FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
-
Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
-
Even distribution of high current with innovative multi-fingertip design
-
Compatible with TESLA 200/300 mm power device characterization system
-
Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
-
Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
-
Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
FormFactor’s Ultra-High-Power Probe (UHP), a high-voltage parametric probe, handles both high voltage (up to 10,000 V) and high current (up to 600 A) at a wide temperature range (-60ºC to 300ºC).
The high pulse current achieves full I-V characterization with one setup and one touchdown. Together with a TESLA on-wafer power device characterization system, the UHP fully utilizes the high-voltage/current capability of Keysight B1505A and N1265A Ultra High Current Expanders.
Document
Document
More Product Information
-
Low running costs, less vibration, less noise, reduced maintenance
-
Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
-
CMN calibrated thermometry on MC plate
-
Operation via touch panel controller: Remote operation via ethernet interface
Scalable, zero trust architected, and edge-ready, the Integrated Edge Solution 5G is a rugged, compact, end-to-end private 5G standalone radio, core, and edge compute and connectivity solution providing ultra-reliable, low-latency bidirectional communication.
- O-RAN/3GPP-Compliant Vendor-Agnostic - Deploy cores and radios from multiple vendors with different capabilities and price points to maximize flexibility and scalability.
- Ubiquitous and Continuous Comms - Seamlessly connect edge nodes via terrestrial and non-terrestrial neworks including private 5G, WiFi, SATCOM, and much more.
- Comprehensive Network Solution - Integrated RAN and 5G Core across single-server network-in-a-box (NiB) or multi-server architectures per your application or program need.
-
Multi-purpose SIGMA instrument integration kit
-
Shorter cabling and universal chuck connection
-
Triax probe with protected guard
-
Triax design for low-leakage measurements up to 3 kV
-
Special chuck surface coating
-
High-isolation ready
-
Arcing protection
-
Shield Enclosure with interlock
-
Advanced grounding concept
See more Key Features on Specifications & Details tab
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight SPA for On-wafer DC Parametric Measurements
Ultra Low Temperature
-
Pulse tube cryocooler for cryogen free 4K temperatures
-
He-3 sorption cooler for high power intercept and launch stage for ADR
-
Single stage ADR provides solid state cooling down to 25mK
-
Sample stage mounting at both 300mK and 30mK
Configurability
-
Multiple stage feedthroughs for thermally intercepting the signals
-
Two large electrical bread boards for more configurable space
-
Rapid cool options for faster cooldowns
-
Infinity Probe: best for Al (Si)
-
ACP Probe: best for AU (III-Vs)
-
|Z| Probe: robust solution (long lifetime)
-
RF chuck ±3 μm surface planarity
-
Unique 500 μm platen contact/ separation stroke with ≤± 1 μm accuracy for repeatable contact
-
Exclusive 1-, 2-, 3-, and 4-port on-wafer calibration algorithms
-
Automated calibration monitoring
See more Key Features on Specifications & Details tab
-
DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
-
Full thermal range of -60°C to +300°C
-
Reliable and repeatable contact
-
Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
-
Enables full access to the chuck and the auxiliary sites
-
Intuitive, and precise movement of chuck in X, Y, and Z-direction
-
High thermal stability components
-
On-axis probe-to-pad alignment
-
Flexibility from hot only to full thermal range of -60°C to +300°C
-
Thermally induced drift can be automatically re-aligned for 30 μm pads in a temperature range from -40°C to 150°C (the effective temperature range depends on pad size, probe card holder and probe card)
-
3 performance level configurations (fully-shielded / shielded / open)
-
Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
-
User-centered design minimizes training costs and enhances efficiency
See more Key Features on Specifications & Details tab
-
Ultra-low, fA-level current and fF-level capacitance measurements from -65 °C to + 300 °C
-
Guarantees fully-guarded measurements to fA and fF levels
-
Individual connectors provide force-sense connection for quasi-Kelvin and CV measurements
-
Allows probing of different pad materials and sizes
-
Fast replacement of worn probes without the need for tools
Customized Solutions for a Variety of Challenging Applications
We are your partner for challenging applications. Our comprehensive technical and application know-how over all probe system platforms and our expertise for customized products is based on an extensive experience over many years. We offer a special demo support in-house or at the customer, as well as after sales support for complicated setups.
For more information please contact your local sales representative.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
