Matrox - DA5WINPU Design Assistant Software
Mfg: Matrox
Model: DA5WINPU
Condition: Open Box
Description: Matrox Design Assistant 5 Flowchart-based Vision Software for Windows
More Product Information

A family of fanless, durable, SWaP-C optimized small form factor mission computers providing maximum ruggedization, processing, storage, and security at the edge across the modern, multidomain battlespace.
- Ready for Extremes - Lightweight, sealed, and designed to operate between -40°C and +70°C in harsh environments
- Military-grade Connectors - Protect against dust, dirt, debris, and water as well as electromagnetic interference
- Zero-trust Architected - Hardware-based security measures encrypt and isolate data as it is being processed.

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DC, AC and RF/microwave device characterization, 1/f, WLR, FA and design debug
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Full thermal range of -60°C to +300°C
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Reliable and repeatable contact
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Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
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Enables full access to the chuck and the auxiliary sites
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Intuitive, and precise movement of chuck in X, Y, and Z-direction
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High thermal stability components
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On-axis probe-to-pad alignment
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Flexibility from hot only to full thermal range of -60°C to +300°C
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Thermally induced drift can be automatically re-aligned for 30 μm pads in a temperature range from -40°C to 150°C (the effective temperature range depends on pad size, probe card holder and probe card)
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3 performance level configurations (fully-shielded / shielded / open)
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Test automation out-of-cassette for higher test cell efficiency for over-night/over-weekend operation
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User-centered design minimizes training costs and enhances efficiency

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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Probe positioners placed inside vacuum chamber
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Short and stable probe arms
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Joystick controller
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Manual probe positioners with rotary feed-throughs
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Software control of chuck for fast step-and-repeat testing of the entire wafer
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Fast step-and-repeat testing of the whole wafer
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User-centered design minimizes training costs and enhances efficiency

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Different substrate carriers for wafers up to 200 mm or single dies
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Probe cards and/or up to eight positioners
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Ice- and condensation-free probing down to 77 K (liquid nitrogen) or below 20 K (liquid helium)
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Probe positioners placed inside vacuum chamber
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Joystick controller
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Manual probe positioners with rotary feed-throughs
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User-centered design minimizes training costs and enhances efficiency
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Comprehensive alignment functions – from simple wafer alignment and mapping to automated alignment and test of multiple singulated chips, like IR – Focal Plane Arrays

- The RL127 is characterized as a Large High Dispersion Bright Field ring light.
- Non-lensed LEDs disperse light at broad angles, providing “soft” lighting for applications that require short to medium working distances.
- The low-profile design is only .75” (19mm) thick, with an O.D. of 4.6” (117mm) and I.D. of 2.61” (66.3mm) allowing it to be used in space constrained applications.
- The I.D. provides a standard 67mm diameter thread with a pitch of .75mm for further mounting flexibility.
- A wide variety of wavelengths are available from UV to IR. An optional polarizer and/or diffuser may be used to further condition the light output.
- The RL121 delivers 20kLux at a working distance of 100mm.

Transmission line probes are a special type of passive probe designed for use at very high frequencies. They replace the high impedance probe cable found in a traditional passive probe with a precision transmission line, with a characteristic impedance that matches the oscilloscope input (50 Ohm). This greatly reduces the input capacitance to a fraction of a picofarad, minimizing the loading of high frequency signals. A matching network at the tip increases the DC input resistance. While they have lower DC input resistance than a traditional passive probe (usually 500 Ohm) to 1kOhm), the input impedance of these probes remains nearly constant over their entire frequency range. A traditional /10 passive probe will have a 10 MOhm) input impedance at DC, however this impedance drops rapidly with frequency, passing below the input impedance of a transmission line probe at less than 100 MHz.

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Highly stable granite base
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Independent, coarse movement of X and Y axes, combined with easy fine adjustments
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Re-configurable for DC, RF, mmW, FA, WLR and more
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Full thermal range of -60°C to +300°C
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Low-profile, straightforward design
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Spacious top chambers for up to 12 positioners
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Reduces electrical noise by providing a fully electromagnetically shielded, ultra-low-noise, light-tight environment
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Enables accurate low-noise measurements of atto amperes, femtofarads and microvolts at temperatures down to -60°C

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Power over Ethernet
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IEEE 1588 PTP
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Trigger over Ethernet
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Ultra-compact design
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Monochrome (G-158B) and color (G-158C) models
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GigE Vision interface with Power over Ethernet
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Screw mount RJ45 Ethernet connector for secure operation in industrial environments
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IEEE 1588 Precision Time Protocol allows for easy synchronization of multiple cameras and devices on network
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Trigger over Ethernet Action Commands allow for a single cable solution to reduce system costs
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Supports cable lengths up to 100 meters (CAT-6 recommended)
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Comprehensive I/O functionality for simplified system integration
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Popular C-Mount lens mount
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Easy camera mounting via standard M3 threads on top and bottom of housing or optional tripod adapter
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Easy software integration with Allied Vision's Vimba Suite and compatibility to the most popular third party image-processing libraries.
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Select between B 270 ASG protection glass and filter types: Jenofilt 217 IR cut filter, Hoya C-5000 IR cut filter, RG715 IR pass filter, or RG830 IR pass filter

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Unique Air Coplanar tip design with choice of beryllium copper (BeCu) or tungsten tip material
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DC to 110 GHz models available in single and dual line versions
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Low insertion and return loss with ultra-low-loss ( -L ) versions
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Excellent crosstalk characteristics
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Wide operating temperature -65 ° C to + 200 ° C
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Wide range of pitches available, from 50 to 1250 µm
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Individually supported contacts
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Reduced contact (RC) probe tips for small pads
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BeCu tip provides rugged, repeatable contact on gold pads

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- In Stock Inventory is available for quick shipment
- In Box Items are still boxed up and brand new condition
- Out of Box Items are in used condition
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