You design the future. We help you make it happen.
FormFactor - Cascade Custom Probe Systems - Comprehensive technical and application know-how for challenging applications
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
Customization Examples
Waveguide with customized bracket
300 mm chuck with large tweezer pocket
RF positioner with micrometer screws
Double-side setup for emission microscopy
Combined microscope movement for scope and black body
mmW setup with North/South positioner platform
More Product Information
OptoVue
- Revolutionary technology advancement for wafer and die-level photonics probing
- Real-time in-situ calibrations
- Singulated die testing
- True die-level edge coupling
- In-situ power measurements
- Advanced calibration technologies
- Enables autonomous measurements
Horizontal Die-Level Edge Coupling
- Highest accuracy in test results
- Lowest coupling loss
- Repeatable measurement results due to exclusive automated fiber-to-facet alignment technology
- Reduced risk of damaging fibers with collision avoidance technology
- Ease of use for less experienced users
- Enables close simulation of real-world conditions with device performance closest to the final application
See "Specifications & Details" tab for more key features
- Capture from legacy to the latest video sources through support for SD analog to UHD digital formats
- Connect and switch between different video sources via Mini DisplayPort, HD-BNC, HDMI, and custom analog DVI1 connectivity
- Handle multiple video sources with the simultaneous capture of up to eight HD or two UHD streams2
- Optimize video transmission and storage through onboard multi-stream H.264 encoding
- Minimize system footprint by way of a single-slot PCIe card design
- Simplify application development using the Aurora Imaging Library, formerly Matrox Imaging Library (MIL), software development kit (SDK)
- Deploy on a current platform of choice with support for 64-bit Windows® 7/10 and Linux
- Designed for use with specific Probe Systems
- Tables to suit all facility requirements and applications
- Stable probing, even in submicron range
- Granite platen ensures rigidity and temperature stability
- Can be combined with the Shield Enclosures
High-voltage/current Probes
- On-wafer power device characterization up to 10,000 V DC / 600 A
- Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
- Increased isolation resistance and dielectric strength to provide full triaxial capability at high voltage (3,000 V) for low-leakage measurement
- Custom enclosure for non-standard cameras
- Based on existing housing series, therefore short production time and economic price
- Variable window size and position
- BK7/acrylic windows for cameras up to 2500nm
- Sapphire windows for SWIR cameras up to 7µm
- Germanium windows for LWIR cameras 7-14µm
- Dome windows options
- Camera mount provides good heat dissipation
- Heater or water cooling option
- Adaptable to all Mounting Kits
- Large number of accessories available
Resistance decade box with 100 mΩ - 22 MΩ range and 5W load capacity. Best resolution 1 μΩ, RTD temperature sensor simulation feature.
- Real resistors switched by relays
- 14 decade range, resolution from 1 μΩ
- Custom units and time sequences
- No residual resistance
- 5 W load capacity
- Six different languages
-
Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
-
Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
-
Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
-
Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
- Built to Endure: Engineered with military-grade durability, IntelliShield is designed to withstand extreme temperatures, humidity, dust, and vibration. This high-temperature UPS ensures your critical systems continue to operate in the most harsh environments.
- Mission-Critical Reliability: Trusted in military and industrial applications, IntelliShield provides uninterrupted power backup to safeguard against power disruptions that could affect your operations.
- Seamless Integration: The IntelliShield can be easily and seamlessly integrated into your existing infrastructure with minimal downtime. Our units are designed for easy installation and compatibility with a wide range of equipment, it ensures power stability and smooth transitions.
- Extended Power Backup: With extended battery backup options, IntelliShield ensures your operations stay online during prolonged power outages, giving you the time needed to safely shut down systems or maintain productivity until power is restored.
- Peace of Mind Support: Our dedicated customer support team is available to assist from installation to End-of-Life, ensuring your Rugged UPS performs when you need it most.
The LSProbe 1.2 Variant E Field Probe is a high-speed, high-accuracy, and high-dynamic range electric-Field probe.
- Its standard frequency range of 10 kHz – 8.2 GHz. 1,000 V/m
- Best-in-class compensation of linearity, frequency, and temperature guarantees accurate measurements from less than 0.1 to at least 1,000 V/m.
- A dynamic range of 100 dB is achieved for many frequencies, enabling Field measurements at more than 10,000 V/m.
- Customized high Field-strength „X“-variants, supporting up to 30,000 V/m and a damage level of 100,000 V/m, are available upon request.
FormFactor, Inc.
Website
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
