verifying
- Leverage deep learning for visual inspection through image classification and segmentation tools

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True wire-speed impairment @ 100Gbps (plus 50 / 40 /25 & 10Gbps)
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Ease of use – Chimera is a stand-alone impairment tool that integrates seamlessly with Xena’s Valkyrie traffic generator, letting you speed up your work flow by using the same SW to both generate and impair Ethernet traffic.
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Highest port density in the industry – plus you can reserve individual port-pairs without blocking access to the others
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Setting up custom impairment distributions is a breeze
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Chimera supports a broad range of impairments (latency/jitter, packet & port impairments, flexible distributions, BW shaping etc)
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Powerful, easy-to-use automation & scripting options

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World’s fastest production line tester
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Ultra-simple web-browser UI - 3 clicks to complete test cycle
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Seamless parallel test case execution
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Displays test status, progress, and real time logs
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Easy to script using CLI and RESTapi from any software environment, for rapid integration with customers own UI applications
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Telnet feature makes it easy to remotely check DUT status (e.g. LED, USB and REGEDIT), and modify DUT configuration
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Interface with customer Manufacturing Execution System (MES) system via DLL/ SQL/HTTP, to store test results into its database
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Vantage can test all Ethernet speeds from 100M up to 400G speeds (including both NRZ & PAM4)
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It is based on Xena’s Valkyrie platform making it the industry’s most stable and accurate Ethernet production test solution
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Free software & free tech support product lifetime

FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement

