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Part of the MicroBrite™ family of high performance, compact machine vision lights.
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The edge-lit design provides the highest flux density of any backlight in our portfolio.
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Ultra-thin profile for installations with demanding space limitations.
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Available in 3 sizes with a multitude of available wavelengths.
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Base Model numbers include BT050050, BT200100, BT100100
FormFactor - Cascade T-Wave Probe - Wafer-level electrical measurement of mmW devices and materials up to 1.1 THz
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Low insertion loss
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Low contact resistance
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Lithographically defined probe tip
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Nickel contacts
See more Key Features on Specifications & Details tab
T-Wave Probes set the industry performance standard for on-wafer measurements of millimeter and submillimeter wavelength devices. T-Wave Probes include both waveguide banded probes and broadband (dual band) probes.
T-Wave Waveguide Banded Probes
- Low insertion loss
- Low contact resistance
- 140 GHz – 1.1 THz versions
- Probe pitch as narrow as 25 μm
- Lithographically-defined probe tip
- Nickel contacts
T-Wave Broadband (Dual Band) Probes
- kHz to 170 GHz and kHz to 220 GHz versions available
- Low insertion loss
- Low contact resistance
- On Probe Integrated diplexer for integrating the coax and Wave Guide bands
- Probe pitch as narrow as 50 μm
- Lithographically defined probe tip
- Nickel contacts
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Exclusively available for use with the following system setup:
- FormFactor Probe systems using RFA probe arms with 45° dual frequency extender mounts
- Keysight 5291A VNA with integral 220 GHz single sweep capability
- Plus the Keysight M4 heads pared with the VDI Mini extended range frequency extenders
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More Product Information
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HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
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Up to 5 Gpts of acquisition memory enables detailed viewing of long events
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15.6" 1900 x 1080 Full HD capacitive touchscreen
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New ProBus2 input supports up to 8 GHz bandwidth and direct compatibility with a wide variety of existing ProBus probes - 50Ω and 1MΩ coupling modes support all input types on a single connector
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MAUI with OneTouch user interface for intuitive and efficient operation
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Deep toolbox enables and simplifies complex analysis
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Intuitive navigation to quickly find important features in long waveforms
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Low running costs, less vibration, less noise, reduced maintenance
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Large convenient experimental access: Up to 12 line-of-sight ISO100 ports located on perimeter of plates
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CMN calibrated thermometry on MC plate
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Operation via touch panel controller: Remote operation via ethernet interface
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Independently cooled cold shield
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Probe positioners placed inside vacuum chamber
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Intuitive, manual drives
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Front loading capability through load door
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Independent control of linear chuck stage and positioners
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Contact/separation stroke for chuck
See more Key Options in Specifictions & Details tab
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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Joystick controller
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Manual probe positioners with rotary feed-throughs
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
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User-centered design minimizes training costs and enhances efficiency
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Supports the latest 5G FR1 and IEEE 802.11ax standards
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up to 1GHz active load pull bandwidth capability
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Test the latest high bandwidth and high modulation cellular standards such as 1024QAM 802.11ax
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This system can be used in all parts of the design cycle
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Initial device characterisation
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MMIC or PA design
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Design verification testing
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Product testing in the factory
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Wafer temp verified <4.5 K (with 44 RF probes in contact)
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Magnetic field suppression to <200 nT
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Easy exchange of customizable probe cards
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Configurable for 150 mm, 200 mm and 300 mm wafers
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Options for fully automated wafer load or manual
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Complete software suite for manual, semi-auto, or fully automated probing
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25 wafer cassette capacity for fully automated testing
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~15 minute cooldown time per wafer
See more Key Features in Specifications & Details tab
The energy industry is primed for a wave of monumental change. The transition to renewable and alternative energy sources, advancements in energy storage, the rise of smart grids, and the electrification of transportation are driving significant changes domestically and globally. These developments mean organizations require new testing protocols, enhanced safety standards, advanced testing equipment, and comprehensive interoperability and cybersecurity assessments. Regulatory changes and technological innovations further complicate testing requirements, demanding scalable and real-world simulation capabilities. When testing facilities must adapt rapidly to support R&D efforts, it’s essential that they ensure the safe, efficient, and sustainable deployment of new energy technologies. All of these factors demand energy laboratories that are future-proofed for innovative solutions.
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Replace costly and inflexible test fixtures with easy-to-use probe tips
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Long lifetime – typically over 1,000,000 contacts
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GS/SG footprint up to 4 GHz and GSG up to 20 GHz
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High-power RF test: up to 30 Watts
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Test at temperatures from -60°C to 200°C
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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