FormFactor - Cascade Multi-|Z| Probe - Test Up to 16 RF Signals with One Probe
- Ideal for multiport RF/Microwave and high-speed digital signal testing
- Mix DC and RF/Microwave signals on one probe
- Long lifetime – typically over one million (1,000,000) touchdowns
- Excellent performance in temperatures ranging from 10 K to 200°C
- Probe on any pad material with no damage
The Multi |Z| Probe® is a new dimension in RF/microwave multiport and digital signal testing. It uses the same patented technology as other |Z| Probes, but can carry up to 16 RF/microwave signals on one probe. Additionally, DC and RF/microwaves signals can be mixed on the probe, allowing you to add power biasing along with RF signals.
When several individual pads must be contacted by a single probe, it is extremely important that the contact structures are perfectly aligned. Thanks to the MEMS technology used, the Multi |Z| Probe can contact up to 35 pads. Furthermore, small variances in pad height, are easily overcome by the spring-like movement of the independent contacts.
The Multi |Z| Probe can be configured to test DC signals for your DC-test applications if necessary. For single-ended applications, please see the |Z| Probe. For applications requiring just two signals, the Dual |Z| Probe is available. The Multi |Z| Probe can also be integrated into the |Z| Probe Card for high-throughput RF testing.
More Product Information
- Ideal for multiport RF/Microwave and high-speed digital signal testing
- Mix DC and RF/Microwave signals on one probe
- Long lifetime – typically over one million (1,000,000) touchdowns
- Excellent performance in temperatures ranging from 10 K to 200°C
- Probe on any pad material with no damage
- High power density in 1U / 2U / 4U / 14U chassis up to 18kVA
- Intuitive touch panel control
- Innovative iX2™ current doubling technology
- Multi-language display for global operation
- Auto paralleling for higher power
- Single phase 1U models and 1 or 3 phase selectable 2U / 4U / 14U models
- Complete avionic test suites (optional)
- ATE version available in 1U, 2U and 4U models
- Standard LXI LAN, USB and RS232, optional GPIB
- Legacy CSW5550 Emulation on the AST6003A1 Model
The TEM horn antenna is an antenna used for conducting close proximity radiation immunity evaluation test (near electromagnetic field immunity test) of electromagnetic waves radiated from various wireless transmitters such as mobile devices.
In the future, close proximity radiation immunity evaluation test using the TEM horn antenna is expected to expand to various product standards such as medical equipment (IEC 60601-1-2) and multimedia equipment (CISPR 35). NoiseKen's TEM horn antenna has a wide band, low VSWR, and wide electric field uniformity offering an ideal solution for an efficient close proximity radiation immunity test.
- A TEM horn antenna compliant with IEC 61000-4-39 Ed.1.
- Test without changing the antenna in the frequency range of 380MHz to 6GHz.
- Low VSWR and high GAIN enable efficient electromagnetic wave radiation.
- Wide field uniformity reduces the number of times of movement of the antenna when radiating the EUT.
- Since the maximum point of the near electric field distribution for each frequency is at the center, enables radiation on the EUT based on the axis of the antenna. Hence, significantly simplifies test point alignment.
Flexibility
- Different substrate carriers for wafers up to 200 mm or single dies
- Probe cards and/or up to eight positioners
- Optional thermal chuck (-60°C to 300°C) and pressure regulation
- Accessories available, such as black bodies and optical motion analysis tools
- Optional upgrade for 300 mm wafer
- Designed for industrial environments
- Covers wide range of measurements (I-V, C-V, RF, MEMS, OPTO)
- Ideal for small structures
See "Specifications & Details" tab for more key features
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system cost
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Defect pixel masking feature with the Defect Mask Loader tool that allows you to manage a user defined defective pixel list to match your application and optimize the life cycle of the camera.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
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0.01° phase shift accuracy
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15 - 1000 Hz output
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Built-in multimeter for transducer calibration
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Floating current output for 3-wire power meters
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Voltage from Current function
- Support for the highest speeds available in CoaXPress 2.0
- Connect to and capture from up to four cameras or combine connections for even higher data rates
- Simplify cabling with PoCXP support between cameras and vision computer
- Offload host computer of custom image processing using a field-programmable gate array (FPGA) device
- Distribute image processing workload across multiple computers through data forwarding capability
- Synchronize with sensors, encoders, and controllers with ample auxiliary I/Os for each CoaXPress connection
- Use license fingerprint for Aurora Imaging Library and avoid the need for a separate hardware key
- Monitor and troubleshoot acquisition performance in detail using Aurora Gecho event-logging tool
- Redundant design with multiple signal paths built in for high-availability.
- 12 expansion slots in the 2U version and 5 expansion slots in the 1U variant.
- Industry-first GPS integrity checking
- Unique optical crosslink architecture for either Master-Slave hierarchical setups or Master-Master crosschecking and failover
- 2U version is operated by an intuitive touch-screen interface, a first for any master clock system.
- All components are hot-swappable and are dual redundant.
- The Output Signal modules are hot-swappable from the front and minimize the need to disconnect cables.
- High Intensity: up to 9x brighter than the existing SL191 Pattern Projecting Spot Light and more than 3x brighter than the leading competitive structured light projector.
- Projection patterns are easily configured with available reticles, including line, grid, cross, multiple lines, and half sphere, with custom reticles available.
- Customizable: available in multiple wavelengths, including white.
- Constructed with a large heat sink for improved LED thermal management to facilitate increased brightness while maintaining safe operating temperatures.
- Ideal solution for machine vision inspection applications requiring structured illumination, including edge detection, locating offsets, and assessing topography.
- Requires a reticle and lens (sold separately); see available reticles here.
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
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