FormFactor - Cascade QuadCard™ - Cost-effective, versatile probe card solution
-
Accommodates a combination of up to four Cascade Microtech probes
-
Configurable for mixed-signal RF/mmW testing
-
Quick and easy repairs to be performed in the field, by simply replacing individual probes
-
Adaptable to new device layouts by exchanging individual probes
The QuadCard probe card is the industry’s first configurable, multi-quadrant probe adapter that employs innovative fine probe aligners to mount up to four FormFactor probes on a single probe card. It is designed to accommodate a combination of our probes such as Infinity Probes®, ACP probes, |Z| Probes® and Multi-|Z| Probes, which are aligned individually by the fine probe aligners.
More Product Information
-
Multi-purpose SIGMA instrument integration kit
-
Shorter cabling and universal chuck connection
-
Triax probe with protected guard
-
Triax design for low-leakage measurements up to 3 kV
-
Special chuck surface coating
-
High-isolation ready
-
Arcing protection
-
Shield Enclosure with interlock
-
Advanced grounding concept
See more Key Features on Specifications & Details tab
-
Comprehensive I/O connections: Standard setup of up to 24 RF lines (up to 20 GHz) and 48 DC lines, with extensions to higher I/O connections possible.
-
Non-magnetic construction: Capable of characterizing qubits below 50 mK without magnetic interference when required.
-
Sample size: Proven with chips up to 10×10 mm in size.
-
Pressure-based contact: Connect test and measurement I/O to DUT pads using pressure only. No permanent connection required.
-
Wafer temp verified <4.5 K (with 44 RF probes in contact)
-
Magnetic field suppression to <200 nT
-
Easy exchange of customizable probe cards
-
Configurable for 150 mm, 200 mm and 300 mm wafers
-
Options for fully automated wafer load or manual
-
Complete software suite for manual, semi-auto, or fully automated probing
-
25 wafer cassette capacity for fully automated testing
-
~15 minute cooldown time per wafer
See more Key Features in Specifications & Details tab
-
Replace costly and inflexible test fixtures with easy-to-use probe tips
-
Long lifetime – typically over 1,000,000 contacts
-
GS/SG footprint up to 4 GHz and GSG up to 20 GHz
-
High-power RF test: up to 30 Watts
-
Test at temperatures from -60°C to 200°C
-
Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
-
Re-configurable and upgradable as requirements grow
-
Minimizes setup times with no loss in performance or accuracy
-
Seamless integration of various measurement instruments
-
Solid station frame
-
Built-in vibration-isolation solution for superior vibration attenuation
-
Rigid microscope bridge
-
Compact and rigid mechanical design
-
Highly accurate measurement results
-
Incorporates best-known methods
-
Ergonomic and straightforward design for comfortable and easy operation
-
Low-profile design
-
Simple microscope operation
-
Quick and ergonomic change of DUT through pull-out stage
-
Minimize training efforts
-
Fast time to data
-
Convenient operation
-
Substrate material: High-resistivity silicon
-
Substrate thickness: 275 µm
-
Dielectric constant: 11.8
-
Nominal Z0: 50 Ω
-
Designed for use with specific Probe Systems
-
Tables to suit all facility requirements and applications
-
Stable probing, even in submicron range
-
Granite platen ensures rigidity and temperature stability
-
Can be combined with the Shield Enclosures
-
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
-
Guarantees fully-guarded measurements to fA and fF levels
-
Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
-
Allows probing of different pad materials and sizes
-
Fast replacement of worn probes without the need for tools
-
High-quality construction with low-noise electrical performance
-
Kelvin version for convenient 4-point measurements
-
Replaceable coaxial probe tips, with choice of tip radii, and full electrical guard to the probe tip
-
SSMC 50 connectors
-
Ultra-low, fA and fF measurements from -65 º C to 150 º C
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
