Total power subsystem integration 

• Total power subsystem integration 
• Power sequencing 
• Elapsed time indication 
• EMO function 
• Custom rear output panel

• Substrate material: High-resistivity silicon
• Substrate thickness: 275 µm
• Dielectric constant: 11.8
• Nominal Z0: 50 Ω

• Enables wafer probing up to 100 A pulsed and 10A DC
• Innovative multi-fingertip design provides even distribution of current
• Supports up to 500 V
• Replaceable Tungsten probe tips
• Temperature range of -60°C to 300°C
• Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
• Prevents against thermal runaway
• Measure devices on wafer at higher currents than ever before
• Small scrub minimizes damage to aluminum pad
• Small footprint – tip fits on a 1 mm pad

10 ppm AC/DC multifunction calibrator for multimeters , power meters and generally all kinds of electric meters. Implementing modular design, 9010+ can be further customized to calibrate oscilloscopes, insulation testers, sources and transducers. 

• 10 ppm accuracy
• 400 MHz and 1.1 GHz scope options
• Power quality functions, voltage from current

• Full Compliance – Meets all ISO 7637-4 test requirements
• Pulse A Testing – Simulates MOSFET/IGBT switching noise (100 kHz – 10 MHz)
• Pulse B Testing – Low-frequency sinusoidal disturbances (3 kHz – 300 kHz)
• High-Power RF Amplifier – 75W output (100 kHz – 400 MHz) for clean signal generation
• Burst Generator – Supports configurable burst parameters (1–1000 cycles)
• Power Meter & Directional Coupler – Accurate transient measurement (100 kHz – 10 MHz)
• Integrated Transformer – Isolates high-voltage circuits & prevents transient damage
• Scalable & Modular – Configurable for custom DUT testing needs
• Turnkey Solution – Includes generator, amplifier, coupler, and switching solutions

• High Intensity: up to 9x brighter than the existing SL191 Pattern Projecting Spot Light and more than 3x brighter than the leading competitive structured light projector. 
• Projection patterns are easily configured with available reticles, including line, grid, cross, multiple lines, and half sphere, with custom reticles available. 
• Customizable: available in multiple wavelengths, including white. 
• Constructed with a large heat sink for improved LED thermal management to facilitate increased brightness while maintaining safe operating temperatures. 
• Ideal solution for machine vision inspection applications requiring structured illumination, including edge detection, locating offsets, and assessing topography. 
• Requires a reticle and lens (sold separately); see available reticles here.

High-voltage/current Probes

• On-wafer power device characterization up to 10,000 V DC / 600 A
• Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
• Increased isolation resistance and dielectric strength to provide full triaxial capability at high voltage (3,000 V) for low-leakage measurement

The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.