The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

Resistance decade box with 1 Ω - 1.2 MΩ range, high accuracy and temperature stability. Best resolution 10 μΩ, RTD temperature sensor simulation feature.

• Real resistors switched by relays
• Custom units and time sequences
• No residual resistance
• 20 ppm accuracy
• Six different languages

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements

Flexibility

• Different substrate carriers for wafers up to 200 mm or single dies
• Probe cards and/or up to eight positioners
• Use with liquid nitrogen or helium, depending on the target temperature. Or use of cryo-cooler for dry-cooling option.
• Accessories available, such as black bodies and optical motion analysis tools
• Optional upgrade for 300 mm wafer
• Designed for industrial environments
• Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
• Ideal for small structures

See "Specifications & Details" tab for more key features

The MDR-GT / GTS is the ultra-fast on-board flight test (16 Gbps) instrumentation solution. The MDR family is technically based on a common mainframe with many high-end built-in interfaces and functions. The MDR-GT / GTS is highly customizable: functions and requirements can be addressed by adding dedicated interface modules, offering a variety of configuration options for all applications and requirements (MDR modules compatibility). Because Cybersecurity is key, the MDR-GTS has been built with secure functions: Data-At-Rest (FIPS 140-2), Key Access Management, Removable Non-Volatile Memory.

• Capture from legacy to the latest video sources through support for SD analog to UHD digital formats 
• Connect and switch between different video sources via Mini DisplayPort, HD-BNC, HDMI, and custom analog DVI1 connectivity 
• Handle multiple video sources with the simultaneous capture of up to eight HD or two UHD streams2 
• Optimize video transmission and storage through onboard multi-stream H.264 encoding 
• Minimize system footprint by way of a single-slot PCIe card design 
• Simplify application development using the Aurora Imaging Library, formerly Matrox Imaging Library (MIL), software development kit (SDK) 
• Deploy on a current platform of choice with support for 64-bit Windows® 7/10 and Linux

• Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
• Even distribution of high current with innovative multi-fingertip design
• Compatible with TESLA 200/300 mm power device characterization system
• Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
• Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
• Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)

Cryogenic Temperatures

• Fully isolated experiment space for true 4K temperatures during probing
• Cryogenic positioners to provide large travel ranges without warming up the device
• Integrated helium pot for high temperature stability of the device under test
• Fully dry cryogen-free cooler eliminates the need for expensive helium circulation systems
• Rapid cool liquid nitrogen option for faster cool down times

See "Specifications & Details" tab for more key features

• High dispersion for reflective surfaces and shorter working distances. 
• Provides a narrower and less intense illumination area than the AL116. 
• IP65 compliant washdown option is available, as are a wide spectrum of wavelengths. 
• Available with polarization and diffusion light conditioning. 
• This expandable compact bar light is pre-engineered for custom lengths in 2″ increments up to 40″.