FormFactor - Cascade QuadCard™ - Cost-effective, versatile probe card solution
-
Accommodates a combination of up to four Cascade Microtech probes
-
Configurable for mixed-signal RF/mmW testing
-
Quick and easy repairs to be performed in the field, by simply replacing individual probes
-
Adaptable to new device layouts by exchanging individual probes
The QuadCard probe card is the industry’s first configurable, multi-quadrant probe adapter that employs innovative fine probe aligners to mount up to four FormFactor probes on a single probe card. It is designed to accommodate a combination of our probes such as Infinity Probes®, ACP probes, |Z| Probes® and Multi-|Z| Probes, which are aligned individually by the fine probe aligners.
More Product Information
-
Different substrate carriers for wafers up to 200 mm or single dies
-
Probe cards and/or up to eight positioners
-
Probe positioners placed inside vacuum chamber
-
Short and stable probe arms
-
Joystick controller
-
Manual probe positioners with rotary feed-throughs
-
Software control of chuck for fast step-and-repeat testing of the entire wafer
-
Fast step-and-repeat testing of the whole wafer
-
User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
-
Infinity Probe: best for Al (Si)
-
ACP Probe: best for AU (III-Vs)
-
|Z| Probe: robust solution (long lifetime)
-
RF chuck ±3 μm surface planarity
-
Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
-
Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
-
Automated calibration monitoring
See more Key Features on Specifications & Details tab
-
Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
-
DC to 110 GHz models available in single and dual line versions
-
Low insertion and return loss with ultra-low-loss ( -L ) versions
-
Excellent crosstalk characteristics
-
Wide operating temperature -65 ° C to + 200 ° C
-
Wide range of pitches available, from 50 to 1250 µm
-
Individually supported contacts
-
Reduced contact (RC) probe tips for small pads
-
BeCu tip provides rugged, repeatable contact on gold pads
Ultra Low Temperature
-
Pulse tube cryocooler for cryogen free 4K temperatures
-
He-3 sorption cooler for high power intercept and launch stage for ADR
-
Single stage ADR provides solid state cooling down to 25mK
-
Sample stage mounting at both 300mK and 30mK
Configurability
-
Multiple stage feedthroughs for thermally intercepting the signals
-
Two large electrical bread boards for more configurable space
-
Rapid cool options for faster cooldowns
-
Ideal for multiport RF/Microwave and high-speed digital signal testing
-
Mix DC and RF/Microwave signals on one probe
-
Long lifetime – typically over one million (1,000,000) touchdowns
-
Excellent performance in temperatures ranging from 10 K to 200°C
-
Probe on any pad material with no damage
-
Coaxial and triaxial measurements up to 10,000 V
-
High-quality construction with low-noise electrical performance
-
Replaceable probe tips in a variety of tip sizes
-
Temperature range of -60°C to 300°C
-
Triaxial measurement ensures a much better understanding of device leakage in the off state
-
Highly reliable, stable and repeatable measurements
-
Integrally designed as part of a complete measurement solution
-
Easy and fast setup of camera views
-
Go to Light and Image Settings of the selected camera view with only one mouse click
-
Guided workflows for wafer setups, alignment tools and Autonomous Assistants
-
Workflow wizard shows task-relevant settings and options only
-
Visualizes the progress of setup, alignment and measurement tasks
-
Status information always at hand
-
Informs the user about events, for example “Successful Alignment”
-
Interacts with the user and helps with intelligent solutions
-
For very complex wafer structures
-
Enables automatic test of multiple devices in each die location before stepping to the next die
See more Key Features on Specifications & Details tab
-
Highly stable granite base
-
Independent, coarse movement of X and Y axes, combined with easy fine adjustments down to submicron ranges
-
Re-configurable for DC, RF, mmW, FA, WLR and more
-
Multiple accessories: Thermal chucks, motorized microscopes and positioners, dark box, and more
-
Low-profile, straightforward design
-
Easy and ergonomic operation
-
Front or backside instrumentation, e.g.: Integrating Sphere, Fiber setup, Pressure Module
-
Front or backside probing capability
See more Key Features on Specifications & Details tab
-
High-quality construction with low-noise electrical performance
-
Kelvin version for convenient 4-point measurements
-
Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
-
SSMC 50 connectors
-
Ultra-low, fA and fF measurements from -65 º C to 150 º C
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
