FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements

Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements

Applications

  • Low-Frequency Noise

FormFactor and partner Keysight applications experts will help you configure a robust, complete solution, including:

  • FormFactor probe system: CM300xi-ULN, SUMMIT200 (others available)
  • Manual, semi-automatic and fully automatic probes station options
  • FormFactor analytical probes: DCP probes (others available) on manual or motorized positioners
  • FormFactor DC automation software: Autonomous DC Measurement Assistant for unattended probing over temperature on small pads
  • Full over temperature measurements and automation from -60°C to +300°C
  • Keysight advanced low-frequency noise analyzer (A-LFNA): E4727B
  • Keysight automation and modeling software: PathWave WaferPro (WaferPro Express)
  • To complete the system: cables, adapters, mounting hardware, etc.

More Product Information

FormFactor, Inc.

FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test. 

We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.


Contact Details 

FormFactor, Inc. Corporate Headquarters

7005 Southfront Road, Livermore, CA 94551, USA

Phone: 925-290-4000 

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Test & Measurement

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FormFactor - Cascade IMS-K-LFN - Integrated system with Keysight A-LFNA for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements