FormFactor - HPD Model HE-3-TLSUHV-STM - Wet Helium-3 Cryostat
-
Long holding time: 80 hours with 10 STP liter He-3 gas
-
Stable He-3 pot temperature: Separate sippers for 1K pot and the charcoal sorb cooling line
-
Sample can be loaded or removed when the cryostat is cold
-
Low noise, low vibration
-
Multiple operation modes: He-3 cryostat can be operated without pumping the 1K pot (referred to as 4K operation mode)
The Model HE-3-TLSLUHV-STM is a top-loading Helium-3 cryostat with sample in ultra-high vacuum (UHV) space for scanning tunneling microscopy (STM) with atomic resolutions. The sample can be loaded through the 1.0” diameter central access when the cryostat is cold. With its standardized unique design, this He-3 cryostat generates next to zero acoustic noise and mechanical vibration. The Model HE-3-TLSUHV-STM He-3 insert is designed to be compatible with all kinds of superconducting magnets, such as solenoid, vector magnets, and more.
This He-3 insert includes the following components:
- Central access with gate valve on top
- Charcoal sorption pump with heater and thermometer
- 1 K pot with heater and thermometer
- He-3 pot with heater and thermometer
- Permanently stored He-3 gas
- UHV compatible IVC can
- Mechanical heat switches
- Operation test
More Product Information
-
Sony IMX542 CMOS sensor
-
Power over Ethernet option
-
Angled-head and board level variants
-
Video-iris lens control
-
Monochrome (G-1620B) and color (G-1620C) models
-
GigE Vision interface with Power over Ethernet option
-
Screw mount RJ45 Ethernet connector for secure operation in industrial environments
-
Supports cable lengths up to 100 meters (CAT-6 recommended)
-
Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
-
Comprehensive I/O functionality for simplified system integration
-
Popular C-Mount lens mount
-
Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
-
Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
Comprehensive, Turn-key Integrated Measurement System (IMS) with Keysight A-LFNA for On-wafer R&D Advanced Low-Frequency Noise Measurements
-
Ease of use – Less experienced operators can perform an RF calibration up to 500 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
-
Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
-
Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
-
Calibration Monitor and Re-calibration – System will
continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.
-
Monochrome (G-234B) and color (G-234C) models
-
GigE Vision interface with Power over Ethernet
-
Screw mount RJ45 Ethernet connector for secure operation in industrial environments
-
IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
-
Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
-
Supports cable lengths up to 100 meters (CAT-6 recommended)
-
Comprehensive I/O functionality for simplified system integration
-
Popular C-Mount lens mount
-
Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
-
Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
-
Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter
FormFactor - Cascade Ultra High-Power (UHP) - Enabling single-contact high-current/high-voltage test
-
Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
-
Even distribution of high current with innovative multi-fingertip design
-
Compatible with TESLA 200/300 mm power device characterization system
-
Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
-
Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
-
Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)
-
Ideal for multiport RF/Microwave and high-speed digital signal testing
-
Mix DC and RF/Microwave signals on one probe
-
Long lifetime – typically over one million (1,000,000) touchdowns
-
Excellent performance in temperatures ranging from 10 K to 200°C
-
Probe on any pad material with no damage
-
Revolutionary technology advancement for wafer and die-level photonics probing
-
Highest accuracy in test results
-
New innovative combination of hardware and software features to align and optimize fibers/arrays in a wafer-level trench
-
Minimized coupling losses with minimal trench dimensions
-
Industry standard for vertical coupling to wafer-level grating couplers
-
Positioning hardware is precisely calibrated to the probe station and ready to perform die-to-die optical optimizations in minutes
-
Dark, shielded and frost-free
-
-40°C to +125°C
-
Leveraging considerable expertise through an innovative engineering team
-
Pioneering set of automated functions that perform critical calibrations of the optical positioning system to the probe station
-
Exclusive FormFactor-developed automated test methodology
-
Automates manual tasks by integrating probe station machine vision capability with optical positioning and test equipment
-
FormFactor-developed graphical user interface to manually control the optical positioning system
-
Configurable between single fibers, fiber arrays and edge coupling holders
See more Key Features on Specifications & Details tab
-
Low insertion loss
-
Low contact resistance
-
Lithographically defined probe tip
-
Nickel contacts
See more Key Features on Specifications & Details tab
The Focus Compact Model (FCM) utility is a streamlined software package designed to be used with Focus’ AURIGA high-end Pulsed-IV system, that is used to generate Compact Models for transistors from their Pulsed-IV and wideband pulsed s-parameter data.
This is achieved by generating a network of lumped circuit elements that represent accurately the fundamental linear & non-linear behavior of the device over a broad range of bias and power range.
The result of the modeling is a netlist and compatible with- the most common CAD tools used in RF Design; such as AWR Microwave office (MWO) and Keysight PathWave Advanced Design System (ADS).
FormFactor, Inc.
FormFactor, Inc. (NASDAQ:FORM) is a leading provider of essential test and measurement technologies along the full IC life cycle – from characterization, modeling, reliability, and design de-bug, to qualification and production test.
We constantly strive to help our customers solve the advanced test and measurement challenges of the broader semiconductor industry. Our focus on customer partnership, innovation, agility and operational excellence allows us to earn sustainable business every day.
Contact Details
FormFactor, Inc. Corporate Headquarters
7005 Southfront Road, Livermore, CA 94551, USA
Phone: 925-290-4000
Test & Measurement
Download Line Card
