FormFactor - Cascade QuadCard™ - Cost-effective, versatile probe card solution
-
Accommodates a combination of up to four Cascade Microtech probes
-
Configurable for mixed-signal RF/mmW testing
-
Quick and easy repairs to be performed in the field, by simply replacing individual probes
-
Adaptable to new device layouts by exchanging individual probes
The QuadCard probe card is the industry’s first configurable, multi-quadrant probe adapter that employs innovative fine probe aligners to mount up to four FormFactor probes on a single probe card. It is designed to accommodate a combination of our probes such as Infinity Probes®, ACP probes, |Z| Probes® and Multi-|Z| Probes, which are aligned individually by the fine probe aligners.
More Product Information
Impedance Standard Substrates (ISSs) supports all of your high-frequency probing applications. Using them ensures greater accuracy and better repeatability in on-wafer calibration of vector network analyzers. Our ISSs offer the proven accuracy of LRRM calibrations with automatic load inductance compensation.
Ultra Low Temperature
-
Pulse tube cryocooler for cryogen free 4K temperatures
-
He-3 sorption cooler for high power intercept and launch stage for ADR
-
Single stage ADR provides solid state cooling down to 25mK
-
Sample stage mounting at both 300mK and 30mK
Configurability
-
Multiple stage feedthroughs for thermally intercepting the signals
-
Two large electrical bread boards for more configurable space
-
Rapid cool options for faster cooldowns
-
Easy and fast setup of camera views
-
Go to Light and Image Settings of the selected camera view with only one mouse click
-
Guided workflows for wafer setups, alignment tools and Autonomous Assistants
-
Workflow wizard shows task-relevant settings and options only
-
Visualizes the progress of setup, alignment and measurement tasks
-
Status information always at hand
-
Informs the user about events, for example “Successful Alignment”
-
Interacts with the user and helps with intelligent solutions
-
For very complex wafer structures
-
Enables automatic test of multiple devices in each die location before stepping to the next die
See more Key Features on Specifications & Details tab
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
For more information please contact your local sales representative.
-
Customizable sample space to fit the user’s application
-
Long holding time: 100 hours for six (6) STP liter He-3 gas
-
Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line; +/- 0.5 mK at base temperature
-
Low noise
-
Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
-
Long holding time: 80 hours with 10 STP liter He-3 gas
-
Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
-
Sample can be loaded or removed when the cryostat is cold
-
Low noise, low vibration
-
Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
-
Highly stable granite base
-
Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Multiple accessories: Thermal chucks, motorized microscopes and positioners, dark box, and more
-
Low-profile, straightforward design
-
Easy and ergonomic operation
-
Front or backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module
-
Front or backside probing capability
See more Key Features on Specifications & Details tab
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Ice- and condensation-free probing down to 77 K (liquid nitrogen) or below 20 K (liquid helium)
-
Probe positioners placed inside vacuum chamber
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
User-centered design minimizes training costs and enhances efficiency
-
Comprehensive alignment functions – from simple wafer alignment and mapping to automated alignment and test of multiple singulated chips, like IR – Focal Plane Arrays
See more Key Features on Specifications & Details tab
FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
-
Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
-
Even distribution of high current with innovative multi-fingertip design
-
Compatible with TESLA 200/300 mm power device characterization system
-
Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
-
Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
-
Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
