20 ppm calibrator of DC process signals designed for calibration of evaluation units and process multimeters under demanding industrial conditions. Includes RTD and resistance source. 

• 20 ppm accuracy 
• 13°C - 33°C reference temp. range 
• 100 V @ 25 mA output capacity

• Guaranteed performance to 43.5 GHz with Extended K™ ports
• High output power allows measurement of high attenuation devices
• Advanced time domain option provides tools for signal integrity analysis
• Wide dynamic range enables measurement of very low reflection artifacts
• Excellent corrected directivity minimizes measurement uncertainty
• SmartCal™ auto calibration unit reduces calibration and setup time
• Time domain with time gating option grants easier and faster fault identification
• Modern LAN interface for remote control is faster than GPIB
• A common GUI and SCPI interface within the ShockLine family
• Bias tee option simplifies test setups where the DUT needs DC biasing
• Universal Fixture Extraction (UFX) software option provides advanced de-embedding tools for test fixture extraction
• E-Band VNA
  • Extended frequency range covering E-band and major parts of V band
  • Fully assembled test system eliminates setup errors and increases reliability
  • Tethered modules connect directly to the DUT increasing measurement stability

With the ProBus interface, the ZD500, 1000, and 1500 becomes an integral part of the oscilloscope. All probe gain and offset controls are transparent to the user, making it easier to probe the circuit without concern for which gain setting to choose. When used with a LeCroy digital oscilloscope, no external power supply is required.

When a catalog product cannot completely satisfy a requirement, AMETEK Programmable Power's Solutions Business provides custom power supply systems and integrations. The solutions range from OEM integration for medical and semiconductor industries to modular avionics ATE power subsystems to turnkey solar array simulators for satellites. We also can modify power supplies to meet your application requirements.

• High power density up to 150 kW in a single bay rack-mount cabinet. Up to 240 kW in a dual bay rack. 
• Fast load transient response provides protection from undesired voltage excursions. 
• Fast slew rate with exceptional rise/fall times for speed-critical applications. 
• Low ripple suitable for the most sensitive applications. 
• Low audible noise with temperature controlled variable speed fans. 
• High accuracy voltage/current measurements without external DMMs. 
• Modular architecture simplifies sparing and maintenance.

• Enables wafer probing up to 100 A pulsed and 10A DC
• Innovative multi-fingertip design provides even distribution of current
• Supports up to 500 V
• Replaceable Tungsten probe tips
• Temperature range of -60°C to 300°C
• Minimal contact resistance at the pad-tip junction to reduce heating during measurements, with fewer probe marks
• Prevents against thermal runaway
• Measure devices on wafer at higher currents than ever before
• Small scrub minimizes damage to aluminum pad
• Small footprint – tip fits on a 1 mm pad

• High Power Density : 3 kW and 4 kW models, 2U (3½” high), (19” wide); no top or bottom clearance spacing required 
• Preview Push-button : Overvoltage protection (OVP), voltage and current preview buttons 
• Remote Voltage Sense : Sense leads are easily connected to a solderless connector 
• Parallel or Series Operation Field configurable 
• Power Factor Correction ≥0.98 1 Ф 3kW

• Wide Input Bandwidth 
• Input Isolation 
• Automatic & Manual Changeover 
• Transformer Coupled Outputs 
• Twenty four Outputs 
• Front Panel Status Indicators 
• Fault Discrete Inputs 
• Compact 1U, 19” rack mount