FormFactor - Cascade Eye-Pass Probe - Durable multi-contact wafer probe with controlled impedance power bypass technology
-
High performance power bypassing provides low-impedance and resonant-free connections to 20 GHz
-
RF bandwidth to 500 MHz
-
Long probe life: > 250,000 contacts
-
Beryllium-copper tips for gold pads or tungsten for aluminum pads
-
Oscillation-free testing of wide-bandwidth analog circuits
-
Use with ACP series probes to provide functional at-speed testing for known-good-die
-
Mix multiple contact types: Ground, Power (Standard or Eye-Pass), Logic/Signal
-
Low and repeatable contact resistance on aluminum pads ( < 0.25 Ω on Al, < 0.01 Ω on Au)
The multi-contact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the application, with up to 12 contacts per probe head. Available contact types are ground, logic, standard and Eye-Pass power supply, power supply sense, and ac signal.
Use our online tool to capture your design requirements and receive a quote.
Document
Use our online tool to capture your design requirements and receive a quote.
More Product Information
-
Camera Link InGaAs SWIR camera
-
VGA resolution
-
Large pixel with high dynamic
-
Strong sensor cooling
-
No condensation
-
Very strong sensor cooling for low-noise imaging with long exposure times
-
Camera Link interface with GenCP support
-
Comprehensive I/O control options
-
Automated on-board image correction
-
Extended operating temperature range
FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
-
Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
-
Even distribution of high current with innovative multi-fingertip design
-
Compatible with TESLA 200/300 mm power device characterization system
-
Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
-
Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
-
Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
-
Best solution for high accuracy IV/CV, low-noise and 1/f measurements with PureLine, AutoGuard and next generation MicroChamber technologies
-
Enables up to 5x faster time to accurate data
-
Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact
-
RF/microwave device characterization, 1/f, WLR, FA and design debug
-
Wide range of extremly performant, reliable thermal chuck systems from ATT
-
Easy on-screen navigation, wafer mapping, and operation of accessories and thermal systems with Velox
-
User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
-
Probe station
-
Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
-
Choice of probes
-
Known measurement accuracy traced back to independent standards
-
Uses best measurement practices for optimized measurements
-
Best in class RF and Microwave performance
-
Small benchtop footprint
See more Key Features on Specifications & Details tab
-
Ideal for multiport RF/Microwave and high-speed digital signal testing
-
Mix DC and RF/Microwave signals on one probe
-
Long lifetime – typically over one million (1,000,000) touchdowns
-
Excellent performance in temperatures ranging from 10 K to 200°C
-
Probe on any pad material with no damage
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Thermal range: -60˚C to 300˚C available
-
Upgrade path to meet your future needs
-
Stable and repeatable measurements over a wide thermal range
-
Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
-
Advanced EMI-shielding with PureLine with AttoGuard technologies
-
Best solution for low-noise and 1/f measurements
-
Minimize AC and spectral noise
-
Minimizes settling times for efficient measurements, without compromising accuracy over full thermal range
-
Locking roll-out stage
-
Innovative microscope remote control
-
Intuitive ergonomic stage controls
-
Quick, safe, and comfortable wafer access
-
Easy on-wafer navigation
-
Fast setup and test data gathering
-
Dedicated Velox version for manual probe stations
-
AugmentedAlign tool with on screen markers for improved RF measurement accuracy
-
Proven technology: designed in conjunction with several top STM groups in the world
-
Quiet, low vibration operation
-
Low running costs and reduced maintenance
-
Easy operation and fast cool-down; load sample when the system is cold for TL models
-
Calibrated RuO and CMN thermometry read by model 372S resistance bridge are installed on the mixing chamber plate
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
- Up to 20 GHz bandwidth and 80 GS/s sample rate
- The most advanced oscilloscope user interface
- The industry’s only true hardware 14.1 Gb/s serial trigger
- Low Jitter Measurement Floor and exceptional timebase stability
- Comprehensive set of serial data analysis, debug, validation and compliance tools
- Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility
- Integrated standard and custom measurements and math functions for unrivaled analysis capability
- Multi-lane serial data eye, jitter and crosstalk analysis
- Real-time de-embedding, emulation, and equalization
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
Document
