The SPARTE 300 series antenna is a battle-tested product that has consistently delivered top-tier performance for mission-critical applications where reliable telemetry reception is paramount. This rugged antenna guarantees our customers the utmost precision, a long operational life, and straightforward maintenance.

The SPARTE 300 series opens up a world of possibilities for users, ranging from aircraft tracking and high-speed target monitoring to duplex datalinks with both receiving and transmitting capabilities.

Furthermore, the extensive and customizable input/output options empower users to operate multiple antennas in a coordinated, multi-site tracking setup. With all antennas, regardless of size, being effortlessly monitored, managed and controlled by using our TM Maestro software.

Resistance decade box with 1 Ω - 1.2 MΩ range, high accuracy and temperature stability. Best resolution 10 μΩ, RTD temperature sensor simulation feature.

• Real resistors switched by relays
• Custom units and time sequences
• No residual resistance
• 20 ppm accuracy
• Six different languages

High Intensity Bar Lights with a large degree of available customization: 

• 16 available wavelengths 
• Expandable in 6″ (150mm) increments up to 84″ (2.13m) 
• Optional heat sink for higher performance and/or high ambient temperatures 
• Optional light conditioning including polarization and diffusion 
• Optional IP65 rated sealing for washdown environments
• – 3 lens options for narrow, medium and wide beam spreads 

All available with 2 week lead times

• Enables wafer probing up to 100 A pulsed and 10A DC
• Innovative multi-fingertip design provides even distribution of current
• Supports up to 500 V
• Replaceable Tungsten probe tips
• Temperature range of -60°C to 300°C
• Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
• Prevents against thermal runaway
• Measure devices on wafer at higher currents than ever before
• Small scrub minimizes damage to aluminum pad
• Small footprint – tip fits on a 1 mm pad

Total power subsystem integration 

• Ethernet communication 
• Full sub-system wiring 
• Single P.O. 
• Custom interface to suit customer requirements

Flexibility

• Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
• Temperatures range from -60°C to +300°C
• Surfaces are nickel or gold-plated
• Hybrid chuck design – operation with and without cooling unit
• Field-upgradeable: On-site cold upgrades for all main prober platforms

Highest Efficiency for Reduced Cost of Test

• Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
• Up to 15% faster transition times than other systems on the market

The award winning VXI Modular Instrumentation Platform (VMIP™) provides customers with a level of modularity for instruments that is unmatched in the industry. The VMIP™ makes a single VXIbus card slot three times more powerful than single device solutions. Each VMIP™ instrument can be mixed and matched with other VMIP™ devices for added flexibility.

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight PDA for On-wafer R&D Power Semiconductor Device Characterization Measurements

E100 Chimera can impair Ethernet traffic at 5 speeds up to 100Gbps to emulate real-world network behavior

• E100 Chimera supports a broad range of impairments (latency/jitter, packet & port impairments, flexible distributions, BW shaping etc)
• True wire-speed impairment @ 100Gbps (plus 50 / 40 / 25 & 10Gbps) NRZ and PAM4
• Ease of use – E100 Chimera is a stand-alone impairment tool that integrates seamlessly with Xena’s traffic generator, letting you speed up your work flow by using the same SW to both generate and impair Ethernet traffic.
• Highest port density in the industry – plus you can reserve individual port-pairs without blocking access to the others
• Setting up custom impairment distributions is a breeze
• Powerful, easy-to-use automation & scripting options