FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
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Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
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Even distribution of high current with innovative multi-fingertip design
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Compatible with TESLA 200/300 mm power device characterization system
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Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
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Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
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Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
FormFactor’s Ultra-High-Power Probe (UHP), a high-voltage parametric probe, handles both high voltage (up to 10,000 V) and high current (up to 600 A) at a wide temperature range (-60ºC to 300ºC).
The high pulse current achieves full I-V characterization with one setup and one touchdown. Together with a TESLA on-wafer power device characterization system, the UHP fully utilizes the high-voltage/current capability of Keysight B1505A and N1265A Ultra High Current Expanders.
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Acquire high quality images with accurate radiometry for LEO (Low Earth Observation) earth observation applications with 65 MP focal plane and control electronics. From a 500 km orbit, SEEING™ 230 Ident has 9 x 6 km2 swath, offering a 1.03m native Ground Sample Distance (GSD), and features a super-resolution optional mode providing 70cm GSD. Thanks to its unique design, SEEING™ 230 Ident has an ultra-low SWaP factor. It is made of advanced ceramic material for strength during launch and stability during operation in space. It is athermalized and gradient insensitive between -10°C to +50°C. It has a low mass, below 8kg, saving both platform and launch costs.

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Advanced MicroVac chuck surface for minimum contact resistance between wafer and chuck
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Safety-rated interlock system for high-power testing (meets EN 60947-5-1, EN 60204-1)
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Supports fully automated testing up to 10kV by eliminating arcing point
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Full wafer access via locking roll-out stage
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On-wafer power device characterization up to 10,000 V DC / 600 A
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Coaxial, triaxial, and pin jack feed-troughs available
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Convenient instrument connection kits
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Load/unload wafer to hot/cold chuck (-60° C to +300° C)
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Up to 15% faster transition times than other systems in the market

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Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
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Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
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LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
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Automatic load inductance compensation function ensures the most repeatable calibrations
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Easy to use Probe to ISS/CSR matching tool
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Additional remoting methods
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Interface with Velox™ over LAN

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World’s fastest production line tester
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Ultra-simple web-browser UI - 3 clicks to complete test cycle
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Seamless parallel test case execution
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Displays test status, progress, and real time logs
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Easy to script using CLI and RESTapi from any software environment, for rapid integration with customers own UI applications
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Telnet feature makes it easy to remotely check DUT status (e.g. LED, USB and REGEDIT), and modify DUT configuration
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Interface with customer Manufacturing Execution System (MES) system via DLL/ SQL/HTTP, to store test results into its database
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Vantage can test all Ethernet speeds from 100M up to 400G speeds (including both NRZ & PAM4)
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It is based on Xena’s Valkyrie platform making it the industry’s most stable and accurate Ethernet production test solution
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Free software & free tech support product lifetime

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Long holding time: 80 hours with 10 STP liter He-3 gas
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Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
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Sample can be loaded or removed when the cryostat is cold
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Low noise, low vibration
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Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)

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Power over Ethernet
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IEEE 1588 PTP
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Trigger over Ethernet
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Ultra-compact design
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Monochrome (G-158B) and color (G-158C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter

The low frequency tuners are a unique product technology using MPT algorithms for low frequency wideband tuning. Three or more cascaded tuning sections use series transmission cables and parallel rotary capacitors.
The length of the cables and number of tuning sections are optimized for maximum tuning range over a given bandwidth. HLFT tuners use 6 tuning sections allowing second harmonic frequency tuning.

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Combined eye-pieces and CCD camera mount
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3x zoom and quick lens exchange
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Engraved guides on mmW platen
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Supports broadband, load pull, coax RF and banded waveguide configuration
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Rock-solid mechanical design
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Submicron stage accuracy

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From 100MHz to 120GHz we use the slide screw technique in which a reflective probe is inserted into a low loss slotted transmission line.
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For frequencies from 10MHz to 170MHz we use a lumped element technology, whereby variable capacitors are connected with optimized lengths of coaxial cable. To view our Low Frequency Tuners, Click Here!

FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
