FormFactor - HPD Model HE-3-TLSL - Wet Helium-3 Cryostat
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Sample can be loaded or removed when the cryostat is cold
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High cooling power with sample in (He-3) liquid (400 mK with 400 microwatt cooling power)
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Sample probe and a load-lock with gate valve
The Model HE-3-TLSL cryostat is a top-loading system with sample in (He-3) liquid for fast sample exchange. The design allows the sample to be removed from and introduced directly into the He-3 pot while the cryostat is cold. The system also includes a sample probe and a load-lock with gate valve, plus an external gas handling system for safe insertion and removal of the sample in and out of the He-3 chamber.
This He-3 cryostat includes the following components:
- Charcoal sorption pump with heater and thermometer
- 1 K pot with thermometer
- He-3 pot (sample chamber)
- Load-lock
- Sample probe with thermal anchor stage, thermometer, and heater
- IVC can
- External gas handling system with stored He-3 gas
- External sorption cryo-pump
- Operation test
More Product Information
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Monochrome (G-419B) and color (G-419C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
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AR0521 CMOS sensor
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ALVIUM image processing
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USB3 Vision
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Various hardware options
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Monochrome (1800 U-500m) and color (1800 U-500c) models
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ALVIUM® Technology for on-board image processing
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USB3 Vision interface for GenICam SFNC features
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Platform concept that enables the operation of different Alvium camera models with a common software
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Micro-B USB 3.1 Gen 1 connector with screw locks for industrial applications
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Precise sensor-to-lens mount alignment
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Standard M3 mounting holes for top and bottom mounting, standard M2 mounting holes for front mounting
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Industrial performance for both embedded and machine vision applications
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Provides an effectively noise free environment around the device under test (DUT)
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World’s first probe station with integrated TestCell Power Management (a TestCell is a connected set of equipment, including test software, instruments, probe station, thermal system, and related measurement accessories such as cables and on-wafer probes)
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Up to 4x faster flicker noise thermal testing on 30 μm pads
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Provides dark and dry environment for measuring light sensitive transistors, and devices at negative temperatures (<= -60°C) with frost free operation
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Provides fully managed and filtered AC power to the entire system – prober and instruments
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Filters harmful noise generated by external thermal control systems
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Reduced “antenna effect” injection of unwanted RF noise into the measurement path
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Provide up to 100dB attenuation (50Hz to 80Mhz) with 100mA max DC current handling
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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User-centered design minimizes training costs and enhances efficiency
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
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Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
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Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
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LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
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Automatic load inductance compensation function ensures the most repeatable calibrations
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Easy to use Probe to ISS/CSR matching tool
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Additional remoting methods
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Interface with Velox™ over LAN
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Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
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Guarantees fully-guarded measurements to fA and fF levels
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Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
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Allows probing of different pad materials and sizes
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Fast replacement of worn probes without the need for tools
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APS-H optical format CMOS sensor
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PoCXP
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4-DIN type connector
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79.7 fps at full resolution
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Monochrome (X-2620B) and color (X-2620C) models
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Extended feature set with Sequencer Control and Multiple Region of Interest selection to support advanced imaging applications
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On-board Defect Pixel and 2D Fixed Pattern Noise Correction for improved image quality
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Simplified firmware update in the field via interface cables using GenICam File Access
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Robust, fan-less design for industrial imaging applications
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Heat-dissipation optimized housing to reduce image noise
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Build-in tripod adapter and multiple mounting holes for eased system integration
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DIN 1.0/2.3 CoaXPress connectors for secure operation in industrial environments
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Single cable solution using Trigger and Power over CoaXPress
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Comprehensive I/O functionality for extended control of connected system components
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Select between B 270 ASG protection glass and filter types: IRC30 IR cut filter or Schneider 486 IR cut filter
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High signal fidelity to 4 GHz bandwidth
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Low circuit loading - High input impedance and low capacitance
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4 GHz, 2.5 GHz, 1.5 GHz and 1 GHz models
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1MΩ input resistance
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0.6 pF (4 GHz)and 0.9 pF input capacitance
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± 8 V input dynamic range, ± 12 V offset range
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Wide variety of tips and grounds
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Easy to use, integrated with oscilloscope
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Application flexibility: Coax, Triax, RF/mmW, High Power, Double Sided
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Temperatures range from -60°C to +300°C
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Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
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Low Thermal Resistance Technology
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MultiSense with multiple temperature sensors
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Isolated from ground
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Includes a jack for grounding and biasing
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Advanced wafer vacuum system for warped/partial thin wafers
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Provides uniform vacuum across the entire wafer surface
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Advanced shielding technology
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Ease of use – Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
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Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
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Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000