FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
- Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
- Even distribution of high current with innovative multi-fingertip design
- Compatible with TESLA 200/300 mm power device characterization system
- Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
- Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
- Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
FormFactor’s Ultra-High-Power Probe (UHP), a high-voltage parametric probe, handles both high voltage (up to 10,000 V) and high current (up to 600 A) at a wide temperature range (-60ºC to 300ºC).
The high pulse current achieves full I-V characterization with one setup and one touchdown. Together with a TESLA on-wafer power device characterization system, the UHP fully utilizes the high-voltage/current capability of Keysight B1505A and N1265A Ultra High Current Expanders.
More Product Information

The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.

- Tests and validates performance directly on silicon without post-dicing packaging
- Dramatically reduces time to data and shortens development cycles
- Enables high scalability for high volume manufacturing
- Offers flexibility in chip design with full grid probing

- Coaxial and triaxial measurements up to 10,000 V
- High-quality construction with low-noise electrical performance
- Replaceable probe tips in a variety of tip sizes
- Temperature range of of -60°C to 300°C
- Triaxial measurement ensures a much better understanding of device leakage in the off state
- Highly reliable, stable and repeatable measurements
- Integrally designed as part of a complete measurement solution

Scalable, zero trust architected, and edge-ready, the Integrated Edge Solution 5G is a rugged, compact, end-to-end private 5G standalone radio, core, and edge compute and connectivity solution providing ultra-reliable, low-latency bidirectional communication.
- O-RAN/3GPP-Compliant Vendor-Agnostic - Deploy cores and radios from multiple vendors with different capabilities and price points to maximize flexibility and scalability.
- Ubiquitous and Continuous Comms - Seamlessly connect edge nodes via terrestrial and non-terrestrial neworks including private 5G, WiFi, SATCOM, and much more.
- Comprehensive Network Solution - Integrated RAN and 5G Core across single-server network-in-a-box (NiB) or multi-server architectures per your application or program need.

- Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
- Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
- Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
- Durable probe structure ensures more than 250,000 contacts
- Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications

Cryogenic Temperatures
- Fully isolated experiment space for true 4K temperatures during probing
- Cryogenic positioners to provide large travel ranges without warming up the device
- Integrated helium pot for high temperature stability of the device under test
- Fully dry cryogen-free cooler eliminates the need for expensive helium circulation systems
- Rapid cool liquid nitrogen option for faster cool down times
See "Specifications & Details" tab for more key features

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High power – 66 W at 2.4 GHz and 43 W at 5 GHz
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Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
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Excellent contact control and low contact resistance
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High performance on any pad material (Al or Au)
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Longest lifetime – typically one million (1,000,000) touchdowns
- The BL128 Series provides a compact linear backlight solution ideal for space-constrained line scan applications.
- Its ultra-thin profile (less than ½”) minimizes vertical footprint, and bezel-free design along the length allows for placement of its emitting window right up to adjacent surfaces.
- While optimized for line scan setups, the BL128’s versatility extends to general-purpose machine vision lighting as a non-directional, highly diffuse bar light illuminator when needed.

65 ppm AC/DC multifunction calibrator designed specifically for calibration of 3½ and 4½ digit multimeters. 1050 V, 20.5 A, resistance, capacitance and temperature packed inside ultra portable, 11 kg body.
- Compact, light, ideal for onsite calibrations
- 1050 V, 20.5 A, resistance, capacitance, TC, RTD and frequency
- Basic accuracy 60 ppm
- All-round calibrator for 3.5 and 4.5 digit multimeters

FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
