FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe
- Ideal for multiport RF/Microwave and high-speed digital signal testing
- Mix DC and RF/Microwave signals on one probe
- Long lifetime – typically over one million (1,000,000) touchdowns
- Excellent performance in temperatures ranging from 10 K to 200°C
- Probe on any pad material with no damage
The Multi |Z| Probe® is a new dimension in RF/microwave multiport and digital signal testing. It uses the same patented technology as other |Z| Probes, but can carry up to 16 RF/microwave signals on one probe. Additionally, DC and RF/microwaves signals can be mixed on the probe, allowing you to add power biasing along with RF signals.
When several individual pads must be contacted by a single probe, it is extremely important that the contact structures are perfectly aligned. Thanks to the MEMS technology used, the Multi |Z| Probe can contact up to 35 pads. Furthermore, small variances in pad height, are easily overcome by the spring-like movement of the independent contacts.
The Multi |Z| Probe can be configured to test DC signals for your DC-test applications if necessary. For single-ended applications, please see the |Z| Probe. For applications requiring just two signals, the Dual |Z| Probe is available. The Multi |Z| Probe can also be integrated into the |Z| Probe Card for high-throughput RF testing.
More Product Information
Southwest Microwave’s high performance End Launch connectors are designed to provide low VSWR, mode free wideband response to 110 GHz for single-layer and multi-layer printed circuit boards where the high frequency signal is on the top layer. Available in SMA (27 GHz), 2.92 mm (K) (40 GHz), 2.40 mm (50 GHz), 1.85 mm (V) (67 GHz) and 1.0 mm (W) (110 GHz).
Male and female options along with narrow body and bulkhead feed-through. Unique clamping mechanism accommodates board thickness up to .300” (7.62 mm). Robust, reusable and repairable. Multiple launch configurations provide the best possible match to circuit layout. Works on microstrip and grounded coplanar waveguide (GCPW) designs. Signal-layer microstrip and GCPW test boards available. Soldering is optional.
Design Assistance:
- Printed circuit board layout and connector part number recommendation
- 3D models for mechanical layout
- HFSS models (version 18.0 or newer) for EM simulations upon request and availability
- Dual Voltage ranges that support over voltage testing on 480V based systems
- Instrument Setups for quickly re-establishing the known instrument state
- 500uS time resolution for Transients
- Virtual Panels control software included
- Non-Linear current waveform programming during Load mode
- Phase coordination among multiple units (LKM/LKS)
- Powerful set of analog controls for PHIL and Modulation tests
- Trigger In & Out to permit extensive coordination with external systems
- Extensive Onboard diagnostics
- Digital I/O, including RS232, USB, Ethernet (GPIB optional)
- Intuitive 5” color display for ease of navigation
- Auto-paralleling for maximum flexibility with multi-chassis configurations
- Separate terminal blocks for single-phase and three-phase AC outputs
The CSR family of calibration substrates delivers the highest accuracy available due to the high quality of each substrate. The calibration standards are manufactured using rugged, hard gold, which ensures a long lifetime.
- Multiple voltage⁄current ranges
- Direct numeric entry and incremental rotary control of voltage and current
- The remote or local sense
- Illuminated keys and display legends.
- Up to ten store/recall set-ups (30 setups for triple output)
- Power output display
- Link and copy mode
- Highest resolution – 12 bits all the time
- More capability – integrates multiple instruments into one
- Comprehensive probe support – supports over 30 probes in 9 categories
- MAUI with OneTouch user interface for intuitive and efficient operation
- Coaxial and triaxial measurements up to 10,000 V
- High-quality construction with low-noise electrical performance
- Replaceable probe tips in a variety of tip sizes
- Temperature range of of -60°C to 300°C
- Triaxial measurement ensures a much better understanding of device leakage in the off state
- Highly reliable, stable and repeatable measurements
- Integrally designed as part of a complete measurement solution
- Probe loss is 3 dB typical between 140 and 200 GHz, S11/S22 15 dB typical
- Reduced unwanted couplings and transmission modes
- Able to shrink pad geometries to 25 x 35 µm (best case)
- Typical contact resistance < 0.05 Ω on Al, < 0.02 Ω on Au
- WR15, WR12, WR10, WR8, WR6, WR4, WR3, and WR2 bands available.
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Die-to-die stepping time of under 100 ms
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Up to 20 dies/sec (70,000 dies/hour) with MultiDie Testing technology
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Even extreme variations in height, such as the case with warped wafers, can be compensated
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Interfaces to all major analysis instrumentation, optics software and testers
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Access to top side and bottom side of device under test (DUT)
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Highly accurate light measurement
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Test automation out-of-cassette for 24/7 operation
See more Key Features on Specifications & Details tab
- 2-port, 1-path Vector Network Analyzer (VNA)
- Intuitive Graphical User Interface (GUI) with convenient Touch Screen
- Outstanding calibration stability
- User-defined overlays for viewing multiple S-Parameters
- Exceptional RF immunity
- IF Bandwidth selections of 10 Hz to 100 kHz
- 100 dB Transmission Dynamic Range
- 850 µs/data point sweep speed
- Internal Bias Tee option
- Vector Voltmeter option, ideal for cable phase matching
- Standard three-year warranty (battery one-year warranty)
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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